Charged Particle Gun and Charged Particle Beam System

    公开(公告)号:US20250132118A1

    公开(公告)日:2025-04-24

    申请号:US18923770

    申请日:2024-10-23

    Applicant: JEOL Ltd.

    Abstract: There is provided a charged particle gun capable of increasing the number of charged particles contained in each pulse. The charged particle gun operates to emit a charged particle beam and includes: an emitter, an extraction electrode for extracting the charged particle beam from the emitter, a capacitor having one end connected to the extraction electrode, an offset power supply for supplying a first voltage to the one end of the capacitor via a resistor, a pulsed power supply providing an output of a second voltage, and a switch circuit that switches between whether the second voltage or a reference potential is supplied to the other end of the capacitor, based on a reference pulsed signal.

    Focused Ion Beam System
    2.
    发明申请

    公开(公告)号:US20250109481A1

    公开(公告)日:2025-04-03

    申请号:US18898792

    申请日:2024-09-27

    Applicant: JEOL Ltd.

    Abstract: A focused ion beam (FIB) system capable of preventing a film from being deposited thickly on the surface of a sample The FIB system operates to mill the sample by irradiating it with an ion beam. The FIB system includes an FIB column through which the ion beam is directed at the sample; a nozzle having a blowoff port for blowing a gas against the sample to deposit the film; a sample stage providing mechanical support of the sample; a shield member for impeding the flow of the gas; and a shield support member. The shield member is movable to a shield position located between the blowoff port and the sample. The shield member is also movable to a retractive position not located therebetween. The shield member support mechanism supports the shield member so that it can move between the shield position and the retractive position of the shield member.

    Superconducting Coil Device
    3.
    发明申请

    公开(公告)号:US20250087397A1

    公开(公告)日:2025-03-13

    申请号:US18830825

    申请日:2024-09-11

    Applicant: RIKEN JEOL Ltd.

    Abstract: A superconducting coil device includes a superconducting coil and adhesive layer. The superconducting coil includes a superconducting wire wound into a coil shape. An electrical conductivity is imparted to the adhesive layer. The adhesive layer constitutes at least a part of a current bypass for the superconducting coil. The adhesive layer includes a binder. The adhesive layer includes a resistance-decrease suppression structure that imparts the electrical conductivity to the adhesive layer while suppressing a decrease in contact resistance with the superconducting wire.

    Mass spectrum processing device and mass spectrum processing method

    公开(公告)号:US12198917B2

    公开(公告)日:2025-01-14

    申请号:US17843221

    申请日:2022-06-17

    Applicant: JEOL Ltd.

    Inventor: Takaya Satoh

    Abstract: Peak determination is executed with respect to the mass spectrum of a sample to generate a peak list. For each of the plurality of peaks contained in the peak list, a Kendrick mass (KM) of a designated monomer is calculated. An RKM is calculated, the RKM being a fractional part of a value obtained by dividing the KM by the integer mass of the monomer, or a remainder of dividing a nominal Kendrick mass (NKM) by the integer mass of the monomer. A plurality of peaks contained in the peak list and satisfying a grouping condition, including the permissible range of the RKM of the starting point peak, are grouped.

    Transmission Electron Microscope
    8.
    发明公开

    公开(公告)号:US20240096588A1

    公开(公告)日:2024-03-21

    申请号:US18368310

    申请日:2023-09-14

    Applicant: JEOL Ltd.

    Inventor: Kanako Noguchi

    CPC classification number: H01J37/228 H01J37/224 H01J2237/2802

    Abstract: A laser beam illumination equipment has a laser beam generation section and a mirror unit. An image generation section has a camera and a camera controller. A laser beam illumination control section sets a pulse period of a laser beam to the same period as an exposure period of the camera. With this configuration, a state change of a specimen can be set uniform over exposure durations. A pulse train of the laser beam may be generated based on a synchronization signal which is output from the camera controller.

    Optical lattice clock and magnetic field correction method for optical lattice clock

    公开(公告)号:US11894854B2

    公开(公告)日:2024-02-06

    申请号:US17915776

    申请日:2021-03-30

    Applicant: JEOL Ltd. RIKEN

    CPC classification number: H03L7/26 G04F5/145

    Abstract: An optical lattice clock includes a clock transition space having disposed therein an atom group trapped in an optical lattice, and a triaxial magnetic field correction coil for correcting the magnetic field of the clock transition space. Additionally, in a correction space that includes the clock transition space and is larger than the clock transition space, a photoreceiver promotes the clock transition of the atom group trapped in the optical lattice and acquires a clock transition frequency distribution for the correction space. Further, a corrector corrects the magnetic field of the triaxial magnetic field correction coil on the basis of the frequency distribution measured by the photo receiver.

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