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公开(公告)号：US20210080399A1
公开(公告)日：2021-03-18
申请号：US16920148
申请日：2020-07-02
Applicant: Shimadzu Corporation
Inventor： Takahide HATAHORI , Kenji TAKUBO , Koki YOSHIDA
Abstract: A defect inspection apparatus generates a surface layer inspection image which is an image representing displacement of an inspection target in a measurement region based on an intensity pattern of interfered laser light. The defect inspection apparatus is configured to generate an appearance inspection image which is an image of an outer surface of the measurement region based on an intensity pattern of incoherent light.
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公开(公告)号：US20190388044A1
公开(公告)日：2019-12-26
申请号：US16017485
申请日：2018-06-25
Applicant: SHIMADZU CORPORATION
Inventor： DAI HIROSE , Koki YOSHIDA
Abstract: An X-ray imaging apparatus achieves X-ray fluoroscopy and X-ray imaging in the larger range by combining a sliding action or rotation of an arcuate C-arm and an tilting-and-rolling of the table in combination. As noted while the C-arm suspends sliding after the C-arm slides in the sagittal direction, the table of the examination table tilts. Then, an angle θ between the axis line from the X-ray irradiation element 31 to the flat panel detector 32 and the surface of the table 11 coincides with the target angle at which the X-ray fluoroscopy and the X-ray imaging is carried out. Then after, the table moves in the longitudinal direction and lowers.
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公开(公告)号：US20250157042A1
公开(公告)日：2025-05-15
申请号：US18923382
申请日：2024-10-22
Applicant: SHIMADZU CORPORATION
Inventor： Tomohiro KARASAWA , Koki YOSHIDA , Masamitsu KAMON , Masafumi FURUTA
Abstract: A method of measuring biological information according to the present disclosure is a measurement method of measuring biological information from a frame image group obtained by imaging over time of a subject. The method of measuring biological information according to the present disclosure divides a target region in each frame image included in the frame image group into a plurality of sub regions and extracts an amount of variation in each of the plurality of sub regions from the frame image group. The method of measuring biological information then determines sub regions similar in amount of variation from among the plurality of sub regions and obtains the biological information of the subject based on a summed value of the amount of variation in each of the similar sub regions.
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14.发明公开公开(公告)号：US20230368408A1
公开(公告)日：2023-11-16
申请号：US18029878
申请日：2021-07-07
Applicant: Shimadzu Corporation
Inventor： Koki YOSHIDA , Kahori KISE , Koichi MURATA , Nobuya HASHIZUME , Masafumi FURUTA , Shima OKADA
CPC classification number: G06T7/70 , G06V40/10 , G06V10/62 , G06V10/70 , G06T2207/20081 , G06T2207/30196
Abstract: A position estimator outputs, by inputting information obtained from the frame images into a trained model, positional information of a plurality of parts of a human body from the trained model. A determination processor outputs information on erroneous detection by the position estimator. The position estimator outputs a first position group in response to an input of an obtained first frame image, the first frame image being obtained by the receiver and outputs a second position group in response to an input of an obtained second frame image different from the first frame image, the second frame image being obtained by the receiver. The determination processor outputs the information on erroneous detection by the position estimator based on a degree of difference between the first position group and the second position group and a degree of matching between the first frame image and the second frame image.
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公开(公告)号：US20230254610A1
公开(公告)日：2023-08-10
申请号：US18014291
申请日：2021-05-11
Applicant: Shimadzu Corporation
Inventor： Masafumi FURUTA , Koichi MURATA , Koki YOSHIDA , Yasuyuki URAOKA , Kahori KISE
Abstract: A data measurement system (10) includes a plurality of measurement apparatuses (130), a signal transmitter (110), and a data processing apparatus (150). The signal transmitter (110) transmits a trigger signal to the plurality of measurement apparatuses (130). The data processing apparatus (150) obtains from each of the plurality of measurement apparatuses (130), measurement data measured during a period between a start signal corresponding to the trigger signal transmitted at first time and an end signal corresponding to the trigger signal transmitted at second time later than the first time. The data processing apparatus (150) temporally aligns start signals in the obtained data with each other and aligns end signals in the obtained data with each other, and presents the measurement data from the plurality of measurement apparatuses (130) to a user.
