PIC STRUCTURE WITH WIRE(S) BETWEEN Z-STOP SUPPORTS ON SIDE OF OPTICAL DEVICE ATTACH CAVITY

    公开(公告)号:US20240103237A1

    公开(公告)日:2024-03-28

    申请号:US17933199

    申请日:2022-09-19

    CPC classification number: G02B6/423 G02B6/4206 G02B6/424 G02B6/4274

    Abstract: A photonic integrated circuit (PIC) structure includes a substrate, and a cavity defined in the substrate, the cavity including a shoulder at a side of the cavity. A plurality of z-stop supports for an optical device are also included. Each z-stop support of the plurality of z-stop supports is on a support portion of the shoulder. A wire extends over the side of the cavity and between at least two z-stop supports of the plurality of z-stop supports. An optical device is positioned on the plurality of z-stop supports in the cavity and electrically coupled to the wire. Electrical connections between z-stop supports allows larger sized electrical connections to the optical device to mitigate electromigration issues, and increased options for electrical connections.

    WAFER-LEVEL TESTING OF LASERS ATTACHED TO PHOTONICS CHIPS

    公开(公告)号:US20210356684A1

    公开(公告)日:2021-11-18

    申请号:US15930876

    申请日:2020-05-13

    Inventor: Zhuojie Wu Bo Peng

    Abstract: Structures for a photonics chip, testing methods for a photonics chip, and methods of forming a structure for a photonics chip. A photonics chip includes a first waveguide, a second waveguide, an optical tap coupling the first waveguide to the second waveguide, and a photodetector coupled to the second waveguide. A laser is attached to the photonics chip. The laser is configured to generate laser light directed by the first waveguide to the optical tap.

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