公开(公告)号：US20230357958A1

公开(公告)日：2023-11-09

申请号：US18040304

申请日：2021-08-03

Applicant: SECURITY MATTERS LTD.

Inventor： Yifat BAREKET ,  Hagit SADE ,  Or LIVERTZ ,  Dana GASPAR ,  Michal FIRSTENBERG ,  Nataly TAL ,  Mor KAPLINSKY ,  Haggai ALON ,  Ron DAFNI ,  Chen NACHMIAS ,  Nadav YORAN ,  Michal BURCK ZALTZMAN

IPC: D01B7/02 ,  D01C3/02 ,  A01K67/04 ,  A23K50/90

CPC classification number: D01B7/02 ,  A01K67/04 ,  A23K50/90 ,  D01C3/02

Abstract: A process is provided for identifying a production and/or commercial history of a silk fiber or a product made therefrom.

公开(公告)号：US20230137779A1

公开(公告)日：2023-05-04

申请号：US17907738

申请日：2021-03-24

Applicant: SECURITY MATTERS LTD.

Inventor： Nataly TAL ,  Mor KAPLINSKY ,  Tehila NAHUM ,  Hagit SADE ,  Dana GASPER ,  Ron DAFNI ,  Chen NACHMIAS ,  Michal FIRSTENBERG ,  Avital TRACHTMAN ,  Haggai ALON ,  Nadav YORAN ,  Tzemah KISLEV

IPC: G06K7/10 ,  B42D25/373

Abstract: There are disclosed a method of producing an XRF readable mark, the XRF readable mark and a component comprising thereof. The method comprises providing an XRF marking composition with specific relative concentrations of one or more chemical elements and fabricating a multilayer structure of the XRF readable mark. The relative concentrations are selected such that in response to irradiation of the XRF marking composition by XRF exciting radiation, the XRF marking composition emits an XRF signal indicative of a predetermined XRF signature. Fabricating the multilayer structure comprises implementing an attenuation layer with at least one element exhibiting high absorbance for an XRF exciting radiation and/or an XRF background; and implementing a marking layer comprising said XRF marking composition.

公开(公告)号：US20220388329A1

公开(公告)日：2022-12-08

申请号：US17819334

申请日：2022-08-12

Applicant: SECURITY MATTERS LTD. ,  SOREQ NUCLEAR RESEARCH CENTER

Inventor： Yair GROF ,  Tzemah KISLEV ,  Nadav YORAN ,  Yaara BONDY ,  Haggai ALON

IPC: B42D25/373 ,  B42D25/445 ,  B42D25/47 ,  C09D7/61 ,  C09D7/63 ,  C09D5/02 ,  C09D133/04 ,  C09K11/00 ,  C09K11/08 ,  G01N23/083 ,  B42D25/378 ,  G01N23/223

Abstract: The present invention provides an anti-counterfeit marking technique for verifying authenticity of objects using x-rays fluorescence (XRF) analysis.

公开(公告)号：US20220317069A1

公开(公告)日：2022-10-06

申请号：US17594406

申请日：2020-04-05

Applicant: SECURITY MATTERS LTD.

Inventor： Yair GROF ,  Dmitrijs DOCENKO ,  Mirit KAGARLITSKY ,  Nataly TAL ,  Nadav YORAN ,  Haggai ALON

IPC: G01N23/207 ,  G01N23/223 ,  G01N33/38

Abstract: A method and system are provided for model-based analysis of samples of interest and management of sample classification. Predetermined modeled data is provided including data indicative of K models for respective K measurement schemes based on a predetermined function having a spectral line shape, data indicative of M characteristic vectors of M predetermined group to which different samples relate, and data indicative of a common vector of weights for the M groups. A data processor utilizes the data and operates to apply model-based processing to measured spectral data of a sample of interest using the predetermined modeled data, and generate classification data indicative of relation of the specific sample of interest to one of the M predetermined groups.

公开(公告)号：US20220251252A1

公开(公告)日：2022-08-11

申请号：US17626916

申请日：2020-07-15

Applicant: SECURITY MATTERS LTD.

Inventor： Yifat BAREKET ,  Nadav YORAN ,  Haggai ALON ,  Michal FIRSTENBERG ,  Tehila NAHUM

IPC: C08F8/42 ,  C08K5/56 ,  C08J3/22 ,  C08J3/24 ,  C08F20/10

Abstract: The present invention is in the field of polymers comprising XRF identifiable tracers allowing information to be encoded by the polymers, and in particular polymers for conservation, restoration and retouching in artworks, electronics, coatings, plastics etc.

公开(公告)号：US20210048399A1

公开(公告)日：2021-02-18

申请号：US16334431

申请日：2017-09-17

Applicant: SOREQ NUCLEAR RESEARCH CENTER ,  SECURITY MATTERS LTD.

Inventor： Yair GROF ,  Tzemah KISLEV ,  Nadav YORAN ,  Haggai ALON ,  Mor KAPLINSKY

IPC: G01N23/223

Abstract: A control system and method are presented for controlling operation of an X-ray Fluorescent (XRF) system for detecting at least one material carried by a sample, for example at least one marker carried by the sample. The control system comprises: data input utility for receiving input data comprising material/marker related data about said at least one material/marker; and data processor and analyzer utility. The data processor and analyzer utility is configured and operable for analyzing the input data and determining optimal geometrical characteristics of the XRF system for optimizing operational conditions of said XRF system to maximize amount of primary X-ray radiation that reaches a predetermined region of the sample and is absorbed by a volume of said region and to maximize a portion of secondary radiation emitted from said region that reaches a detector of the XRF system; and for generating operational data to the XRF system enabling adjustment of the geometrical characteristics of the XRF system.