Abstract:
A system including a plurality of transmission lines, a transmitter outputting respective signals to each of the plurality of transmission lines, a receiver receiving each of the plurality of signals via respective transmission lines, the receiver including a connection path connected to a termination voltage, a plurality of termination circuits distributed along the connection path, each termination circuit receiving a unique termination voltage from the connection path, receiving a respective signal and outputting a terminated input signal, a reference voltage generator including multiple reference voltage generator units connected to a common voltage, each reference voltage generator unit uniquely receiving at least one unique termination voltage and outputting a reference voltage, and a plurality of data input buffers receiving respective signals and an appropriate reference voltage of the multiple reference voltages output from the reference voltage generator.
Abstract:
A data bus inversion (DBI) circuit includes at least one DBI block configured to invert an input data signal based on the logic state of input data bits. The DBI block includes a comparison deciding unit configured to generate, in a first mode, a comparison signal based on the number of changed bits by comparing respective bit signals of the input data signal and a previous input data signal. The comparison deciding unit generates an inversion control signal which controls whether the input data will be inverted or not. In a second mode, the comparison deciding unit generates an inversion control signal based on the predominant logic state of the input data signal bits. A data converting unit is configured to invert the input data signal in response to the inversion control signal. Method embodiments are also disclosed.
Abstract:
An output data strobe signal generating method and a memory system that includes a plurality of semiconductor memory devices, and a memory controller for controlling the semiconductor memory devices, wherein the memory controller provides a command signal and a chip selecting signal to the semiconductor memory devices. One or more of the semiconductor memory devices may detect a read command and a dummy read command in response to the command signal and the chip selecting signal and generate one or more preamble signals based on a calculated preamble cycle number.
Abstract:
DC balance encoded data is transmitted by transmitting a preamble of dummy data that is configured to provide an intermediate number of bits of a given logic value that is at least one bit of the given logic value but less than a maximum number of bits of the given logic value in the DC balance encoded data, to thereby reduce the simultaneous switching noise that is caused by transmission of a first word of DC balance encoded data. The preamble may contain one or more words of fixed and/or variable dummy data.
Abstract:
A memory system and a method of reading and writing data to a memory device provide byte-by-byte write data insertion without adding extra pins or balls to the packaged device. Accordingly, the high frequency performance of the device can be improved.
Abstract:
A memory system includes first and second memory devices having commonly connected data terminals and commonly connected memory control signal terminals, e.g., devices in respective first and second independently selectable memory banks that share common data lines and common memory control signal lines, such as column address strobe, row address strobe, write enable, and address signal lines. The first and second memory devices includes respective selective on-die termination (ODT) circuits configured to selectively provide first and second termination impedances at their respective data terminals responsive to a memory control signal at the commonly connected memory control signal terminals. The selective ODT circuits may produce the first termination impedance responsive to a memory write operation, and may produce the second termination impedance responsive to a memory read operation and/or expiration of a predetermined time interval following termination of the memory write operation. Preferably, the first termination impedance is less than the second termination impedance, and the selective ODT circuits provide the first termination impedance responsive to the memory write operation irrespective of which of the first and second memory devices is being written to.
Abstract:
A semiconductor memory device and a power line arrangement method are disclosed. The semiconductor memory device includes a plurality of pads, each pad including an upper pad and a lower pad arranged below the upper pad, wherein pad power lines are arranged below the lower pads of the plurality of pads in a direction of crossing the pads to interconnect the pads that transmit the same level of electrical power among the plurality of pads.
Abstract:
A circuit for generating a reference voltage includes a first reference voltage generating circuit disposed outside a chip and a second reference voltage generating circuit disposed inside the chip. The first and second reference voltage generating circuits output first and second reference voltages to first and second output terminals, respectively. The second reference voltage generating circuit includes at least one pull-up resistor and at least one pull-down resistor. The pull-up resistor is coupled between a first node where an internal power supply voltage is coupled and the second output terminal. The pull-down resistor is coupled between a second node and the second output terminal, wherein a voltage at the second node is relatively lower than a voltage at the first node. A third reference voltage is outputted from a node where the first output terminal is coupled to the second output terminal.
Abstract:
A method for activating a word line segment of a semiconductor memory selected based on a row address provided to the memory can include activating a first word line segment selected by a row address and a command type and avoiding activating a second word line segment selected by the row address. Related devices are also disclosed.
Abstract:
A method of generating a clock may use an analog synchronous mirror delay (ASMD) circuit with a duty cycle correction scheme, and an internal clock generator may use one or more of the ASMD circuits, The ASMD circuit may include a comparator with first and second input terminals that generates an output clock based on a comparison result between a signal on the first input terminal and a signal on the second input terminal, a first precharge circuit connected to the first input terminal and precharging the first input terminal, and a second precharge circuit connected to the second input terminal and precharging the second input terminal. The ASMD circuit may also include a first pair of discharge circuits discharging the first input terminal within first and second cycles of the input clock, and a second pair of discharge circuits discharging the second input terminal within first and second cycles of the input clock.