公开(公告)号：US10088688B1

公开(公告)日：2018-10-02

申请号：US15430693

申请日：2017-02-13

Applicant: Wavefront Research, Inc.

Inventor： Thomas A. Mitchell

IPC: G02B27/14 ,  G02B27/10 ,  H04N5/30 ,  G02B27/30 ,  G01J3/28

Abstract: An optical imager design that is capable of imaging a common scene to two or more optical systems, and is more compact in physical size and superior in throughput than previous designs is disclosed.

公开(公告)号：US20040156048A1

公开(公告)日：2004-08-12

申请号：US10750014

申请日：2003-12-31

Applicant: Wavefront Research, Inc.

Inventor： Thomas A. Mitchell

IPC: G01J003/40 ,  G02B027/10

CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/0291 ,  G01J3/2823

Abstract: A hyperspectral imager including a first optical sub-system, at least one slit element, a second optical sub-system, at least one reflective dispersive element located at a center plane, and at least one detecting element located at substantially an image surface. During operation, the first optical sub-system images, onto the slit element(s), electromagnetic radiation originating at a source. The second optical sub-system substantially collimates, at a center plane, electromagnetic radiation emanating from the slit element(s). The second optical sub-system also images, onto the image surface, the electromagnetic radiation reflected from the reflective dispersive element(s). The detecting element(s) detect the dispersed electromagnetic radiation reflected from the reflective dispersive element(s).

Abstract translation: 包括第一光学子系统，至少一个狭缝元件，第二光学子系统，位于中心平面的至少一个反射色散元件和位于大致图像表面的至少一个检测元件的高光谱成像器。 在操作期间，第一光学子系统在狭缝元件上成像来自源的电磁辐射。 第二光学子系统在中心平面处基本上准直从狭缝元件发出的电磁辐射。 第二光学子系统还将从反射色散元件反射的电磁辐射图像到图像表面上。 检测元件检测从反射色散元件反射的分散的电磁辐射。