公开(公告)号：US12118809B1

公开(公告)日：2024-10-15

申请号：US18712731

申请日：2022-02-15

Applicant: Mitsubishi Electric Corporation

Inventor： Daiki Ata ,  Daisuke Ammi ,  Satoshi Namematsu

IPC: G06V30/19 ,  G06V30/14 ,  G06V30/30

CPC classification number: G06V30/19147 ,  G06V30/14 ,  G06V30/1916 ,  G06V30/30 ,  G06V2201/06

Abstract: A training data acquirer acquires training data including article image data, image-filter-related data indicating a combination of a plurality of image filters used for image processing of the article image data and a value of a parameter for each of the plurality of image filters, and optical character recognition (OCR) score data indicating a score of character recognition output through OCR when image processing is performed on the article image data using the image filters based on the image-filter-related data. A trained model generator generates a trained model indicating a relationship between the article image data, the image-filter-related data, and the OCR score data through machine learning using the training data.

公开(公告)号：US20240337604A1

公开(公告)日：2024-10-10

申请号：US18745134

申请日：2024-06-17

Applicant: Panasonic Intellectual Property Management Co., Ltd.

Inventor： Toru SAKAI ,  Masashi YOSHIDA ,  Michio SAKURAI ,  Daichi HIGASHI

IPC: G01N21/88 ,  B23K31/12 ,  B23K37/02 ,  G01N33/207 ,  G06T1/00 ,  G06T7/00 ,  G06T7/50 ,  G06V10/20 ,  G06V10/764

CPC classification number: G01N21/8851 ,  B23K31/125 ,  B23K37/0229 ,  G01N33/207 ,  G06T1/0014 ,  G06T7/0006 ,  G06T7/50 ,  G06V10/255 ,  G06V10/764 ,  G01N2021/8887 ,  G06T2207/20081 ,  G06T2207/30136 ,  G06T2207/30164 ,  G06V2201/06

Abstract: An appearance inspection apparatus includes a shape measurement unit configured to measure the three-dimensional shape of a weld and a data processor configured to process shape data acquired by the shape measurement unit. The data processor includes a shape data processor configured to correct a resolution of the shape data, a learning data set generator configured to generate a plurality of learning data sets by performing data augmentation on multiple pieces of sample shape data acquired in advance, a determination model generator configured to generate a determination model using the plurality of learning data sets, and a first determination unit configured to determine whether the shape of the weld is good or bad based on the shape data having the corrected resolution and the determination model.

公开(公告)号：US12103045B2

公开(公告)日：2024-10-01

申请号：US17882506

申请日：2022-08-05

Applicant: Sortera Alloys, Inc.

Inventor： Nalin Kumar ,  Manuel Gerardo Garcia, Jr.

IPC: B07B13/00 ,  B07B13/18 ,  B07C5/12 ,  B07C5/342 ,  G06F18/2413 ,  G06T7/00 ,  G06T7/10 ,  G06V10/46 ,  G06V10/764 ,  G06V10/82

CPC classification number: B07B13/003 ,  B07B13/18 ,  B07C5/12 ,  B07C5/342 ,  B07C5/3422 ,  G06F18/2413 ,  G06T7/0004 ,  G06T7/0006 ,  G06T7/10 ,  G06V10/46 ,  G06V10/765 ,  G06V10/82 ,  B07C2501/0036 ,  B07C2501/0054 ,  G06T2207/20084 ,  G06T2207/30136 ,  G06T2207/30141 ,  G06V2201/06

Abstract: A system classifies materials utilizing a vision system that implements an artificial intelligence system in order to identify or classify and then remove automotive airbag modules from a scrap stream, which may have been produced from a shredding of end-of-life vehicles. The sorting process may be designed so that live airbag modules are not activated, which may cause damage to equipment or persons.

公开(公告)号：US20240317515A1

公开(公告)日：2024-09-26

申请号：US18736533

申请日：2024-06-07

Applicant: INDUSTRIAL PROCESS SYSTEMS, INC.

Inventor： Lennie Loesch ,  Sherman Owen ,  Javier Tello

IPC: B65G69/00 ,  B65G67/04 ,  G01S17/89 ,  G06T7/00 ,  G06T7/62 ,  G06V20/52 ,  G06V20/64

CPC classification number: B65G69/006 ,  B65G67/04 ,  G01S17/89 ,  G06T7/0008 ,  G06T7/62 ,  G06V20/52 ,  G06V20/64 ,  G06T2207/20081 ,  G06V2201/06 ,  G06V2201/08

Abstract: A loading lockout system which takes an image of a vessel, recognizes the receiving opening of the vessel, and prevents the loading of material into the vessel until it determines that the discharge footprint of the material storage device is within the receiving opening of the vessel.

