公开(公告)号：US08130371B2

公开(公告)日：2012-03-06

申请号：US13111324

申请日：2011-05-19

Applicant: Kenji Imura

Inventor： Kenji Imura

IPC: G01J1/42 ,  G01J1/10 ,  G01J1/12

CPC classification number: G01N21/55

Abstract: A reflection characteristic measuring apparatus capable of scanning a specimen surface of a sheet specimen at a high speed is provided. The reflection characteristic measuring apparatus includes a group of illuminating and light-receiving systems for directing illuminating light onto the specimen surface of the sheet specimen held by a specimen holding roller pair and for receiving reflected light from the specimen surface. The illuminating and light-receiving systems measure a spectral characteristic of the received reflected light. The illuminating and light-receiving systems are disposed over one-dimensional arrays of color samples which extend in the longitudinal direction of the sheet specimen, and scan the one-dimensional arrays in a direction opposite to a direction in which the sheet specimen is transported.

Abstract translation: 提供了一种能够高速扫描片材试样表面的反射特性测量装置。 反射特性测量装置包括一组照明和光接收系统，用于将照明光引导到由样本保持辊对保持的片材样本的样本表面上，并用于接收来自样本表面的反射光。 照明和光接收系统测量所接收的反射光的光谱特性。 照明和光接收系统设置在沿片材的纵向方向延伸的一维彩色样本阵列上，并沿与片材被传送方向相反的方向扫描一维阵列。

公开(公告)号：US20110304849A1

公开(公告)日：2011-12-15

申请号：US12915486

申请日：2010-10-29

Applicant: Sung-min CHI ,  Sung-ouk JUNG ,  Myoung-soon KIM ,  Jeo-young SHIM ,  Tae-han JEON

Inventor： Sung-min CHI ,  Sung-ouk JUNG ,  Myoung-soon KIM ,  Jeo-young SHIM ,  Tae-han JEON

IPC: G01J1/10 ,  G03F7/20 ,  G03F7/004

CPC classification number: G01N21/6452

Abstract: A device for calibrating an optical scanner includes a substrate; and a pattern disposed on the substrate, the pattern comprising a photoresist.

Abstract translation: 用于校准光学扫描仪的装置包括：基板; 以及设置在所述基板上的图案，所述图案包括光致抗蚀剂。

公开(公告)号：US20110116087A1

公开(公告)日：2011-05-19

申请号：US13012707

申请日：2011-01-24

Applicant: Jason CHRISTIANSEN ,  Robert Pinard ,  Maciej P. Zerkowski ,  Gregory R. Tedeschi

Inventor： Jason CHRISTIANSEN ,  Robert Pinard ,  Maciej P. Zerkowski ,  Gregory R. Tedeschi

IPC: G01J1/10

CPC classification number: G01N21/6486 ,  G01N21/276 ,  G01N21/278 ,  G01N21/6458 ,  G01N2021/6439

Abstract: Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.

公开(公告)号：US20110110559A1

公开(公告)日：2011-05-12

申请号：US12616787

申请日：2009-11-12

Applicant: Yu-Hsiang Chen ,  An-Shun Cheng

Inventor： Yu-Hsiang Chen ,  An-Shun Cheng

IPC: G06K9/00 ,  G01B11/14 ,  G01J1/10

CPC classification number: G01S5/16 ,  G01B11/002 ,  G01S3/7803 ,  G01S3/784 ,  G06F3/0325 ,  G06T7/85 ,  G06T2207/10012

Abstract: An optical positioning apparatus and method are adapted for determining a position of an object in a three-dimensional coordinate system which has a first axis, a second axis and a third axis perpendicular to one another. The optical positioning apparatus includes a host device which has a first optical sensor and a second optical sensor located along the first axis with a first distance therebetween, and a processor connected with the optical sensors, and a calibrating device placed in the sensitivity range of the optical sensors with a second distance between an origin of the second axis and a coordinate of the calibrating device projected in the second axis. The optical sensors sense the calibrating device to make the processor execute a calibrating procedure, and then sense the object to make the processor execute a positioning procedure for determining the position of the object in the three-dimensional coordinate system.

