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公开(公告)号：US20220300366A1
公开(公告)日：2022-09-22
申请号：US17205545
申请日：2021-03-18
Applicant: Micron Technology, Inc.
Inventor： Scott Anthony Stoller , Pitamber Shukla , Anita Marguerite Ekren
Abstract: A log of error events associated with a memory device is maintained. Each error event included in the log is associated with one of multiple physical locations within the memory device. A physical location within the memory device is identified for background scanning based on the log of error events. A background scan is performed on the physical location identified based on the log of error events.
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