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Patent Agency Ranking
公开(公告)号：US20220026396A1
公开(公告)日：2022-01-27
申请号：US17413374
申请日：2018-12-20
Applicant: Shimadzu Corporation
Inventor： Takahide HATAHORI , Kenji TAKUBO , Koki YOSHIDA
Abstract: A defect inspection apparatus (100) is provided with and an excitation unit (1) for exciting elastic waves, an irradiation unit (2) for emitting laser light, a measurement unit (3) for measuring interference light, and a control unit (4). The control unit is configured to acquire an image (61) representing a vibration state of an inspection target object (7) in a measurement area based on a measurement result of the measurement unit (3), detect a discontinuous portion in a vibration state in the measurement area from the image representing the vibration state as a defect (73), and identify a type of the defect based on at least one of a shape (62) of the detected defect and the vibration state of a defective portion.
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公开(公告)号：US20200330053A1
公开(公告)日：2020-10-22
申请号：US16644815
申请日：2017-11-15
Applicant: Shimadzu Corporation
Inventor： Dai HIROSE , Koki YOSHIDA , Daisuke MURAKAMI
Abstract: A radiographic imaging apparatus includes: a plurality of first operation portions configured to move the moving member in a selected moving direction by being operated to select a moving direction of the moving member; a second operation portion for preparing a movement of the moving member to a selected final movement position by being operated to select the second operation portion; a third operation portion for initiating the movement of the moving member to the final movement position by being operated after the second operation portion is operated; a lamp built in the first operation portion; a moving direction calculation unit for calculating the moving direction of the moving member to the final movement position from a current position and the selected final movement position of the moving member; and a display unit for displaying the lamp built in the first operation portion corresponding to the moving direction of the moving member to the final movement position by blinking the lamp.
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公开(公告)号：US20200305813A1
公开(公告)日：2020-10-01
申请号：US16706129
申请日：2019-12-06
Applicant: Shimadzu Corporation
Inventor： Koki YOSHIDA , Hidetaka TAKEZAWA , Shohei OKUBO
Abstract: An X-ray imaging apparatus includes a table, an imager configured to capture a plurality of X-ray images, a rotating mechanism, a moving mechanism, and an image processor. The image processor is configured to generate a long image by performing processing of varying magnifications of the plurality of X-ray images based on an amount of relative movement of the table and the imager and splicing the plurality of X-ray images when imaging is performed at a plurality of imaging positions in a state in which an optical axis of X-rays radiated from an X-ray irradiator is inclined with respect to the table.
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公开(公告)号：US20180310905A1
公开(公告)日：2018-11-01
申请号：US15962488
申请日：2018-04-25
Applicant: Shimadzu Corporation
Inventor： Koki YOSHIDA , Takanori YOSHIDA , Michel DARGIS
CPC classification number: A61B6/5205 , A61B6/0492 , A61B6/487 , A61B6/503 , A61B6/504 , G06T3/403 , G06T7/0014 , G06T7/246 , G06T2207/10121 , G06T2207/30048 , G06T2207/30204
Abstract: This X-ray imaging apparatus is equipped with an image processing unit. The image processing unit obtains a first image with a marker reference position set in a first X-ray image and generate a second image in which a virtual marker image is superimposed at a corresponding position in a second X-ray image reflecting the change of a relative position from the marker reference position with respect to the second X-ray image different from the first X-ray image.
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公开(公告)号：US20230085940A1
公开(公告)日：2023-03-23
申请号：US17793649
申请日：2020-10-09
Applicant: Shimadzu Corporation
Inventor： Takahide HATAHORI , Kenji TAKUBO , Koki YOSHIDA
Abstract: A defect inspection apparatus (100) is configured to approximate a difference value or an absolute value (Ia) of the difference value between a pixel value in at least three captured images (A) captured by an imager in at least three different phases of an elastic wave and a pixel value in a reference image (Aave) separate from the captured images (A) so as to acquire an approximate value for defect inspection corresponding to an amount of change in the pixel value in the captured images (A).
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