Abstract translation: 光学定位装置和方法适于确定具有彼此垂直的第一轴，第二轴和第三轴的三维坐标系中的物体的位置。 光学定位装置包括主机装置，该主机装置具有第一光学传感器和第二光学传感器，该第一光学传感器和第二光学传感器沿着第一轴线以第一距离位于第一光学传感器和第二光学传感器之间，处理器与光学传感器连接，校准装置设置在 具有第二轴的原点与投影在第二轴上的校准装置的坐标之间的第二距离的光学传感器。 光学传感器感测校准装置以使处理器执行校准过程，然后感测对象以使处理器执行用于确定对象在三维坐标系中的位置的定位过程。

公开(公告)号：US07929127B2

公开(公告)日：2011-04-19

申请号：US12071357

申请日：2008-02-20

Applicant: Fumio Watanabe ,  Katsurou Bukawa

Inventor： Fumio Watanabe ,  Katsurou Bukawa

IPC: G01J1/10

CPC classification number: G01J1/0455 ,  B23K26/705 ,  G01J1/04 ,  G01J1/4257

Abstract: There is provided a laser energy measuring unit whose laser energy measuring range is widened. The laser energy measuring unit has a filter provided within an optical path of a laser to attenuate energy of the laser, a calculating section for measuring the energy of the laser passing through the filter, and a condenser lens provided on one side of the filter for condensing the laser. The filter has a shading portion for blocking a center part of the laser beam from being transmitted through the filter at a position coincident with the center of the laser. The center part of the laser where its energy is large is cut by the shading portion, and the calculating section measures the part where its energy is not so large. Thereby, it is possible to widen the laser energy measuring range.

Abstract translation: 提供了激光能量测量范围扩大的激光能量测量单元。 激光能量测量单元具有设置在激光器的光路内的滤光器，用于衰减激光的能量，用于测量穿过滤光器的激光的能量的计算部分和设置在滤光器一侧的聚光透镜， 冷凝激光 滤光器具有用于阻挡激光束的中心部分的遮蔽部分在与激光器的中心重合的位置处透射通过滤光器。 其能量大的激光器的中心部分被遮光部分切割，并且计算部分测量其能量不是很大的部分。 由此，能够扩大激光能量的测量范围。

公开(公告)号：US20110046908A1

公开(公告)日：2011-02-24

申请号：US12755194

申请日：2010-04-06

Applicant: Hyug Rae CHO ,  Jong Rip LEE ,  Sung Hwa LEE

Inventor： Hyug Rae CHO ,  Jong Rip LEE ,  Sung Hwa LEE

IPC: G06F19/00 ,  G01J1/10 ,  G01N21/59

CPC classification number: G01N21/274

Abstract: A method and apparatus for calibration of a result from a test device using a reagent are provided. The method includes measuring an optical signal for a sample contained in the test device to obtain a measured optical signal value, the sample having a known concentration; and determining a relationship between the known concentration of the sample and a ratio of an estimated optical signal value to the measured optical signal value of the sample.

Abstract translation: 提供了一种用于使用试剂校准来自测试装置的结果的方法和装置。 该方法包括测量包含在测试装置中的样品的光信号，以获得测量的光信号值，样品具有已知浓度; 以及确定样品的已知浓度与估计的光信号值与样品的测量光信号值的比率之间的关系。

公开(公告)号：US20100321681A1

公开(公告)日：2010-12-23

申请号：US12488565

申请日：2009-06-21

Applicant: Jiuan-Jiuan Chen ,  Paul Messier

Inventor： Jiuan-Jiuan Chen ,  Paul Messier

IPC: G01J1/10 ,  G09G5/02

CPC classification number: G01J3/52 ,  G01J3/506 ,  G01N21/278 ,  G01N21/64 ,  G09G5/02 ,  G09G2320/0666

