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公开(公告)号：US20240047696A1
公开(公告)日：2024-02-08
申请号：US18277471
申请日：2021-02-18
Applicant: TDK CORPORATION
Inventor： Makoto ENDO , Mingyu CHEN , Yoshihiro KANBAYASHI , Takasi SATOU , Natsumi KOZAI , Yoshihiko TANABE , Syuji TSUKAMOTO , Miyuki YANAGIDA
Abstract: A laminated resin film includes: a resin layer; and a Cu film having on one surface or both surfaces of the resin layer, in which in the Cu film, an orientation index of a plane is 0.15 or more according to a Lotgering method, a half-width of an X-ray diffraction peak obtained by X-ray diffraction measurement of the plane is 0.3° or less, and Expression (1) is satisfied.
y>3.75x−0.675 Expression (1)
(in Expression (1), Y is the orientation index of the plane in the Cu film according to the Lotgering method, and x is the half-width of the X-ray diffraction peak obtained by the X-ray diffraction measurement of the plane in the Cu film.)-
公开(公告)号：US20230361299A1
公开(公告)日：2023-11-09
申请号：US17634352
申请日：2021-03-29
Applicant: TDK Corporation
Inventor： Takuya AOKI , Shuji HIGASHI , Miyuki YANAGIDA , Makoto ENDO , Yoshihiro KANBAYASHI
IPC: H01M4/583 , H01M4/66 , H01M10/0525
CPC classification number: H01M4/583 , H01M4/667 , H01M10/0525 , G01N23/2055
Abstract: An electrode for power storage devices includes: a resin layer; a conductive layer containing copper and being disposed on the resin layer; and an active material layer containing graphite and being disposed on the conductive layer, wherein when measured by an X-ray diffraction method from a surface of the active material layer, a peak intensity ratio A/B between an intensity A at a highest X-ray diffraction peak in a range where a diffraction angle is 48° or more and 53° or less and an intensity B at a highest X-ray diffraction peak in a range where a diffraction angle is 52° or more and 57° or less satisfies Expression (1):
0.3
≤
A
/
B
≤
1
(1)
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