公开(公告)号：US06290481B1

公开(公告)日：2001-09-18

申请号：US09574878

申请日：2000-05-19

Applicant: Chien-Ping Huang

Inventor： Chien-Ping Huang

IPC: B29C4514

CPC classification number: B29C45/2701 ,  H01L21/565 ,  H01L2924/0002 ,  H01L2924/00

Abstract: A flash-free mold structure is designed for use in the molding of an encapsulant for encapsulating a semiconductor die. The flash-free mold structure includes a first molding piece and a second molding piece. The second molding piece is formed with a resin passage for an encapsulating material to flow therethrough during molding process. It is a characteristic feature of this flash-free mold structure that a cutaway portion, which can be either an one-step cutaway portion or a multi-step cutaway portion, is formed at the rim of the resin passage. The cutaway portion is dimensioned significantly smaller than the resin passage for the retarding the flow speed of the encapsulating material from the resin passage into the cutaway portion during the molding process, thereby preventing the encapsulating material from entering the fissure in the junction between the first and second molding pieces. The resin passage can be either a cull, a runner, or a subrunner defined by the first and second molding pieces. With this flash-free mold structure, the IC packaging quality can be assured and fabrication tools can be prevented from contamination.

Abstract translation: 无闪光模具结构被设计用于模制用于封装半导体管芯的密封剂。 无闪光模具结构包括第一成型件和第二成型件。 第二成型件在模制过程中由用于密封材料的树脂通道形成为流过其中。 这种无闪光模具结构的特征在于，在树脂通道的边缘处形成有可以是一步切口部分或多段切口部分的切口部分。 切割部分的尺寸明显小于树脂通道，用于在模制过程中阻止封装材料从树脂通道进入切除部分的流动速度，从而防止封装材料在第一和第二部分之间的接合处进入裂缝 第二个成型件。 树脂通道可以是由第一和第二成型件限定的剔除，流道或辅助材料。 利用这种无闪光模具结构，可以确保IC封装质量，并可防止制造工具的污染。

公开(公告)号：US08963298B2

公开(公告)日：2015-02-24

申请号：US12769053

申请日：2010-04-28

Applicant: Chin-Tsai Yao ,  Chien-Ping Huang ,  Chun-Chi Ke

Inventor： Chin-Tsai Yao ,  Chien-Ping Huang ,  Chun-Chi Ke

IPC: H01L23/552 ,  H01L23/00

CPC classification number: H01L23/552 ,  H01L21/561 ,  H01L21/78 ,  H01L24/48 ,  H01L24/49 ,  H01L24/81 ,  H01L24/85 ,  H01L24/96 ,  H01L24/97 ,  H01L2224/48091 ,  H01L2224/48106 ,  H01L2224/48227 ,  H01L2224/48247 ,  H01L2224/49175 ,  H01L2224/85 ,  H01L2224/97 ,  H01L2924/00014 ,  H01L2924/01006 ,  H01L2924/01029 ,  H01L2924/0105 ,  H01L2924/01079 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2924/3025 ,  H01L2224/81 ,  H01L2924/00 ,  H01L2224/45099 ,  H01L2224/05599 ,  H01L2924/00012

Abstract: An EMI shielding package structure includes a substrate unit having a first surface with a die mounting area and a second surfaces opposite to the first surface, metallic pillars formed on the first surface, a chip mounted on and electrically connected to the die-mounting area, an encapsulant covering the chip and the first surface while exposing a portion of each of the metallic pillars from the encapsulant, and a shielding film enclosing the encapsulant and electrically connecting to the metallic pillars. A fabrication method of the above structure by two cutting processes is further provided. The first cutting process forms grooves by cutting the encapsulant. After a shielding film is formed in the grooves and electrically connected to the metallic pillars, the complete package structure is formed by the second cutting process, thereby simplifying the fabrication process while overcoming inferior grounding of the shielding film as encountered in prior techniques.

