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    Distinguishing foreign surface features from native surface features
    23.
    发明授权
    Distinguishing foreign surface features from native surface features 有权
    区分异常表面特征与原生表面特征

    公开(公告)号：US09377394B2

    公开(公告)日：2016-06-28

    申请号：US14032186

    申请日：2013-09-19

    Applicant: Seagate Technology LLC

    Inventor： Joachim Walter Ahner ,  David M. Tung ,  Samuel Kah Hean Wong ,  Henry Luis Lott ,  Stephen Keith McLaurin ,  Maissarath Nassirou ,  Florin Zavaliche

    IPC: G01N21/00 ,  G01N21/94 ,  G01N21/95

    CPC classification number: G01N21/956 ,  G01N21/00 ,  G01N21/94 ,  G01N21/95

    Abstract: Provided herein is an apparatus, including a photon detector array; and a processing means configured for processing photon-detector-array signals corresponding to a first set of photons scattered from surface features of an article focused in a first focal plane and a second set of photons scattered from surface features of an article focused in a second focal plane, wherein the processing means is further configured for distinguishing foreign surface features of the article from foreign native features of the article.

    Abstract translation: 本文提供的装置包括光子检测器阵列; 以及处理装置，其被配置用于处理光子检测器阵列信号，所述光子检测器阵列信号对应于从聚焦在第一焦平面中的物体的表面特征散射的第一组光子和从聚焦在第二焦点的物体的表面特征散射的第二组光子散射的光子 焦平面，其中所述处理装置还被配置用于将所述制品的外来表面特征与所述制品的外来本机特征区分开。

    APPARATUSES AND METHODS FOR MAGNETIC FEATURES OF ARTICLES
    25.
    发明申请
    APPARATUSES AND METHODS FOR MAGNETIC FEATURES OF ARTICLES 有权
    文章的磁性特征的装置和方法

    公开(公告)号：US20160069815A1

    公开(公告)日：2016-03-10

    申请号：US14935081

    申请日：2015-11-06

    Applicant: Seagate Technology LLC

    Inventor： Joachim Walter Ahner ,  David M. Tung ,  Stephen Keith McLaurin

    IPC: G01N21/88 ,  G01N21/95 ,  G01N21/47

    CPC classification number: G01N21/8806 ,  G01N21/4738 ,  G01N21/95

    Abstract: Provided herein is an apparatus including a photon emitter configured to emit photons onto a surface of an article. In addition, the apparatus includes a photon detector array configured to receive photons scattered from surface features and magnetic features of the article. The photon detector array is configured to provide information for mapping the magnetic features.

    Abstract translation: 本文提供的装置包括被配置为将光子发射到制品的表面上的光子发射器。 此外，该装置包括光子检测器阵列，其构造成接收从物体的表面特征和磁性特征散射的光子。 光子检测器阵列被配置为提供用于映射磁性特征的信息。

    REFLECTIVE SURFACES FOR SURFACE FEATURES OF AN ARTICLE
    26.
    发明申请
    REFLECTIVE SURFACES FOR SURFACE FEATURES OF AN ARTICLE 有权
    表面特征的反射表面

    公开(公告)号：US20160069799A1

    公开(公告)日：2016-03-10

    申请号：US14935097

    申请日：2015-11-06

    Applicant: Seagate Technology LLC

    Inventor： Joachim W. Ahner ,  David M. Tung ,  Stephen Keith McLaurin ,  Travis W. Grodt

    IPC: G01N21/47 ,  G01N21/88

    CPC classification number: G01N21/474 ,  G01N21/8806 ,  G01N21/95 ,  G01N21/9506

    Abstract: Provided herein is an apparatus including a photon emitter configured for reflecting photons from a surface of an article onto a first reflective surface. In addition, a second reflective surface is configured for reflecting photons from the surface of the article back onto the surface of the article. The apparatus also includes a detector configured to provide information corresponding to photons scattered from features of the article.

    Abstract translation: 本文提供了一种包括光子发射器的设备，其被配置用于将光子从物体的表面反射到第一反射表面上。 此外，第二反射表面被配置为将来自物品表面的光子反射回到物品的表面上。 该装置还包括检测器，其被配置为提供对应于从物品的特征分散的光子的信息。

    INITIALIZATION OF MAGNETIC FEATURES
    27.
    发明申请
    INITIALIZATION OF MAGNETIC FEATURES 有权
    磁性特征的初始化

    公开(公告)号：US20150015353A1

    公开(公告)日：2015-01-15

    申请号：US14055805

    申请日：2013-10-16

    Applicant: Seagate Technology LLC

    Inventor： Stephen Keith McLaurin ,  Weilu Xu

    IPC: H01F13/00

    CPC classification number: G11B5/024 ,  G11B5/012 ,  G11B5/02 ,  G11B5/0245 ,  G11B5/746

    Abstract: The embodiments disclose an alternating current (AC) erase process configured to cancel out existing polarity of stack magnetic features on both sides of the stack and an AC reset process configured to initialize the polarity of the device stack magnetic features of both sides of a stack configured to create a uniform polarity.

    Abstract translation: 实施例公开了一种交流（AC）擦除过程，其被配置为抵消堆叠两侧的堆叠磁特征的现有极性，并且AC复位过程被配置为初始化配置的堆叠的两侧的器件堆叠磁特征的极性 以产生均匀的极性。

    FEATURE DETECTION WITH LIGHT TRANSMITTING MEDIUM
    28.
    发明申请
    FEATURE DETECTION WITH LIGHT TRANSMITTING MEDIUM 审中-公开
    具有光传输介质的特征检测

    公开(公告)号：US20140104603A1

    公开(公告)日：2014-04-17

    申请号：US14053493

    申请日：2013-10-14

    Applicant: Seagate Technology LLC

    Inventor： Joachim Walter Ahner ,  Florin Zavaliche ,  David M. Tung ,  Samuel Kah Hean Wong ,  Maissarath Nassirou ,  Henry Luis Lott ,  Stephen Keith McLaurin

    IPC: G01N21/95

    CPC classification number: G01N21/95 ,  G01B11/24 ,  G01N21/47

    Abstract: An apparatus for detecting surface features is disclosed. The apparatus may include a plurality of strands configured to contain light and further configured to transmit light from a light source to a surface of an article. The apparatus may also include a detector configured to receive light reflected from the surface of the article via the plurality of strands, wherein the detector is further configured to detect features associated with the article.

    Abstract translation: 公开了一种用于检测表面特征的装置。 该装置可以包括被配置为容纳光并且进一步被配置为将光从光源透射到物品的表面的多个股线。 该装置还可以包括检测器，其被配置为经由多个股线接收从物品的表面反射的光，其中该检测器还被配置为检测与该物品相关联的特征。

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