Abstract:
A method of operation of a storage control system includes: partitioning memory channels with memory devices; selecting a super device with one of the memory devices from one of the memory channels, the super device having a super chip select connected to chip selects of the memory devices; and selecting a super block associated with the super device.
Abstract:
A storage control system, and a method of operation thereof, including: a power-down module for powering off a memory sub-system; a decay estimation module, coupled to the power-down module, for estimating a power-off decay rate upon the memory sub-system powered up, the power-off decay rate is for indicating how much data in the memory sub-system has decayed while the memory sub-system has been powered down; and a recycle module, coupled to the decay estimation module, for recycling an erase block for data retention based on the power-off decay rate.
Abstract:
A method of operation of a storage control system includes: partitioning memory channels with memory devices; selecting a super device with one of the memory devices from one of the memory channels, the super device having a super chip select connected to chip selects of the memory devices; and selecting a super block associated with the super device.
Abstract:
An electronic system and method of operation thereof includes: a control unit for receiving a patterned signal; a recognizer module, coupled to the control unit, for recognizing an unique trigger from the patterned signal; an operation module, coupled to the recognizer module, for detecting an operational mode from the unique trigger; and a change module, coupled to the operation module, for configuring a system state change of a memory sub-system based on the operational mode.
Abstract:
A storage control system and method of operation thereof includes: a control unit for initiating a hardening process beginning at a power-down signal; a counter module, coupled to the control unit for tracking a recorded time beginning at the power-down signal; a completion module, coupled to the counter module, for generating a work-complete entry in memory devices at a conclusion of the hardening process; and a calculation module, coupled to the completion module, for calculating a power down margin by determining the recorded time between the work-complete entry and a complete power loss of a hold-up power.