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公开(公告)号：US20140354982A1
公开(公告)日：2014-12-04
申请号：US14193808
申请日：2014-02-28
Applicant: SEAGATE TECHNOLOGY LLC
Inventor： Joachim Walter Ahner , David M. Tung , Stephen Keith McLaurin
IPC: G01N21/94
CPC classification number: G01N21/8806 , G01N21/4738 , G01N21/95
Abstract: Provided herein are apparatuses and methods related thereto, wherein at least one apparatus includes: a photon emitting means configured to emit photons, wherein the photons are scattered from magnetic features of an article; a photon detector array configured to receive scattered photons; and a processing means configured to differentiate the magnetic features from the scattered photons.
Abstract translation: 这里提供的装置和方法，其中至少一个装置包括：配置成发射光子的光子发射装置，其中光子从物品的磁特征散射; 构造成接收散射光子的光子检测器阵列; 以及配置成将磁特征与散射光子区分开的处理装置。
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公开(公告)号：US20140098370A1
公开(公告)日：2014-04-10
申请号：US14046596
申请日：2013-10-04
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , David M. Tung , Samuel Kah Hean Wong , Henry Luis Lott , Stephen Keith McLaurin , Maissarath Nassirou , Florin Zavaliche
IPC: G01N21/55
CPC classification number: G01N21/55 , G01N21/4738 , G01N21/95
Abstract: Provided herein is an apparatus, comprising a first photon emitter configured to emit photons into an article from a circumferential edge of the article, and a photon detector array configured to detect photons scattered from features of the article.
Abstract translation: 本文提供了一种装置，其包括被配置为从制品的周边缘将光子发射到制品中的第一光子发射器，以及被配置为检测从制品的特征散射的光子的光子检测器阵列。
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公开(公告)号：US20140043621A1
公开(公告)日：2014-02-13
申请号：US13931266
申请日：2013-06-28
Applicant: Seagate Technology LLC
IPC: G01B11/24
CPC classification number: G01N21/8806 , G01B11/24 , G01N21/00 , G01N21/17 , G01N21/88 , G01N2201/061
Abstract: Provided herein is an apparatus, including a photon detector array configured to receive photons scattered from features in a surface of an article; and a characterization means for characterizing the features in the surface of the article, wherein the characterization means contrasts signals from the photon detector array corresponding to two sets of photons scattered from features in the surface of the article, and the two sets of photons respectively originate from photon emitters at different locations.
Abstract translation: 本文提供了一种装置，包括光子检测器阵列，其构造成接收从制品表面中的特征散射的光子; 以及用于表征制品表面中的特征的表征装置，其中所述表征装置对比来自所述光子检测器阵列的对应于从所述制品的表面中的特征散射的两组光子的信号，并且所述两组光子分别起始 来自不同地点的光子发射器。
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公开(公告)号：US10234400B2
公开(公告)日：2019-03-19
申请号：US14053493
申请日：2013-10-14
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , Florin Zavaliche , David M. Tung , Samuel Kah Hean Wong , Maissarath Nassirou , Henry Luis Lott , Stephen Keith McLaurin
Abstract: An apparatus for detecting surface features is disclosed. The apparatus may include a plurality of strands configured to contain light and further configured to transmit light from a light source to a surface of an article. The apparatus may also include a detector configured to receive light reflected from the surface of the article via the plurality of strands, wherein the detector is further configured to detect features associated with the article.
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公开(公告)号：US09297751B2
公开(公告)日：2016-03-29
申请号：US14032192
申请日：2013-09-19
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , Samuel Kah Hean Wong , Maissarath Nassirou , Henry Luis Lott , David M. Tung , Florin Zavaliche , Stephen Keith McLaurin
CPC classification number: G01N21/4738 , G01N21/95 , G01N2021/4764 , G01N2021/4792 , G01N2201/0635 , G01N2201/0683
Abstract: Provided herein is an apparatus, including an optical characterization device; a photon detector array configured to sequentially receive a first set of photons scattered from surface features of an article and a second set of photons scattered from surface features of the article and subsequently processed by the optical characterization device; and a chemical characterization means for chemically characterizing the surface features of the article, wherein the chemical characterization means is configured for processing the first set of photons received by the photon detector array and the second set of photons received by the photon detector array.