Abstract translation: EMI屏蔽封装结构包括具有第一表面和芯片安装区域的基板单元和与第一表面相对的第二表面，形成在第一表面上的金属柱，安装在芯片安装区域上并与之电连接的芯片， 在将所述金属柱的一部分从所述密封剂暴露出来的同时覆盖所述芯片和所述第一表面的密封剂以及封装所述密封剂并电连接到所述金属柱的屏蔽膜。 进一步提供通过两个切割工艺的上述结构的制造方法。 第一切割工艺通过切割密封剂形成凹槽。 在凹槽中形成屏蔽膜并与金属柱电连接之后，通过第二切割工艺形成完整的封装结构，从而在克服现有技术中遇到的屏蔽膜的不良接地的同时简化制造工艺。

公开(公告)号：US08653661B2

公开(公告)日：2014-02-18

申请号：US13170424

申请日：2011-06-28

Applicant: Chang-Yueh Chan ,  Chien-Ping Huang ,  Chun-Chi Ke ,  Shih-Kuang Chiu

Inventor： Chang-Yueh Chan ,  Chien-Ping Huang ,  Chun-Chi Ke ,  Shih-Kuang Chiu

IPC: H01L21/56

CPC classification number: B81C1/00301 ,  B81B2207/096 ,  H01L2224/16225 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2224/48465 ,  H01L2924/1461 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2924/00014 ,  H01L2924/00 ,  H01L2924/00012

Abstract: A package structure having an MEMS element is provided, which includes: a protection layer having openings formed therein; conductors formed in the openings, respectively; conductive pads formed on the protection layer and the conductors; a MEMS chip disposed on the conductive pads; and an encapsulant formed on the protection layer for encapsulating the MEMS chip. By disposing the MEMS chip directly on the protection layer to dispense with the need for a carrier, such as a wafer or a circuit board that would undesirably add to the thickness, the present invention reduces the overall thickness of the package to thereby achieve miniaturization.

Abstract translation: 提供了具有MEMS元件的封装结构，其包括：形成有开口的保护层; 导体分别形成在开口中; 形成在保护层和导体上的导电焊盘; 设置在导电焊盘上的MEMS芯片; 以及形成在用于封装MEMS芯片的保护层上的密封剂。 通过将MEMS芯片直接设置在保护层上，以免对不希望地增加厚度的载体（例如晶片或电路板）的需要，本发明减小了封装的整体厚度从而实现小型化。

公开(公告)号：US08546183B2

公开(公告)日：2013-10-01

申请号：US12241847

申请日：2008-09-30

Applicant: Chien-Ping Huang ,  Chih-Ming Huang

Inventor： Chien-Ping Huang ,  Chih-Ming Huang

IPC: H01L21/02

CPC classification number: H01L23/3677 ,  H01L21/4871 ,  H01L21/561 ,  H01L23/3107 ,  H01L23/3128 ,  H01L23/367 ,  H01L23/3733 ,  H01L23/4334 ,  H01L23/49548 ,  H01L23/49816 ,  H01L24/48 ,  H01L24/73 ,  H01L24/97 ,  H01L2224/16225 ,  H01L2224/16245 ,  H01L2224/32225 ,  H01L2224/32245 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2224/4824 ,  H01L2224/48247 ,  H01L2224/73215 ,  H01L2224/73253 ,  H01L2224/73265 ,  H01L2224/97 ,  H01L2924/00014 ,  H01L2924/01013 ,  H01L2924/01019 ,  H01L2924/01024 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01047 ,  H01L2924/01074 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/15311 ,  H01L2924/351 ,  Y10T29/49126 ,  H01L2224/85 ,  H01L2224/81 ,  H01L2224/83 ,  H01L2924/00 ,  H01L2924/00012 ,  H01L2224/45099 ,  H01L2224/45015 ,  H01L2924/207

Abstract: A heat dissipating semiconductor package and a fabrication method thereof are provided. A semiconductor chip is mounted on a chip carrier. A heat sink is mounted on the chip, and includes an insulating core layer, a thin metallic layer formed on each of an upper surface and a lower surface of the insulating core layer and a thermal via hole formed in the insulating core layer. A molding process is performed to encapsulate the chip and the heat sink with an encapsulant to form a package unit. A singulation process is performed to peripherally cut the package unit. A part of the encapsulant above the thin metallic layer on the upper surface of the heat sink is removed, such that the thin metallic layer on the upper surface of the heat sink is exposed, and heat generated by the chip can be dissipated through the heat sink.

