公开(公告)号：US20140124652A1

公开(公告)日：2014-05-08

申请号：US14066771

申请日：2013-10-30

Applicant: The University Court of the University of Edinburgh ,  STMicroelectronics (Research & Development) Limited

Inventor： Neale Dutton ,  Robert K. Henderson

IPC: H01L31/107 ,  H01L27/146

CPC classification number: H01L31/107 ,  G01J2001/442 ,  G01S7/4863 ,  G01S7/4865 ,  G01S17/10 ,  G01S17/89 ,  H01L27/14601 ,  H04N5/37452

Abstract: A pixel circuit includes a single photon avalanche diode (SPAD) and a measurement circuit including a capacitance. The SPAD detects an incident photon and the measurement circuit discharges the capacitance at a known rate during a discharge time period. The length of the discharge time period is determined by the time of detection of the photon, such that the final amount of charge on the capacitance corresponds to the time of flight of the photon. The pixel circuit may be included in a time resolved imaging apparatus. A method of measuring the time of flight of a photon includes responding to an incident photon detection by discharging a capacitance at a known rate and correlating final capacitance charge to time of flight.

Abstract translation: 像素电路包括单光子雪崩二极管（SPAD）和包括电容的测量电路。 SPAD检测入射光子，并且测量电路在放电时间段内以已知的速率放电电容。 放电时间的长度由光子的检测时间确定，使得电容上的最终电荷量对应于光子的飞行时间。 像素电路可以包括在时间分辨成像装置中。 测量光子飞行时间的方法包括通过以已知速率放电电容来响应入射光子检测，并将最终电容电荷与飞行时间相关联。