公开(公告)号：US20240289935A1

公开(公告)日：2024-08-29

申请号：US18697691

申请日：2022-10-05

Applicant: Hamad Medical Corporation ,  NEW FOUR LEAVES TRADING AND CONTRACTING WLL

Inventor： Nazmul Ahsan ,  Shidin Balakrishnan ,  Sarada Prasad Dakua ,  Abdulla Al-Ansari ,  Julien Abi Nahed ,  Joji Abraham ,  Carlos Velasquez

IPC: G06T7/00 ,  A61L2/10 ,  A61L2/24 ,  B07C5/342 ,  B25J9/00 ,  B25J9/16 ,  G06T7/73 ,  G06V10/44 ,  G06V10/764 ,  G06V20/50

CPC classification number: G06T7/0002 ,  A61L2/10 ,  A61L2/24 ,  B07C5/342 ,  B25J9/0093 ,  B25J9/1682 ,  B25J9/1697 ,  G06T7/73 ,  G06V10/44 ,  G06V10/764 ,  G06V20/50 ,  A61L2202/14 ,  A61L2202/26 ,  B07C2501/0063 ,  G06T2207/20084 ,  G06V2201/06

Abstract: The present disclosure generally relates to systems and methods for handling, inspecting, and orienting a mask to be placed into a disinfection system. The systems and methods include a computer vision system configured to detect the mask position and calculate an orientation angle of the mask, a first robotic arm configured to lift the mask and adjust the mask position based on the orientation angle, and a second robotic arm configured to hold open the mask for a visual inspection of an internal and an external surface of the mask.

公开(公告)号：US12070867B2

公开(公告)日：2024-08-27

申请号：US18469506

申请日：2023-09-18

Applicant: Path Robotics, Inc.

Inventor： Alexander James Lonsberry ,  Andrew Gordon Lonsberry ,  Nima Ajam Gard ,  Colin Bunker ,  Carlos Fabian Benitez Quiroz ,  Madhavun Candadai Vasu

IPC: G06K9/00 ,  B23K37/02 ,  B23K37/04 ,  B25J9/16 ,  B25J11/00 ,  B25J13/08 ,  B25J15/00 ,  G06T7/00 ,  G06T7/70 ,  G06V10/764 ,  G06V10/82

CPC classification number: B25J9/1697 ,  B23K37/0229 ,  B23K37/0258 ,  B23K37/04 ,  B25J9/161 ,  B25J9/1666 ,  B25J9/1671 ,  B25J11/005 ,  B25J13/08 ,  B25J15/0019 ,  G06T7/0004 ,  G06T7/70 ,  G06V10/764 ,  G06V10/82 ,  G06T2207/10028 ,  G06T2207/20084 ,  G06V2201/06

Abstract: In some examples, an autonomous robotic welding system comprises a workspace including a part having a seam, a sensor configured to capture multiple images within the workspace, a robot configured to lay weld along the seam, and a controller. The controller is configured to identify the seam on the part in the workspace based on the multiple images, plan a path for the robot to follow when welding the seam, the path including multiple different configurations of the robot, and instruct the robot to weld the seam according to the planned path.

公开(公告)号：US20240282098A1

公开(公告)日：2024-08-22

申请号：US18571253

申请日：2022-06-20

Applicant: JFE STEEL CORPORATION

Inventor： Hiroaki ONO ,  Hiroaki KOMATSUBARA ,  Miwa OHASHI

IPC: G06V10/96 ,  G06T7/00 ,  G06V10/40 ,  G06V10/764 ,  G06V10/774 ,  G06V10/82 ,  G06V20/50

CPC classification number: G06V10/96 ,  G06T7/0004 ,  G06V10/40 ,  G06V10/764 ,  G06V10/774 ,  G06V10/82 ,  G06V20/50 ,  G06T2207/20081 ,  G06T2207/20084 ,  G06T2207/30136 ,  G06V2201/06

Abstract: Provided are an inspection method, a classification method, a management method, a steel material production method, a learning model generation method, a learning model, an inspection device, and steel material production equipment that can both improve detection accuracy and reduce processing time. The inspection method is an inspection method of detecting surface defects on an inspection target, the inspection method including: an imaging step (S1) of acquiring an image of a surface of the inspection target; an extraction step (S3) of extracting defect candidate parts from the image; a screening step (S4) of screening the extracted defect candidate parts by a first defect determination; and an inspection step (S5) of detecting harmful or harmless surface defects by a second defect determination using a convolutional neural network, the second defect determination being targeted at defect candidate parts after the screening by the first defect determination.