Abstract translation: 提供散热半导体封装及其制造方法。 半导体芯片安装在芯片载体上。 散热器安装在芯片上，并且包括绝缘芯层，形成在绝缘芯层的上表面和下表面中的每一个上的薄金属层和形成在绝缘芯层中的热通孔。 进行成型工艺以用密封剂封装芯片和散热器以形成封装单元。 执行单个处理以周边地切割包装单元。 在散热器的上表面上的薄金属层上方的一部分密封剂被去除，使得散热器上表面上的薄金属层被暴露，并且由芯片产生的热量可以通过热量散发 水槽。

公开(公告)号：US08421199B2

公开(公告)日：2013-04-16

申请号：US12770028

申请日：2010-04-29

Applicant: Pang-Chun Lin ,  Chun-Yuan Li ,  Chien-Ping Huang ,  Chun-Chi Ke

Inventor： Pang-Chun Lin ,  Chun-Yuan Li ,  Chien-Ping Huang ,  Chun-Chi Ke

IPC: H01L23/495 ,  H01L23/48

CPC classification number: H01L23/495 ,  H01L21/4832 ,  H01L23/3107 ,  H01L23/4951 ,  H01L24/48 ,  H01L24/49 ,  H01L2224/48091 ,  H01L2224/48247 ,  H01L2224/49171 ,  H01L2924/00014 ,  H01L2924/01046 ,  H01L2924/01079 ,  H01L2924/181 ,  Y10T29/49117 ,  Y10T29/49171 ,  Y10T29/49172 ,  H01L2924/00 ,  H01L2924/00012 ,  H01L2224/45099 ,  H01L2224/45015 ,  H01L2924/207

Abstract: A semiconductor package structure includes: a dielectric layer; a metal layer disposed on the dielectric layer and having a die pad and traces, the traces each including a trace body, a bond pad extending to the periphery of the die pad, and an opposite trace end; metal pillars penetrating the dielectric layer with one ends thereof connecting to the die pad and the trace ends while the other ends thereof protruding from the dielectric layer; a semiconductor chip mounted on the die pad and electrically connected to the bond pads through bonding wires; and an encapsulant covering the semiconductor chip, the bonding wires, the metal layer, and the dielectric layer. The invention is characterized by disposing traces with bond pads close to the die pad to shorten bonding wires and forming metal pillars protruding from the dielectric layer to avoid solder bridging encountered in prior techniques.

公开(公告)号：US20130063059A1

公开(公告)日：2013-03-14

申请号：US13589936

申请日：2012-08-20

Applicant: Chien-Yu Chi ,  Chien-Ping Huang

Inventor： Chien-Yu Chi ,  Chien-Ping Huang

IPC: H02P6/14

CPC classification number: H02P27/08 ,  H02M2001/385

Abstract: Proposed is a driver having dead-time compensation function. The driver having dead-time compensation function generates an output voltage according to a voltage command and a frequency command. The driver includes an inverter, an output current detector and a control unit. The inverter receives a DC voltage and operates with a pulse width modulation mode so that the driver outputs the output voltage and an output current. The output current detector detects the current value of the output current to generate a output current detecting signal. The control unit outputs a switching control signal to inverter according to the voltage command and the frequency command. The control unit corrects a reference command according to dead-time and the output current detecting signal related to the output current so that amplitude and waveform smoothness of the output voltage and the output current are compensated.

Abstract translation: 建议是具有死区补偿功能的驾驶员。 具有死区补偿功能的驱动器根据电压指令和频率指令产生输出电压。 驱动器包括逆变器，输出电流检测器和控制单元。 逆变器接收直流电压并以脉冲宽度调制模式工作，以便驱动器输出输出电压和输出电流。 输出电流检测器检测输出电流的当前值以产生输出电流检测信号。 控制单元根据电压指令和频率指令向逆变器输出切换控制信号。 控制单元根据死区时间和与输出电流相关的输出电流检测信号来校正参考命令，从而补偿输出电压和输出电流的振幅和波形平滑度。

公开(公告)号：US08390118B2

公开(公告)日：2013-03-05

申请号：US12859635

申请日：2010-08-19

Applicant: Pang-Chun Lin ,  Chun-Yuan Li ,  Fu-Di Tang ,  Chien-Ping Huang ,  Chun-Chi Ke

Inventor： Pang-Chun Lin ,  Chun-Yuan Li ,  Fu-Di Tang ,  Chien-Ping Huang ,  Chun-Chi Ke

IPC: H01L23/48 ,  H01L23/52

CPC classification number: H01L21/568 ,  H01L21/78 ,  H01L23/3128 ,  H01L24/45 ,  H01L24/48 ,  H01L24/85 ,  H01L2224/16 ,  H01L2224/45144 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2224/48247 ,  H01L2224/484 ,  H01L2224/48599 ,  H01L2224/48644 ,  H01L2224/48655 ,  H01L2224/48664 ,  H01L2224/85001 ,  H01L2224/85444 ,  H01L2224/85455 ,  H01L2224/85464 ,  H01L2924/00014 ,  H01L2924/01028 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01046 ,  H01L2924/0105 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/014 ,  H01L2924/15151 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2224/78 ,  H01L2924/00 ,  H01L2224/05599 ,  H01L2924/00012

