Multi-axis integrated inertial sensing device
    11.
    发明授权
    Multi-axis integrated inertial sensing device 有权
    多轴综合惯性传感装置

    公开(公告)号:US09541396B2

    公开(公告)日:2017-01-10

    申请号:US14160549

    申请日:2014-01-21

    Applicant: mCube Inc.

    Inventor: Sanjay Bhandari

    CPC classification number: G01C19/5776 G01C19/5783 G01P15/18

    Abstract: A system comprising an integrated multi-axis MEMS inertial sensor architecture. The system can include a MEMS gyroscope having a MEMS resonator and a MEMS accelerometer overlying a CMOS IC substrate. The CMOS IC substrate can include low noise Charge Sense amplifiers to process the sensed signals, programmable gain amplifiers, a demodulator, mixer, an AGC loop circuit coupled to the MEMS gyroscope to drive MEMS resonator. The CMOS IC also includes programmable Quadrature cancellation, Analog and digital phase shifters are implemented in the architecture to ensure quadrature cancellation and demodulation to achieve optimal performance. The AGC loop acts in a way such that generated desired signal amplitude out of the drive signal maintains MEMS resonator velocity at a desired frequency and amplitude while consuming low power. The MEMS gyroscope and accelerometer can be coupled to an input multiplexer configured to operate in a time-multiplexed manner.

    Abstract translation: 包括集成的多轴MEMS惯性传感器架构的系统。 该系统可以包括具有MEMS谐振器的MEMS陀螺仪和覆盖在CMOS IC衬底上的MEMS加速度计。 CMOS IC衬底可以包括用于处理感测信号的低噪声Charge Sense放大器,可编程增益放大器,解调器,混频器,耦合到MEMS陀螺仪的AGC环路以驱动MEMS谐振器。 CMOS IC还包括可编程正交取消,模拟和数字移相器在架构中实现,以确保正交消除和解调以实现最佳性能。 AGC环路的作用方式使得驱动信号中产生的期望信号幅度在消耗低功率的同时将MEMS谐振器速度保持在期望的频率和幅度。 MEMS陀螺仪和加速度计可以耦合到配置为以时间复用方式操作的输入多路复用器。

    INTEGRATED MEMS INERTIAL SENSING DEVICE
    12.
    发明申请
    INTEGRATED MEMS INERTIAL SENSING DEVICE 有权
    集成MEMS惯性感应装置

    公开(公告)号:US20150276405A1

    公开(公告)日:2015-10-01

    申请号:US14158756

    申请日:2014-01-17

    Applicant: mCube Inc.

    CPC classification number: G01C19/5776

    Abstract: An integrated MEMS inertial sensing device can include a MEMS inertial sensor with a drive loop configuration overlying a CMOS IC substrate. The CMOS IC substrate can include an AGC loop circuit coupled to the MEMS inertial sensor. The AGC loop acts in a way such that generated desired signal amplitude out of the drive signal maintains MEMS resonator velocity at a desired frequency and amplitude. A benefit of the AGC loop is that the charge pump of the HV driver inherently includes a ‘time constant’ for charging up of its output voltage. This incorporates the Low pass functionality in to the AGC loop without requiring additional circuitry.

    Abstract translation: 集成MEMS惯性感测装置可以包括具有覆盖在CMOS IC衬底上的驱动环配置的MEMS惯性传感器。 CMOS IC衬底可以包括耦合到MEMS惯性传感器的AGC环路电路。 AGC环路的作用方式使得从驱动信号中产生的期望信号幅度将MEMS谐振器速度保持在期望的频率和幅度。 AGC环路的优点是HV驱动器的电荷泵固有地包括用于充电其输出电压的“时间常数”。 这将低通功能集成到AGC环路中,无需额外的电路。

    Low power inertial sensor architecture and methods

    公开(公告)号:US11236999B1

    公开(公告)日:2022-02-01

    申请号:US16566793

    申请日:2019-09-10

    Applicant: mCube, Inc.

    Abstract: A controller for a MEMS gyroscope includes a first portion for generating a drive signal in response to an output from drive capacitors of the MEMS gyroscope, wherein the output signal has a resonant frequency and a phase, a second portion for determining a sampling signal in response to the output, wherein the sampling signal has a frequency that is a multiple of the resonant frequency, and has the phase, a multiplexer for outputting a multiplexed data comprising first data signals from first capacitors and second capacitors of the MEMS gyroscope multiplexed in response to the sampling signal, and a processing portion for reducing the resonant frequency from the multiplexed data.

    Single point offset calibration for inertial sensors
    14.
    发明授权
    Single point offset calibration for inertial sensors 有权
    惯性传感器的单点偏移校准

    公开(公告)号:US09594095B2

    公开(公告)日:2017-03-14

    申请号:US13936117

    申请日:2013-07-05

    Applicant: MCube, Inc.

