Chemical mechanical polishing apparatus

    公开(公告)号:US10784113B2

    公开(公告)日:2020-09-22

    申请号:US15773904

    申请日:2016-08-08

    Inventor: Kyunam Park

    Abstract: Provided are a chemical mechanical polishing apparatus and a control method thereof. The chemical mechanical polishing apparatus includes a plurality of polishing platens provided with a polishing pad on an upper surface thereof, and a polishing platen transferring unit for transferring the plurality of polishing platens to different process positions according to a predetermined process sequence. Here, different processes are performed at different process positions.

    APPARATUS FOR PROCESSING SUBSTRATE
    66.
    发明申请

    公开(公告)号:US20200294832A1

    公开(公告)日:2020-09-17

    申请号:US16748834

    申请日:2020-01-22

    Inventor: DONG MIN KIM

    Abstract: The present disclosure relates to a substrate processing apparatus, and more specifically, to a substrate processing apparatus capable of blocking the introduction of external air and external particles into a chamber by forming an air curtain at a loading/unloading part when the chamber is open.The substrate processing apparatus of the present disclosure includes a chamber in which a space is formed, and a fluid injection part configured to inject a fluid from an outer side of a substrate loading/unloading part of the chamber through which a substrate is loaded and unloaded.

    OPENING AND SHUTTING DEVICE AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME

    公开(公告)号:US20200243306A1

    公开(公告)日:2020-07-30

    申请号:US16750317

    申请日:2020-01-23

    Inventor: Yong Ki HAN

    Abstract: Disclosed are an opening and shutting device and a substrate processing apparatus including the same. A device for opening and closing an entrance through which a substrate is carried into and out of a processing chamber includes an opening and shutting part that is disposed between the entrance and the processing chamber and that opens and closes the entrance while rotating so as to be brought into close contact with the entrance.

    SUBSTRATE POLISHING APPARATUS
    70.
    发明公开

    公开(公告)号:US20240286243A1

    公开(公告)日:2024-08-29

    申请号:US18453322

    申请日:2023-08-22

    CPC classification number: B24B37/015

    Abstract: Provided is a substrate polishing apparatus. The substrate polishing apparatus includes a carrier configured to grip a substrate, a polishing pad configured to polish a surface to be polished of the substrate gripped by the carrier while rotating, and a temperature control assembly configured to control a temperature of the polishing pad, and the temperature control assembly includes Deionized water (DIW) spraying module configured to spray DIW toward the polishing pad and a guide vane configured to guide at least a portion of the DIW sprayed from the DIW spraying module to an outside of the polishing pad.

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