Abstract: A semiconductor package having electrical connecting structures includes: a conductive layer having a die pad and traces surrounding the die pad; a chip; bonding wires; an encapsulant with a plurality of cavities having a depth greater than the thickness of the die pad and traces for embedding the die pad and the traces therein, and the cavities exposing the die pad and the traces; a solder mask layer formed in the cavities and having a plurality of openings for exposing the trace ends and a portion of the die pad; and solder balls formed in the openings and electrically connected to the trace ends. Engaging the solder mask layer with the encapsulant enhances adhesion strength of the solder mask layer so as to prolong the moisture permeation path and enhance package reliability.

Abstract translation: 具有电连接结构的半导体封装包括：具有管芯焊盘和围绕管芯焊盘的迹线的导电层; 一个芯片 接合线; 具有多个空腔的密封剂，其深度大于管芯焊盘的厚度，以及用于将管芯焊盘和其中的迹线嵌入其中的迹线，以及使裸片焊盘和迹线露出的空腔; 形成在所述空腔中的焊料掩模层，并且具有用于暴露所述迹线端部和所述管芯焊盘的一部分的多个开口; 以及形成在开口中并电连接到迹线端的焊球。 将焊料掩模层与密封剂接合，增强了焊料掩模层的粘合强度，从而延长了水分渗透路径并提高了封装的可靠性。

公开(公告)号：US20120241937A1

公开(公告)日：2012-09-27

申请号：US13492220

申请日：2012-06-08

Applicant: Chang-Yueh Chan ,  Chien-Ping Huang ,  Chun-Chi Ke ,  Chun-An Huang ,  Chih-Ming Huang

Inventor： Chang-Yueh Chan ,  Chien-Ping Huang ,  Chun-Chi Ke ,  Chun-An Huang ,  Chih-Ming Huang

IPC: H01L23/498

CPC classification number: H01L21/02 ,  B81B7/007 ,  B81B2207/07 ,  H01L23/52 ,  H01L29/84 ,  H01L2224/02166 ,  H01L2224/48091 ,  H01L2224/48465 ,  H01L2924/1461 ,  H01L2924/00014 ,  H01L2924/00

Abstract: Proposed is a package structure having a micro-electromechanical (MEMS) element, including a chip having a plurality of electrical connecting pads and a MEMS element formed thereon; a lid disposed on the chip for covering the MEMS element; a stud bump disposed on each of the electrical connecting pads; an encapsulant formed on the chip with part of the stud bumps being exposed from the encapsulant; and a metal conductive layer formed on the encapsulant and connected to the stud bumps. The invention is characterized by completing the packaging process on the wafer directly to enable thinner and cheaper package structures to be fabricated within less time. This invention further provides a method for fabricating the package structure as described above.

Abstract translation: 提出具有微机电（MEMS）元件的封装结构，其包括具有多个电连接焊盘和形成在其上的MEMS元件的芯片; 设置在所述芯片上用于覆盖所述MEMS元件的盖; 设置在每个电连接焊盘上的螺柱凸块; 形成在芯片上的密封剂，其中一部分柱状凸块从密封剂暴露出来; 以及金属导电层，形成在密封剂上并连接到凸块上。 本发明的特征在于直接完成晶片上的封装工艺，以便在更短的时间内制造更薄和更便宜的封装结构。 本发明还提供如上所述的用于制造封装结构的方法。

公开(公告)号：US08253248B2

公开(公告)日：2012-08-28

申请号：US12956393

申请日：2010-11-30

Applicant: Chun-Chi Ke ,  Chien-Ping Huang

Inventor： Chun-Chi Ke ,  Chien-Ping Huang

IPC: H01L23/48 ,  H01L23/52 ,  H01L29/40

CPC classification number: H01L24/13 ,  H01L24/11 ,  H01L2224/0231 ,  H01L2224/0401 ,  H01L2224/05124 ,  H01L2224/05147 ,  H01L2224/05155 ,  H01L2224/05166 ,  H01L2224/05572 ,  H01L2224/05624 ,  H01L2224/05647 ,  H01L2224/05655 ,  H01L2224/05666 ,  H01L2224/13022 ,  H01L2224/1308 ,  H01L2224/13082 ,  H01L2224/131 ,  H01L2224/13147 ,  H01L2224/1357 ,  H01L2224/136 ,  H01L2924/00013 ,  H01L2924/01006 ,  H01L2924/01013 ,  H01L2924/01022 ,  H01L2924/01023 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01078 ,  H01L2924/014 ,  H01L2924/351 ,  H01L2924/00014 ,  H01L2224/13099 ,  H01L2924/00 ,  H01L2924/013

