Light emitting semiconductor element capable of suppressing change of driving current
    81.
    发明授权
    Light emitting semiconductor element capable of suppressing change of driving current 有权
    能够抑制驱动电流的变化的发光半导体元件

    公开(公告)号:US06324201B1

    公开(公告)日:2001-11-27

    申请号:US09200060

    申请日:1998-11-25

    CPC classification number: H01S5/2231 H01S5/3201 H01S2301/173

    Abstract: A light emitting semiconductor element comprises a first additive layer which is added into a cladding layer or a middle layer. The first additive layer has a lattice constant which is different from a lattice constant of a semiconductor substrate. The light emitting semiconductor element is attached to a heat sink to form a laser device. The heat sink gives deformation to the light emitting semiconductor element. The first additive layer generates strain therein and suppresses influence of the deformation.

    Abstract translation: 发光半导体元件包括添加到包覆层或中间层中的第一添加剂层。 第一添加层具有与半导体基板的晶格常数不同的晶格常数。 发光半导体元件附接到散热器以形成激光器件。 散热器使发光半导体元件变形。 第一添加剂层在其中产生应变并抑制变形的影响。

    Extended wavelength strained layer lasers having strain compensated
layers
    82.
    发明授权
    Extended wavelength strained layer lasers having strain compensated layers 失效
    具有应变补偿层的扩展波长应变层激光器

    公开(公告)号:US5960018A

    公开(公告)日:1999-09-28

    申请号:US115689

    申请日:1998-07-15

    Abstract: Several methods are used in novel ways with newly identified and viable parameters to decrease the peak transition energies of the pseudomorphic InGaAs/GaAs heterostructures. These techniques, taken separately or in combination, suffice to permit operation of light emitting devices at wavelengths of 1.3 .mu.m or greater of light-emitting electro-optic devices. These methods or techniques, by example, include: (1) utilizing new superlattice structures having high In concentrations in the active region, (2) utilizing strain compensation to increase the usable layer thickness for quantum wells with appropriately high In concentrations, (3) utilizing appropriately small amounts of nitrogen (N) in the pseudomorphic InGaAsN/GaAs laser structure, and (4) sue of nominal (111) oriented substrates to increase the usable layer thickness for quantum wells with appropriately high In concentrations. In all of the above techniques, gain offset may be utilized in VCSELs to detune the emission energy lower than the peak transition energy, by about 25 meV or even more, via appropriate DBR spacing. Gain offset may also be utilized in some forms of in-plane lasers. Increased temperature may also be used to decrease peak transition energy (and therefore the emission energy) by about 50 meV/100.degree. C. All these techniques are furthermore applicable to other material systems, for example, extending the emission wavelength for laser diodes grown on InP substrates. Additionally, structures which utilize the above techniques are discussed.

    Abstract translation: 以新颖的方式使用几种方法,用新的识别和可行的参数来降低伪晶InGaAs / GaAs异质结构的峰跃迁能。 单独或组合使用的这些技术足以允许在发光电光器件的1.3μm或更大的波长处操作发光器件。 这些方法或技术例如包括:(1)利用在有源区域中具有高In浓度的新超晶格结构,(2)利用应变补偿增加适当高浓度的量子阱的可用层厚度,(3) 在伪晶InGaAsN / GaAs激光器结构中适当地使用少量的氮(N),(4)采用标称(111)取向的衬底,以增加适当高的In浓度的量子阱的可用层厚度。 在所有上述技术中,增益偏移可以用于VCSEL中,以通过适当的DBR间隔将低于峰值跃迁能量的发射能量去除约25meV或甚至更多。 在某些形式的平面内激光器中也可以使用增益偏移。 也可以使用增加的温度来将峰值转变能量(因此发射能量)降低约50meV / 100℃。所有这些技术还可应用于其他材料系统,例如,扩展生长在激光二极管上的激光二极管的发射波长 InP衬底。 另外,讨论了利用上述技术的结构。

    Semiconductor laser with lattice mismatch
    86.
    发明授权
    Semiconductor laser with lattice mismatch 失效
    具有晶格失配的半导体激光器