Abstract: A fluorescent color calibrator for calibrating RGB pixel values is provided. The fluorescent color calibrator includes a plurality of fluorogenic compounds adapted to fluoresce in a visible color spectrum; and a second plurality of fluorogenic compounds adapted to fluoresce in multiple visible gray spectrums. Also provided is a method for using the fluorescent color calibrator to standardize fluorescent colors when viewing with an RGB monitor.

Abstract translation: 提供了一种用于校准RGB像素值的荧光色校准器。 荧光色校准器包括适于以可见色谱发荧光的多种荧光化合物; 以及适于在多个可见灰色光谱中发荧光的第二组多个荧光化合物。 还提供了使用荧光色校准器来在用RGB监视器观看时使荧光颜色标准化的方法。

公开(公告)号：US20100225910A1

公开(公告)日：2010-09-09

申请号：US12739478

申请日：2008-09-30

Applicant: Stephan Wagner-Conrad ,  Frank Hecht ,  Klaus Weisshart ,  Ralf Netz

Inventor： Stephan Wagner-Conrad ,  Frank Hecht ,  Klaus Weisshart ,  Ralf Netz

IPC: G01J3/28 ,  G01J1/10

CPC classification number: G02B21/0076 ,  G02B21/008

Abstract: 1.1. Method for the configuration a laser scanning microscope for a raster image correlation spectroscopy measurement and method for carrying out and evaluating a measurement of this kind. 2.1. Manual setting of the scan parameters for a raster image correlation spectroscopy measurement (RICS) is complicated because the effects of setting a certain parameter are not apparent due to the complex interaction between the various parameters and also depend on the physical-technical properties of the microscope. By means of an improved configuration method, mathematical transport models can be fitted to correlations determined by means of scanning fluorescence spectroscopy with few errors. With improved methods for carrying out or evaluating a RICS measurement, the amount of data to be stored can be reduced and RICS correlations of high statistical quality can be determined within a short period of time. 2.2. According to the invention, for a raster image correlation spectroscopy measurement, a best value for a sampling value is determined and is specified for a subsequent scanning process on a sample. In order to carry out or evaluate a RICS measurement, sampling values are acquired or a correlation is determined exclusively in a sample region within which a pixel time (ΔP) changes along a harmonically controlled scan axis (X) by less than, or at most by, a predetermined or predeterminable value. 2.3. The invention is preferably used in laser scanning microscopes.

Abstract translation: 1.1。 配置用于光栅图像相关光谱测量的激光扫描显微镜的方法和用于执行和评估这种测量的方法。 2.1。 用于光栅图像相关光谱测量（RICS）的扫描参数的手动设置是复杂的，因为设置某个参数的效果由于各种参数之间的复杂相互作用而不明显，并且还取决于显微镜的物理 - 技术性质 。 通过改进的配置方法，数学传递模型可以适用于通过扫描荧光光谱法确定的相关性，几乎没有错误。 通过改进的RICS测量方法，可以减少存储的数据量，并可以在短时间内确定高统计质量的RICS相关性。 2.2。 根据本发明，对于光栅图像相关光谱测量，确定采样值的最佳值，并为样品的后续扫描过程确定。 为了执行或评估RICS测量，获取采样值或仅在像素时间（＆Dgr; P）沿着谐波控制的扫描轴（X）改变小于或等于或小于或等于 最多可以是预定的或可预定的值。 2.3。 本发明优选用于激光扫描显微镜。

公开(公告)号：US20100220321A1

公开(公告)日：2010-09-02

申请号：US12543459

申请日：2009-08-18

Applicant: H. Pin Kao ,  Ian A. Harding ,  Achim Karger ,  Mark F. Oldham ,  Omead Ostadan ,  Greg Young