Abstract: A semiconductor device having conductive bumps and a fabrication method thereof is proposed. The fabrication method includes the steps of forming a first metallic layer on a substrate having solder pads and a passivation layer formed thereon, and electrically connecting it to the solder pads; applying a second covering layer over exposed parts of the first metallic layer; subsequently, forming a second metallic layer on the second covering layer, and electrically connecting it to the exposed parts of the first metallic layer; applying a third covering layer, and forming openings for exposing parts of the second metallic layer to form thereon a conductive bump having a metallic standoff and a solder material. The covering layers and the metallic layers can provide a buffering effect for effectively absorbing the thermal stress imposed on the conductive bumps to prevent delamination caused by the UBM layers.

Abstract translation: 提出了具有导电凸块的半导体器件及其制造方法。 该制造方法包括以下步骤：在具有焊盘和形成在其上的钝化层的基板上形成第一金属层，并将其电连接到焊盘; 在第一金属层的暴露部分上施加第二覆盖层; 随后在第二覆盖层上形成第二金属层，并将其电连接到第一金属层的暴露部分; 施加第三覆盖层，以及形成用于暴露第二金属层的部分的开口以在其上形成具有金属支座和焊料材料的导电凸块。 覆盖层和金属层可以提供缓冲效果，用于有效地吸收施加在导电凸块上的热应力，以防止由UBM层引起的分层。

公开(公告)号：US20120038044A1

公开(公告)日：2012-02-16

申请号：US12959148

申请日：2010-12-02

Applicant: Chiang-Cheng Chang ,  Chien-Ping Huang ,  Chun-Chi Ke ,  Hsin-Yi Liao ,  Hsi-Chang Hsu

Inventor： Chiang-Cheng Chang ,  Chien-Ping Huang ,  Chun-Chi Ke ,  Hsin-Yi Liao ,  Hsi-Chang Hsu

IPC: H01L23/488 ,  H01L21/44

CPC classification number: H01L24/82 ,  H01L23/3128 ,  H01L24/19 ,  H01L24/20 ,  H01L24/24 ,  H01L24/25 ,  H01L24/32 ,  H01L24/73 ,  H01L25/105 ,  H01L2224/12105 ,  H01L2224/24225 ,  H01L2224/25171 ,  H01L2224/32155 ,  H01L2224/32225 ,  H01L2224/73267 ,  H01L2224/92244 ,  H01L2225/1035 ,  H01L2225/1041 ,  H01L2225/1058 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01082 ,  H01L2924/014 ,  H01L2924/15311 ,  H01L2924/3511

Abstract: A CSP includes: a hard board having a first wiring layer with conductive pads; a plurality of conductive elements disposed on at least a portion of the conductive pads; an electronic component having opposite active and inactive surfaces and being mounted on the hard board via the inactive surface; an encapsulating layer disposed on the hard board for encapsulating the conductive elements and electronic component, the active surface of the electronic component and the surfaces of the conductive elements being exposed through the encapsulating layer; a first dielectric layer and a third wiring layer disposed on the encapsulating layer, the third wiring layer being electrically connected to the conductive elements and the electronic component and further electrically connected to the first wiring layer through the conductive elements, thereby obtaining a stacked connection structure without the need of PTHs and using the hard board as a main structure to avoid warpage.

Abstract translation: CSP包括：具有带导电焊盘的第一布线层的硬板; 布置在所述导电垫的至少一部分上的多个导电元件; 电子元件具有相反的有源和无效表面，并且经由非活性表面安装在硬板上; 设置在所述硬板上用于封装所述导电元件和电子部件的封装层，所述电子部件的所述有源表面和所述导电元件的表面通过所述封装层露出; 设置在所述封装层上的第一电介质层和第三布线层，所述第三布线层电连接到所述导电元件和所述电子部件，并且还通过所述导电元件与所述第一布线层电连接，从而获得堆叠连接结构 不需要PTH和使用硬板作为主要结构，以避免翘曲。