    公开(公告)号:US5751753A

    公开(公告)日:1998-05-12

    申请号:US681336

    申请日:1996-07-23

    Applicant: Toru Uchida

    Inventor: Toru Uchida

    Abstract: A semiconductor laser having: a group III-V semiconductor substrate; a group III-V semiconductor clad layer disposed on the substrate with a lattice mismatch of 0.5 % or more; group III-V semiconductor light propagation layers disposed on the clad layer, including an active layer and light confining layers on both sides of the active layer, the light confining layers containing Al as the group III element; a group III-V semiconductor buffer layer disposed between the substrate and the clad layer, the buffer layer including a composition graded layer gradually changing the lattice constant, and having a cross hatched step on the surface thereof; and an intermediate layer of group III-V semiconductor disposed between the buffer layer and the clad layer, the intermediate layer containing phosphorous as the group V element. A semiconductor laser of 1 .mu.m band is provided whose substrate and clad layer are lattice mismatched and whose clad layer uses group III-V semiconductor having a wide forbidden band and containing Al as the group III element.

    Abstract translation: 一种具有:III-V族半导体衬底的半导体激光器; 设置在所述基板上的晶格失配为0.5%以上的III-V族半导体包层; 设置在包层上的III-V族半导体光传播层,包括有源层和在有源层的两侧上的限光层,光限制层包含Al作为III族元素; 设置在所述基板和所述包层之间的III-V族半导体缓冲层,所述缓冲层包括逐渐改变晶格常数的组成分级层,并且在其表面上具有交叉阴影的步骤; 以及设置在缓冲层和包层之间的III-V族半导体的中间层,中间层含有磷作为V族元素。 提供了1μm的半导体激光器,其衬底和包层是晶格失配的,并且其包层使用具有宽禁带的III-V族半导体并且包含Al作为III族元素。

    Semiconductor light emitting device with lattice-matching and
lattice-mismatching
    88.
    发明授权
    Semiconductor light emitting device with lattice-matching and lattice-mismatching 失效
    具有晶格匹配和晶格失配的半导体发光器件

    公开(公告)号:US5633514A

    公开(公告)日:1997-05-27

    申请号:US570376

    申请日:1995-12-11

    CPC classification number: H01L33/28 H01L33/0087 H01S5/327 H01S5/3201

    Abstract: The semiconductor light emitting device includes a semiconductor substrate (1), a first conductivity type first cladding layer (2) deposited on the semiconductor substrate (1), an active layer (4) deposited on the first cladding layer (2), and the second conductivity type second cladding layer (6) deposited on the active layer (4). The first and the second cladding layers (2, 6) are made of the II/VI-compound semiconductors including at least one kind of group II elements such as Zn, Hg, Cd, Mg and at least one kind of group VI elements such as S, Se, Te. The lattice mismatching .DELTA.a/a (%) between at least one of the first cladding layer (2) and the second cladding layer (6) and the substrate is set within the range of -0.9%.ltoreq..DELTA.Aa/a.ltoreq.0.5% (reference symbols a and a.sub.c represent the lattice constant of the semiconductor substrate and the lattice constant of at least either of the first and second cladding layers, and .DELTA.a is obtained from .DELTA.a=a.sub.c -a).

    Abstract translation: 半导体发光器件包括半导体衬底(1),沉积在半导体衬底(1)上的第一导电型第一包覆层(2),沉积在第一覆层(2)上的有源层(4) 沉积在有源层(4)上的第二导电类型的第二包覆层(6)。 第一和第二覆层(2,6)由包括Zn,Hg,Cd,Mg中的至少一种II族元素和至少一种VI族元素的II / VI族化合物半导体制成, 作为S,Se,Te。 在第一包层(2)和第二包覆层(6)中的至少一个与基板之间的晶格失配DELTA a / a(%)设定在-0.9%的范围内ΔTAAa/ /=0.5%(参考符号a和ac表示半导体衬底的晶格常数和第一和第二包层中的至少任一个的晶格常数,并且DELTA a从DELTA a = ac-a获得)。

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