Abstract:
Multiple segment operations having non-volatile state trackers in memory devices are disclosed. Operations are segmented in multiple segments and selectively performed to avoid violating timing requirements within a memory device. In at least one embodiment, a memory device operation is segmented into a plurality of segments and selectively performed within time frames of other memory device operations. Non-volatile state trackers maintain state values corresponding to each segment of multiple segmented operations.
Abstract:
Methods of operating a memory device include applying an increasing sense voltage to a plurality of memory cells, wherein memory cells of the plurality of memory cells each store data states representing two or more digits of data. The methods further include, in response to the increasing sense voltage reaching a particular level, initiating a transfer of data values of a particular digit of data for each memory cell of the plurality of memory cells while continuing to apply the increasing sense voltage to the plurality of memory cells.
Abstract:
Memories, and methods of operating such memories, having a memory cell, sense circuitry having a gate, program circuitry and a decoder having a first signal line connected to the gate of the sense circuitry, a second signal line connected to the program circuitry, and an output selectively connected to the memory cell. The decoder is configured to selectively connect the output to the first signal line responsive to a first control signal and to selectively connect the output to the second signal line responsive to the first control signal and a second control signal. The sense circuitry is configured to selectively activate the gate responsive to a third control signal.
Abstract:
An apparatus, such as a nonvolatile solid-state memory device, may, in some implementations, include access line bias circuitry to set a bias level associated with a deselected access line(s) of a memory core in response to mode information. In one approach, access line bias circuitry may use linear down regulation to change a voltage level on deselected access lines of a memory core. A memory access device, such as a host processor, may be provided that is capable of dynamically setting a mode of operation of a memory core of a memory device in order to manage power consumption of the memory. Other apparatuses and methods are also provided.
Abstract:
Methods of operating integrated circuit devices include logically combining an output signal indicating whether an operation is being performed with the logic level of a command signal line to generate a command signal to control circuitry of the integrated circuit device having the logic level of the command signal line when the output signal indicates that the operation is not being performed, and having a particular logic level when the output signal indicates that the operation is being performed. Integrated circuit devices include a command signal management circuit to provide a logic level of a particular command signal to control circuitry of the integrated circuit device when control signals indicate a desire to allow the particular command signal, and to provide a particular logic level to the control circuitry when the control signals indicate a desire to block the particular command signal.
Abstract:
An apparatus, such as a nonvolatile solid-state memory device, may, in some implementations, include access line bias circuitry to set a bias level associated with a deselected access line(s) of a memory core in response to mode information. In one approach, access line bias circuitry may use linear down regulation to change a voltage level on deselected access lines of a memory core. A memory access device, such as a host processor, may be provided that is capable of dynamically setting a mode of operation of a memory core of a memory device in order to manage power consumption of the memory. Other apparatuses and methods are also provided.
Abstract:
Block-row decoders, memory block-row decoders, memories, methods for deselecting a decoder of a memory and methods of selecting a block of memory are disclosed. An example memory block-row decoder includes a plurality of block-row decoders, each of the block-row decoders having a decoder switch tree. Each block-row decoder is configured to bias a block select switch of the decoder switch tree with a first voltage while the block-row decoder is deselected and further configured to bias decoders switches of the decoder switch tree that are coupled to the block select switch with a second voltage while the block-row decoder is deselected, the second voltage less than the first voltage. An example method of deselecting a decoder of a memory includes providing decoder signals having different voltages to decoder switches from at least two different levels of a decoder switch tree while the decoder is deselected.
Abstract:
Methods of operating a memory device include determining whether each memory cell selected for a sense operation has any data state of a first subset of data states of a plurality of data states, wherein whether a memory cell has a data state that is a member of the first subset of data states determines a data value of a first portion of the data state of that memory cell. The methods further include initiating a transfer of the data values of the first portions of the data states of the selected memory cells and continuing the particular sense operation to sense for additional data states of the plurality of data states.