公开(公告)号：US06545756B1

公开(公告)日：2003-04-08

申请号：US09787634

申请日：2001-03-20

Applicant: Alexandr Akhatovich Ganeev ,  Sergei Evgenievich Sholupov

Inventor： Alexandr Akhatovich Ganeev ,  Sergei Evgenievich Sholupov

IPC: G01J330

CPC classification number: G01N21/714

Abstract: The present invention pertains to the construction of analytic instruments and can be used for analyzing natural and industrial water, biological samples, geological samples and air. The purpose of this invention is to reduce substantially the power used by the atomizer and the analyzer, and to increase the number of objects that can be analyzed. To this end, the method for the thermionic atomization of a sample involves carrying out an ionic sputtering of the sample from the cathode in a low-pressure discharge. The cathode is heated by the discharge to a temperature of between 800 and 1400° C., while the ballast gas consists of Kr or Xe under a gas pressure of 10 to 15 torrs. The thermionic atomization device includes an atomizer arranged in a gas-discharge chamber filled with an inert gas. The atomizer is made in the form of a hollow, cylindrical, metallic and thin-wall cathode. In order to reach this goal, the method involves using a thermionic atomization device which, in an efficient embodiment, consists of the above-mentioned gas-discharge atomizer, i.e. a hollow, metallic and thin-wall cathode. This mechanism enables the sputtering and atomization of the sample in a short time (0.2 to 1 sec.), thus lowering the detection limits while eliminating matrix effects.

Abstract translation: 本发明涉及分析仪器的构建，可用于分析天然和工业用水，生物样品，地质样品和空气。 本发明的目的是基本上减少由雾化器和分析器使用的功率，并且增加可分析的物体的数量。 为此，样品的热离子雾化方法包括在低压放电中进行来自阴极的样品的离子溅射。 阴极通过放电加热至800至1400℃的温度，而压载气体在10至15托的气体压力下由Kr或Xe组成。 热离子雾化装置包括布置在填充有惰性气体的气体放电室中的雾化器。 雾化器以中空的圆柱形金属和薄壁阴极的形式制成。 为了达到这个目标，该方法涉及使用热离子雾化装置，其在有效的实施例中由上述气体放电雾化器，即中空的金属和薄壁阴极组成。 该机制能够在短时间（0.2〜1秒）内对样品进行溅射和雾化，从而降低检测限，同时消除基体效应。

公开(公告)号：US06449039B1

公开(公告)日：2002-09-10

申请号：US09362840

申请日：1999-07-28

Applicant: Ahmed Bouzid

Inventor： Ahmed Bouzid

IPC: G01J330

CPC classification number: G02B21/06 ,  G02B21/002

Abstract: In laser scanning microscope systems using short pulsed laser sources incorporating an acousto-optical deflector, compensation is provided for spatial dispersion introduced by the deflector. Spatial dispersion of short pulses, such as those provided by a laser utilized in two photon fluorescence microscopy, occurs due to the higher and lower wavelength components in the pulsed laser beam as the beam is passed through an acousto-optical deflector or other similar diffractive element. A dispersive prism is mounted adjacent to the exit face of the acousto-optical deflector to spatially recombine the components of the pulse. A mirror may be mounted adjacent to the input face of the acousto-optical deflector and adjusted to adjust the angle of incidence of the beam on the input face of the deflector to match the Bragg condition at the center wavelength and so that both sides of the spectrum of the pulses are somewhat Bragg-mismatched and attenuated.

公开(公告)号：US06411379B1

公开(公告)日：2002-06-25

申请号：US09404989

申请日：1999-09-22

Applicant: Anwar von Sroka ,  Hartmut Oelmann ,  Hubertus Brüning

Inventor： Anwar von Sroka ,  Hartmut Oelmann ,  Hubertus Brüning

IPC: G01J330

CPC classification number: B22D11/16

Abstract: In order to localize element concentrations in the edge areas of a horizontally manufactured continuous casting of alloyed non-ferrous metals, a longitudinal section is removed from the continuous casting. At least one strip of surface layer is then removed transversely by a metal removal unit from the longitudinal section forming a test specimen having a defined thickness. A point-by-point spectroanalysis of the metal composition is then carried out in linear sequence with the aid of a spectral-analysis head in the longitudinal direction of the strip. The element concentration determined in this manner is displayed numerically and/or graphically with the aid of a computer. The metal-removal unit and the spectral-analysis head are placed under the influence of a metal-removal and analysis control unit which is coupled to the computer via a programmable controller and via a spectrometer, respectively.

Abstract translation: 为了在水平制造的合金有色金属连续铸造的边缘区域中定位元素浓度，从连续铸造中去除纵向截面。 然后通过金属去除单元从形成具有限定厚度的试样的纵向截面横向去除至少一个表面层。 然后借助于条带纵向上的光谱分析头，以线性顺序进行金属组成的逐点光谱分析。 以这种方式确定的元素浓度用计算机的数字和/或图形显示。 金属去除单元和光谱分析头被放置在金属去除和分析控制单元的影响下，金属去除和分析控制单元分别经由可编程控制器和分光计耦合到计算机。