Abstract:
An apparatus for detecting a change in a voltage level of a power supply is disclosed. An inverter coupled to a first power supply may generate a signal dependent upon a voltage level of a second power supply. A latch coupled to the first power supply may be set based on a first voltage level of the second power supply and a first value of the signal, and re-set based on a second voltage level of the second power supply and a second value of the signal different than the first value of the signal.
Abstract:
A method and apparatus for implementing mode based skew is disclosed. In one embodiment, an IC includes a number of different functional units each coupled to receive a respective one of a number of different clock signals. One or more of the functional circuit blocks includes at least two clock-gating circuits that are coupled to receive the clock signal provided to that functional circuit block. During a scan test, a first clock-gating circuit within a functional circuit block is configured to provide a first delay to the clock signal. A second clock-gating circuit within the functional circuit block may provide a second delay to the clock signal, the second delay being different from the first.
Abstract:
An apparatus and method for determining performance of system is disclosed. While operating in a test mode, a plurality of test results may be received and stored in a memory. Each test result may be indicative of a performance of the system when the system is operating under a respective test condition. Also, during the test mode, a respective value of an operating parameter of a predetermined system element at each test condition. An association between each test result and a corresponding detected respective value of the operating parameter may be provided. During a normal operating mode, an operating value of the operating parameter may be determined. A performance level of the system based on a test value retrieved from memory dependent upon the operating value and the association may then be determined.
Abstract:
Embodiments of a memory are disclosed that may reduce the likelihood of a miss-read while reading a weak data storage cell. The memory may include a number of data storage cells, a column multiplexer, a first sense amplifier and a second sense amplifier, and an output circuit. The gain level of the first sense amplifier may be higher than the gain level of the second sense amplifier. The output circuit may include a multiplexer and the multiplexer may be operable to controllably select one of the outputs of the first and second sense amplifiers and pass the value of the selected sense amplifier. The output circuit may include a node that couples the outputs of the first and second sense amplifiers and the outputs of the first and second sense amplifiers may be able to be set to a high impedance state.