Unitized structure for a microwave oven
    41.
    发明授权
    Unitized structure for a microwave oven 失效
    微波炉的组合结构

    公开(公告)号:US4282416A

    公开(公告)日:1981-08-04

    申请号:US935445

    申请日:1978-08-21

    Applicant: James A. White

    Inventor: James A. White

    CPC classification number: H05B6/6426

    Abstract: A composite structure for a microwave oven housing having a main frame defined by top, rear and bottom surfaces and being open along the front thereof is disclosed. A partition wall is disposed in the main frame intermediate the side edges thereof for providing and separating a cooking chamber and a control compartment. A rectangular door frame is connected to front edge portions of the top and bottom surfaces of the main frame in front of the chamber for connecting an oven door thereto, the door frame defining an opening for access to the chamber. An additional feature includes a mode stirrer housing and a waveguide mounted on the top surface of the main frame above the chamber and compartment with the top surface defining openings which communicate between the compartment and waveguide and between the mode stirrer housing and chamber for transmitting a microwave signal generated in the compartment through the waveguide to the housing, and from the housing into the chamber.

    Abstract translation: 公开了一种用于微波炉壳体的复合结构,其具有由顶部,后部和底部表面限定并且沿其前部开口的主框架。 分隔壁设置在主框架的侧边缘的中间,用于提供和分离烹饪室和控制室。 一个矩形的门框连接到主框架顶面和底面的前边缘部分,用于连接一个烤炉门,其门框限定一个用于进入腔室的开口。 一个附加的特征包括一个模式搅拌器壳体和一个安装在主体框架顶部表面上的腔室和隔室,其上表面限定了在隔室和波导之间以及模式搅拌器壳体和室之间连通的开口,用于传送微波 在隔室中通过波导产生的信号到壳体,以及从壳体进入腔室。

    Apparatus for measuring light intensities
    42.
    发明授权
    Apparatus for measuring light intensities 失效
    用于测量光强度的装置

    公开(公告)号:US4171909A

    公开(公告)日:1979-10-23

    申请号:US781180

    申请日:1977-03-25

    CPC classification number: G01N21/255

    Abstract: Apparatus for measuring reflected or transmitted light is described. The apparatus comprises filter type spectrophotometer having a wavelength range of from about 200 nm (nanometers) to about 1,100 nm which includes a sample illuminating light source capable of producing an extremely intense light of short duration; light diffusing means; a light filter for transmission of a selected wave-length; at least two independent light sensing means; and separate means defining light transmission paths for the passage of light from the light source to one light sensing means and from the illuminated sample to the other light sensing means.In a preferred embodiment the apparatus includes a light diffusing integrating sphere. In another embodiment, a replaceable or repositionable module can be used to convert the apparatus from reflectance to transmittance spectrophotomer.

    Abstract translation: 描述用于测量反射或透射光的装置。 该装置包括波长范围为约200nm(纳米)至约1,100nm的滤光型分光光度计,其包括能够产生极短时间的强烈光的样品照明光源; 光漫射装置; 用于传输选定波长的光滤波器; 至少两个独立的光感测装置; 以及单独的装置,其限定用于使光从光源通过到一个光感测装置并且从被照射的样品到另一个感光装置的光传输路径。

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