Executing tests in deterministic order

    公开(公告)号:US11182282B2

    公开(公告)日:2021-11-23

    申请号:US16804164

    申请日:2020-02-28

    Abstract: A method for detecting and localizing a fault in a system under test (SUT) includes generating an initial set of test vectors that provides complete n-wise coverage of the reduced test space. The method further includes generating and executing an initial set of test cases to obtain a first set of execution results. The method further includes determining, based at least in part on the first set of execution results, that one or more test cases failed execution. The method further includes generating a set of new test cases from a selected failing test case. The method further includes executing the set of new test cases to obtain a second set of execution results. The method further includes detecting and localizing the fault based at least in part on the second set of execution results.

    Puzzle-style modular electronic devices

    公开(公告)号:US10277721B2

    公开(公告)日:2019-04-30

    申请号:US14857905

    申请日:2015-09-18

    Abstract: A puzzle-style modular electronic device is provided. The puzzle-style modular electronic device is activated based on detecting an interconnection of a plurality of block modules and determining whether the interconnection of the plurality of block modules matches an assembly orientation. Note that each of the plurality of block modules includes a processor, a memory, and at least one connection point through which the interconnection is established and that the interconnection of the plurality of block modules collectively forms the modular electronic device. Further, the puzzle-style modular electronic device authenticates a set of operations of the modular electronic device in response to the determining that the interconnection of the plurality of block modules matches the assembly orientation.

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