Three dimensional scanning system
    31.
    发明授权
    Three dimensional scanning system 失效
    三维扫描系统

    公开(公告)号:US5276546A

    公开(公告)日:1994-01-04

    申请号:US945526

    申请日:1992-09-16

    Abstract: A part scanning and part calibration method for the inspection of printed circuit boards and integrated circuits includes a camera and two rotating mirrors to scan an image of a pattern mask retical upon which a precise pattern has been deposited. Small parts are placed upon the retical to be inspected. The third overhead mirror is provided to view the part under inspection from another perspective. The scene of the part is triangulated and the dimensions of the system can thus be calibrated. A precise retical mask is provided with dot patterns which provide an additional set of information needed for calibration. By scanning more than one dot pattern the missing state values can be resolved using an iterative trigonomic solution.

    Abstract translation: 用于检查印刷电路板和集成电路的部件扫描和部件校准方法包括相机和两个旋转镜,用于扫描已经沉积精确图案的图案掩模图案的图像。 小部件放置在被检查的retical上。 提供第三顶置反射镜以从另一个角度来观察被检查的部件。 该部件的场景是三角形的,因此可以校准系统的尺寸。 提供了精确的掩模掩模,其具有提供校准所需的另外一组信息的点图案。 通过扫描多个点阵图,可以使用迭代的三叉型解决方案来解决缺失的状态值。

    Cigarette inspection device
    32.
    发明授权
    Cigarette inspection device 失效
    香烟检查装置

    公开(公告)号:US5228462A

    公开(公告)日:1993-07-20

    申请号:US889457

    申请日:1992-05-27

    Abstract: Inspection of completed cigarettes is accomplished by the cigarettes traveling on a rolling drum past a single stationary rolling block with preferably two cameras connected to a vision system. The first camera views the cigarette before the rolling block, the cigarette is then rolled approximately 180.degree. and then the second camera views the previously hidden portion of the cigarette. Cigarettes are accepted or rejected based on a comparison of the viewed cigarettes to a predetermined set of characteristics.

    Abstract translation: 完成的香烟的检查是通过在滚动鼓上行进的香烟通过连接到视觉系统的优选两个相机的单个固定滚动块来完成的。 第一台相机在卷轴前观察香烟,然后卷烟约180度,然后第二台相机查看以前隐藏的香烟部分。 基于所查看的香烟与预定的一组特征的比较,香烟被接受或拒绝。

    Method and an apparatus for inspecting the edge of a lid
    36.
    发明授权
    Method and an apparatus for inspecting the edge of a lid 失效
    用于检查盖边缘的方法和装置

    公开(公告)号:US5004347A

    公开(公告)日:1991-04-02

    申请号:US439591

    申请日:1989-11-20

    CPC classification number: G01N21/909 G01N2021/8887 G01N2201/102

    Abstract: The invention has for its purpose to provide a method and an apparatus for inspecting the bent edge of a disc-shaped object, e.g. the annular edge of a metal lid bounding a gutter for sealing compound. In order to realize such an inspection with great reliability according to the invention the resolution is made as great as possible by means of the following steps:(1) directing a light beam onto the edge zone of the object under an angle of incidents, such that the bent edge gives a shadow in said edge zone;(2) previously determining the shape of the reflection picture also determined by said shadow of said illuminated edge zone in case of an object satisfying a predetermined standard;(3) determining the reflection picture of the edge zone of an object to be inspected; and(4) comparing the results of steps (3) and (4) and generating a rejection signal in case of a detected deviation lying outside a previously chosen tolerance range.

    Time delay and integration of images using a frame transfer CCD sensor
    38.
    发明授权
    Time delay and integration of images using a frame transfer CCD sensor 失效
    使用帧传输CCD传感器进行时间延迟和图像集成

    公开(公告)号:US4922337A

    公开(公告)日:1990-05-01

    申请号:US249385

    申请日:1988-09-26

    Abstract: A tachometer (32) monitors the speed of a continuously moving web or article (12). A lens (20) focuses an image of a portion of the web in an examination region (14) on image section (22) of a CCD array. As the web moves, the image moves correspondingly along the image section. A synchronizing circuit (C) adjusts the frequency of the tachometer output signal and uses it in lieu of a fixed frequency oscillator as the master clocking or timing basis for generating clocking pulses for the CCD array. More specifically, the synchronizing circuit generates four phase clocking pulses (.phi.1A-.phi.4A) which shifts lines of CCD data along the image section at the same speed that the image is moving along the CCD section. In this manner, the pixel values integrate light from the same area of the imaged web at each shifted position along the image section. Each line of data from the image section may be shifted at the same rate through an optically light-insensitive storage section (24) and read out serially by shift registers (26) to form a video signal. A quality control analysis circuit (D) monitors the video signal for selected characteristics of the imaged web. Preferably, a record is maintained of the location of flaws and defects noted by the quality analysis circuit.

