公开(公告)号：US10082662B2

公开(公告)日：2018-09-25

申请号：US15243265

申请日：2016-08-22

Applicant: Korea Advanced Institute of Science and Technology ,  Tomocube, Inc.

Inventor： YongKeun Park ,  Seungwoo Shin ,  Gwang Sik Park

IPC: G02B21/36 ,  G01N21/41 ,  G01N21/64 ,  G02B21/16 ,  G02B26/08 ,  G02B27/46 ,  G03H1/00 ,  G01N21/45 ,  G01N21/17

CPC classification number: G02B21/367 ,  G01N21/4133 ,  G01N21/45 ,  G01N21/6458 ,  G01N21/6486 ,  G01N2021/1787 ,  G01N2201/0635 ,  G02B21/16 ,  G02B26/0833 ,  G02B27/46 ,  G03H1/0005 ,  G03H2001/005

Abstract: An ultra-high-speed 3D refractive index tomography and structured illumination microscopy system using a wavefront shaper and a method using the same are provided. A method of using an ultra-high-speed 3D refractive index tomography and structured illumination microscopy system that utilizes a wavefront shaper includes adjusting an irradiation angle of a plane wave incident on a sample by using the wavefront shaper, measuring a 2D optical field, which passes through the sample, based on the irradiation angle of the plane wave, and obtaining a 3D refractive index image from information of the measured 2D optical field by using an optical diffraction tomography or a filtered back projection algorithm.