公开(公告)号：US20240281961A1

公开(公告)日：2024-08-22

申请号：US18568996

申请日：2022-06-16

Applicant: SHIN-ETSU HANDOTAI CO., LTD.

Inventor： Masato OHNISHI

IPC: G06T7/00 ,  G06T7/11 ,  G06T7/62 ,  G06V20/00

CPC classification number: G06T7/001 ,  G06T7/11 ,  G06T7/62 ,  G06T2207/20076 ,  G06T2207/30148 ,  G06T2207/30208 ,  G06T2207/30242 ,  G06V20/95 ,  G06V2201/06

Abstract: A debris determination method of determining, from an image obtained by an appearance inspection device, debris that occurs around an HLM on a backside of a wafer, including: replacing luminance data of the image with matrix data; extracting an HLM-printed region; obtaining a least-squares plane of luminance; obtaining normalized matrix data by subtracting the least-squares plane from the printed region; obtaining protrusion-side matrix data by substituting 0 for matrix values less than 0; obtaining recess-side matrix data by inverting the sign of the normalized matrix data and substituting 0 for matrix values representing dots and noise; obtaining composite matrix data from the protrusion- and recess-side matrix data; obtaining low-pass matrix data by processing the composite matrix data; and determining debris from the low-pass matrix data with a predetermined threshold and obtaining an area ratio of the debris to determine the presence or absence of debris in the printed region.

公开(公告)号：US20240276103A1

公开(公告)日：2024-08-15

申请号：US18634332

申请日：2024-04-12

Applicant: Panasonic Intellectual Property Management Co., Ltd.

Inventor： Shinya Nakashima

IPC: H04N23/74 ,  G01N21/89 ,  G06T7/00 ,  G06T7/60 ,  G06V10/60 ,  G06V10/764 ,  H04N23/56 ,  H04N23/71

CPC classification number: H04N23/74 ,  G01N21/89 ,  G06T7/001 ,  G06T7/60 ,  G06V10/60 ,  G06V10/764 ,  H04N23/56 ,  H04N23/71 ,  G06T2207/10152 ,  G06T2207/20224 ,  G06T2207/30148 ,  G06V2201/06

Abstract: An inspection apparatus includes an illumination device capable of emitting first light in a first wavelength band and reference light in a reference wavelength band overlapping with the first wavelength band, an imaging device that images an inspection body and outputs a pixel signal, and an image processing device. The illumination device emits the first light and the reference light to the inspection body at different timings in one imaging time. The image processing device calculates a first reflectance that is a reflectance in the first wavelength band of the object based on the pixel signal, and determines physical properties of the object based on the first reflectance.

公开(公告)号：US20240265662A1

公开(公告)日：2024-08-08

申请号：US18569438

申请日：2021-06-25

Applicant: FUJI CORPORATION

Inventor： Minoru KINUTA ,  Toshinori SHIMIZU

IPC: G06V10/14 ,  G06V10/28 ,  G06V10/98 ,  H04N23/73 ,  H05K13/08

CPC classification number: G06V10/14 ,  G06V10/28 ,  G06V10/993 ,  H04N23/73 ,  H05K13/081 ,  G06V2201/06

Abstract: An image analysis section executes instruction processing to image electronic component while changing a shutter speed of measurement camera between a predetermined lower limit speed and a predetermined upper limit speed calculation processing of comparing an image of lower surface of each lead included in each of multiple imaging data acquired from the measurement camera with an ideal image of lower surface of each lead included in ideal imaging data to calculate a missing rate at which the image of lower surface of each lead is missing with respect to the ideal image for each of the multiple imaging data, detection processing of detecting imaging data having a missing rate equal to or less than a predetermined first threshold among multiple missing rates calculated by the calculation processing, and selection processing of selecting a shutter speed used for capturing the imaging data detected by the detection processing.