Inventor： H. Pin Kao ,  Ian A. Harding ,  Achim Karger ,  Mark F. Oldham ,  Omead Ostadan ,  Greg Young

IPC: G01J1/10

CPC classification number: G01N35/028 ,  B01L3/0293 ,  B01L3/5025 ,  B01L3/50851 ,  B01L3/50853 ,  B01L3/563 ,  B01L7/52 ,  B01L9/50 ,  B01L9/523 ,  B01L2200/021 ,  B01L2200/025 ,  B01L2200/0605 ,  B01L2200/0642 ,  B01L2200/0689 ,  B01L2300/022 ,  B01L2300/044 ,  B01L2300/046 ,  B01L2300/0829 ,  B01L2300/0851 ,  B01L2300/0864 ,  B01L2300/1805 ,  B01L2400/0406 ,  B01L2400/0409 ,  B01L2400/0487 ,  G01N21/274 ,  G01N21/6428 ,  G01N21/6452 ,  G01N2035/00366 ,  H04N5/361 ,  H04N5/367 ,  Y10T436/10

Abstract: Methods for normalizing output from an instrument employing a reference standard or non-fluorescing substance disposed within at least one of a plurality of reaction chambers. The method comprises collecting and analyzing a signal associated with the reference standard or non-fluorescing substance to determine a normalizing bias. The normalizing bias is then applied to the data signal collected from a remainder of the plurality of reaction chambers.

Abstract translation: 用于使用设置在多个反应室中的至少一个中的参考标准或非荧光物质的仪器的输出正常化的方法。 该方法包括收集和分析与参考标准或非荧光物质相关联的信号以确定归一化偏差。 然后将归一化偏压施加到从多个反应室的其余部分收集的数据信号。

公开(公告)号：US20100220316A1

公开(公告)日：2010-09-02

申请号：US12775293

申请日：2010-05-06

Applicant: Moshe Finarov

Inventor： Moshe Finarov

IPC: G01N21/86 ,  G06F19/00 ,  G01N21/00 ,  G01J1/10

CPC classification number: G01B11/06 ,  G01B11/0625 ,  G01N21/31 ,  G01N21/6489 ,  G01N21/65 ,  G01N21/8422 ,  G01N21/8901 ,  G01N2021/3568 ,  G01N2021/8908 ,  G01N2201/0826 ,  G01N2201/0833 ,  G01N2201/1085

Abstract: Photovoltaic thin film quality control is obtained where the thin film is supported by a support and a section of the film is illuminated by a polychromatic or monochromatic illumination source. The source forms on the thin film an illuminated line. The light collected from discrete sampled points located on the illuminated line is transferred to a photo-sensitive sensor through an optical switch. The spectral signal of the light reflected, transmitted or scattered by the sampled points is collected by the sensor, processed and photovoltaic thin film parameters applicable to the quality control are derived e.g. thin film thickness, index of refraction, extinction coefficient, absorption coefficient, energy gap, conductivity, crystallinity, surface roughness, crystal phase, material composition and photoluminescence spectrum and intensity. Manufacturing equipment parameters influencing the material properties may be changed to provide a uniform thin film layer with pre-defined properties.

Abstract translation: 获得光电薄膜质量控制，其中薄膜由支撑体支撑并且膜的一部分被多色或单色照明源照射。 源在薄膜上形成一条照明线。 从位于照明线上的离散采样点收集的光通过光学开关转移到光敏传感器。 由采样点反射，传播或散射的光的光谱信号由传感器收集，处理和适用于质量控制的光伏薄膜参数例如被导出。 薄膜厚度，折射率，消光系数，吸收系数，能隙，导电率，结晶度，表面粗糙度，结晶相，材料组成和光致发光光谱和强度。 可以改变影响材料性能的制造设备参数，以提供具有预定特性的均匀薄膜层。