    Abstract translation: 转速计(32)监测连续移动的纸幅或物品(12)的速度。 透镜(20)将幅材的一部分的图像聚焦在CCD阵列的图像部分(22)上的检查区域(14)中。 当网移动时,图像沿图像部分相应地移动。 同步电路(C)调整转速计输出信号的频率,并将其代替固定频率振荡器作为用于产生CCD阵列的时钟脉冲的主时钟或定时基准。 更具体地,同步电路产生四个相位时钟脉冲(phi 1A-phi 4A),它们以与图像沿着CCD部分移动的相同速度沿着图像部分移动CCD数据的行。 以这种方式,像素值在沿着图像部分的每个移位位置处将来自成像幅材的相同区域的光整合。 来自图像部分的每行数据可以通过光学不敏感存储部分(24)以相同的速率移位,并由移位寄存器(26)串行读出以形成视频信号。 质量控制分析电路(D)监视图像信号以获得成像的网络的所选特征。 优选地,保持由质量分析电路注意到的缺陷和缺陷的位置的记录。

    Semiconductor device inspection system
    39.
    发明授权
    Semiconductor device inspection system 失效
    半导体器件检测系统

    公开(公告)号:US4872052A

    公开(公告)日:1989-10-03

    申请号:US128329

    申请日:1987-12-03

    Abstract: A semiconductor device inspection system capable of objectively accomplishing visual image inspection of a semiconductor device and minimizing error in the inspection, to thereby effectively carry out the inspection with high accuracy and at high speed. The system includes a low magnification image pickup mechanism which consists of a plurality of low magnification image pickup units each carrying out low magnification image pickup of a semiconductor device to generate an image signal. The system also includes a signal processing system for processing the image signal to judge the correctness of the semiconductor device. In the image pickup units, their light receptors are each arranged in parallel to an inspected surface of the semiconductor device and their central axes intersect together on the inspected surface. The system may also include a high magnification image pickup unit consisting of a high magnification image pickup mechanism and a light-permeable element retractably positioned between the unit and a semiconductor device to be inspected.

    Abstract translation: 一种半导体器件检查系统,其能够客观地实现半导体器件的视觉图像检查并使检查中的误差最小化,从而以高精度和高速度有效地进行检查。 该系统包括低倍率图像拾取机构,其由多个低倍率图像拾取单元组成,每个低倍率图像拾取单元执行半导体器件的低倍率图像拾取以产生图像信号。 该系统还包括用于处理图像信号以判断半导体器件的正确性的信号处理系统。 在图像拾取单元中,它们的光接收器各自平行于半导体器件的检查表面布置,并且其中心轴线在检查表面上相交。 该系统还可以包括高倍率图像拾取单元,其由高倍率图像拾取机构和可伸缩地定位在单元和要检查的半导体器件之间的透光元件组成。

    Flaw detector for detecting flaws in a sheet
    40.
    发明授权
    Flaw detector for detecting flaws in a sheet 失效
    用于检测片材中缺陷的探伤仪

    公开(公告)号:US4724481A

    公开(公告)日:1988-02-09

    申请号:US939542

    申请日:1986-12-08

    Inventor: Shizuo Nishioka

    Abstract: A flaw detector, for detecting a flaw in a sheet, picks up, by means of a plurality of linear array cameras, the light of rays transmitted through a sheet. The video signals from the linear array cameras, which are appropriately processed, are used for checking whether a flaw is present or not. A sensitivity-difference correcting section corrects sensitivity differences amoung the cameras and among photosensitive elements of each camera, which sensitivity differences are contained in the video signal. Automatic gain control sections, for transparent and opaque flaws, respectively, control the sensitivities of the video signals. These signals are differentiated, and then compared with a predetermined slicing level, thereby to check whether transparent and opaque flaws are present or not.

    Abstract translation: 用于检测片材中的缺陷的探伤器通过多个线性阵列相机拾取透过片材的光线。 来自线性阵列相机的视频信号被适当地处理,用于检查是否存在缺陷。 灵敏度差校正部分校正摄像机和每个摄像机的感光元件之间的灵敏度差异,这些灵敏度差异包含在视频信号中。 自动增益控制部分分别用于透明和不透明的缺陷,以控制视频信号的灵敏度。 这些信号被区分,然后与预定的切片电平进行比较,从而检查是否存在透明和不透明的缺陷。

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