    CPC classification number: G01P21/00 G01C25/005

    Abstract: A hand-held processor system for processing data from an integrated MEMS (Micro-Electro-Mechanical-Systems) device disposed within a hand-held computer system and methods therefor. The Single Point Offset Correction (SPOC) process computes offset values to calibrate MEMS sensors using a single set of data measurements at an orientation without dynamic perturbation, and without requiring advance knowledge of orientation of the device. Arbitrary output biases, which are known to be dominant on a single axis, can be corrected to ensure consistent performance. The SPOC process provides a simple method to effectively calibrate a MEMS sensor without requiring extensive system resources. This process can be enhanced by additional estimations of sensor offsets using the set of data measurements or by use of rule-based empirical gain factors.

    Abstract translation: 一种用于处理设置在手持计算机系统内的集成MEMS(微机电系统)装置的数据的手持处理器系统及其方法。 单点偏移校正(SPOC)过程计算偏移值,以在没有动态扰动的方向上使用单个数据测量集来校准MEMS传感器,并且不需要事先了解设备的取向。 已知在单个轴上占优势的任意输出偏差可以被校正,以确保一致的性能。 SPOC过程提供了一种简单的方法来有效地校准MEMS传感器,而不需要大量的系统资源。 可以通过使用该组数据测量或通过使用基于规则的经验增益因子的传感器偏移的附加估计来增强该过程。

    SECURITY SYSTEM AND METHODS FOR INTEGRATED DEVICES
    15.
    发明申请
    SECURITY SYSTEM AND METHODS FOR INTEGRATED DEVICES 审中-公开
    集成设备的安全系统和方法

    公开(公告)号:US20160349327A1

    公开(公告)日:2016-12-01

    申请号:US15236182

    申请日:2016-08-12

    Applicant: mCube Inc.

    Abstract: A method is provided for implementing a security mechanism in an integrated MEMS (Micro-Electro-Mechanical-System) device having a MEMS sensor with an output register associated with a sensing operation, the integrated MEMS device being electrically coupled to a computing system programmed to perform the method. The method includes, in normal operation, reading from the output register an output of the sensing operation, and in a test mode, determining, by a processor disposed within the computing system, a random value. Determining the random value can include reading from the output register, which in the test mode or provides a value from an internal pattern generator. The method also includes determining, by the processor, a validation value, reading, by the processor, the random value stored in the output register; and determining, by the processor, whether the integrated device is valid using the validation value and the random value stored in the output register.

    Abstract translation: 提供了一种用于在具有与传感操作相关联的输出寄存器的MEMS传感器的集成MEMS(微机电系统)装置中实现安全机制的方法,所述集成MEMS装置电耦合到被编程为 执行该方法。 该方法包括在正常操作中,从输出寄存器读取感测操作的输出,并且在测试模式中,由设置在计算系统内的处理器确定随机值。 确定随机值可以包括从输出寄存器读取,哪个在测试模式下或从内部模式生成器提供值。 该方法还包括由处理器确定验证值,由处理器读取存储在输出寄存器中的随机值; 以及由处理器使用存储在输出寄存器中的验证值和随机值来确定集成器件是否有效。

    DYNAMIC TEMPERATURE CALIBRATION
    16.
    发明申请
    DYNAMIC TEMPERATURE CALIBRATION 审中-公开
    动态温度校准

    公开(公告)号:US20140025330A1

    公开(公告)日:2014-01-23

    申请号:US13940199

    申请日:2013-07-11

    Applicant: MCube, Inc.

    Inventor: Sanjay Bhandari

    CPC classification number: G01P21/00

    Abstract: A hand-held processor system for processing data from an integrated MEMS (Micro-Electro-Mechanical-Systems) device disposed within a hand-held computer system and methods therefor. The Dynamic Temperature Correction (DTC) process computes offset values to calibrate MEMS sensors using a single set of data measurements at an orientation without dynamic perturbation and one or more temperature data measurements, and without requiring advance knowledge of orientation of the device. Arbitrary output biases, which are known to be dominant on a single axis, can be corrected to ensure consistent performance. The DTC process provides a simple method to effectively calibrate a MEMS sensor without requiring extensive system resources. This process can be enhanced by additional estimations of sensor offsets using the set of data measurements or by use of rule-based empirical gain factors.

    Abstract translation: 一种用于处理设置在手持计算机系统内的集成MEMS(微机电系统)装置的数据的手持处理器系统及其方法。 动态温度校正(DTC)过程计算偏移值,以在无动态扰动和一个或多个温度数据测量的情况下使用单一数据测量集合来校准MEMS传感器,并且不需要对器件取向的先进知识。 已知在单个轴上占优势的任意输出偏差可以被校正,以确保一致的性能。 DTC过程提供了一种简单的方法来有效地校准MEMS传感器,而不需要大量的系统资源。 可以通过使用该组数据测量或通过使用基于规则的经验增益因子的传感器偏移的附加估计来增强该过程。

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