Abstract translation: 本文提供的装置包括光学表征装置; 光子检测器阵列，其被配置为顺序地接收从制品的表面特征散射并随后由所述光学表征装置处理的物品的表面特征散射的第一组光子和第二组光子; 以及用于化学表征所述制品的表面特征的化学表征装置，其中所述化学表征装置被配置用于处理由所述光子检测器阵列接收的第一组光子和由所述光子检测器阵列接收的所述第二组光子。
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Patent Agency Ranking
公开(公告)号：US09217715B2
公开(公告)日：2015-12-22
申请号：US14193808
申请日：2014-02-28
Applicant: SEAGATE TECHNOLOGY LLC
Inventor： Joachim Walter Ahner , David M. Tung , Stephen Keith McLaurin
CPC classification number: G01N21/8806 , G01N21/4738 , G01N21/95
Abstract: Provided herein are apparatuses and methods related thereto, wherein at least one apparatus includes: a photon emitting means configured to emit photons, wherein the photons are scattered from magnetic features of an article; a photon detector array configured to receive scattered photons; and a processing means configured to differentiate the magnetic features from the scattered photons.
Abstract translation: 这里提供的装置和方法，其中至少一个装置包括：配置成发射光子的光子发射装置，其中光子从物品的磁特征散射; 构造成接收散射光子的光子检测器阵列; 以及配置成将磁特征与散射光子区分开的处理装置。
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公开(公告)号：US09212900B2
公开(公告)日：2015-12-15
申请号：US13931266
申请日：2013-06-28
Applicant: Seagate Technology LLC
CPC classification number: G01N21/8806 , G01B11/24 , G01N21/00 , G01N21/17 , G01N21/88 , G01N2201/061
Abstract: Provided herein is an apparatus, including a photon detector array configured to receive photons scattered from features in a surface of an article; and a characterization means for characterizing the features in the surface of the article, wherein the characterization means contrasts signals from the photon detector array corresponding to two sets of photons scattered from features in the surface of the article, and the two sets of photons respectively originate from photon emitters at different locations.
Abstract translation: 本文提供了一种装置，包括光子检测器阵列，其构造成接收从制品表面中的特征散射的光子; 以及用于表征制品表面中的特征的表征装置，其中所述表征装置对比来自所述光子检测器阵列的对应于从所述制品的表面中的特征散射的两组光子的信号，并且所述两组光子分别起始 来自不同地点的光子发射器。
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公开(公告)号：US08988804B2
公开(公告)日：2015-03-24
申请号：US14055802
申请日：2013-10-16
Applicant: Seagate Technology LLC
Inventor： Stephen Keith McLaurin
CPC classification number: G11B5/746 , G11B5/855 , G11B17/028
Abstract: The embodiments disclose an orientation control bias point coupled to a magnetic index mark and having a bias point offset set at predetermined coordinates configured to substantially prevent concentricity run-out.
Abstract translation: 实施例公开了一种耦合到磁性指示标记的定向控制偏置点，并且具有设定在基本上防止同心度跳动的预定坐标处的偏置点偏移。
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公开(公告)号：US20140104604A1
公开(公告)日：2014-04-17
申请号：US14032186
申请日：2013-09-19
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , David M. Tung , Samuel Kah Hean Wong , Henry Luis Lott , Stephen Keith McLaurin , Maissarath Nassirou , Florin Zavaliche
IPC: G01N21/94
CPC classification number: G01N21/956 , G01N21/00 , G01N21/94 , G01N21/95
Abstract: Provided herein is an apparatus, including a photon detector array; and a processing means configured for processing photon-detector-array signals corresponding to a first set of photons scattered from surface features of an article focused in a first focal plane and a second set of photons scattered from surface features of an article focused in a second focal plane, wherein the processing means is further configured for distinguishing foreign surface features of the article from foreign native features of the article.
Abstract translation: 本文提供的装置包括光子检测器阵列; 以及处理装置，其被配置用于处理光子检测器阵列信号，所述光子检测器阵列信号对应于从聚焦在第一焦平面中的物体的表面特征散射的第一组光子和从聚焦在第二焦点的物体的表面特征散射的第二组光子散射的光子 焦平面，其中所述处理装置还被配置用于将所述制品的外来表面特征与所述制品的外来本机特征区分开。
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公开(公告)号：US20140098217A1
公开(公告)日：2014-04-10
申请号：US14046648
申请日：2013-10-04
Applicant: Seagate Technology LLC
Inventor： Joachim Walter Ahner , David M. Tung , Samuel Kah Hean Wong , Henry Luis Lott , Stephen Keith McLaurin , Maissarath Nassirou , Florin Zavaliche
CPC classification number: G01N21/8806 , G01N21/9501 , G01N2201/0636 , H04N7/18
Abstract: Provided herein is an apparatus, including a reflective surface configured to reflect photons onto a surface of an article, a stage configured to support the article, and an assembly. In some embodiments, the assembly configured to radiate photons through the article to the reflective surface. The assembly is further configured to image the article with irradiance of the photons.
Abstract translation: 本文提供了一种装置，其包括被配置为将光子反射到物品的表面上的反射表面，被配置为支撑物品的台和组件。 在一些实施例中，组件被配置为将光子穿过物品辐射到反射表面。 组件还被配置成对光子的辐照度对物品进行成像。
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