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    Apparatus for measuring a radius of a workpiece
    4.
    发明授权
    Apparatus for measuring a radius of a workpiece 有权
    用于测量工件半径的装置

    公开(公告)号：US08742774B2

    公开(公告)日：2014-06-03

    申请号：US13236190

    申请日：2011-09-19

    Applicant: Joseph D. Drescher

    Inventor： Joseph D. Drescher

    IPC: G01R27/26

    CPC classification number: G01B7/293

    Abstract: An apparatus for measuring a workpiece includes a capacitance probe mounted to a probe housing and a non-conductive spacer. The capacitance probe includes a probe tip with a sensor surface that emits an electric field. The non-conductive spacer extends between a probe contact surface and a workpiece contact surface. The probe contact surface covers the sensor surface, and the workpiece contact surface contacts the workpiece during the measuring of the radius.

    Abstract translation: 用于测量工件的装置包括安装到探针壳体和非导电间隔件的电容探针。 电容探针包括具有发射电场的传感器表面的探针尖端。 非导电间隔件在探针接触表面和工件接触表面之间延伸。 探头接触表面覆盖传感器表面，测量半径时工件接触面接触工件。

    Coupling
    5.
    发明授权
    Coupling 失效
    耦合

    公开(公告)号：US07025385B2

    公开(公告)日：2006-04-11

    申请号：US10653797

    申请日：2003-09-03

    Applicant: Joseph D. Drescher

    Inventor： Joseph D. Drescher

    IPC: F16L21/00

    CPC classification number: F16L37/252 ,  B64D29/06

    Abstract: A coupling connects a first member and a second member. The first member has a first interlocking member extending radially outward from an outer circumferential surface of an axial end. The second member includes a second interlocking member extending radially inward from an inner circumferential surface of an axial end. The axial end of the first member is inserted into the axial end of the second member, such that the first interlocking member is inserted past the second interlocking member. The first and second members are then rotated relative to one another to a locked angular orientation, in which the first interlocking member is interlocked with the second interlocking member to prevent relative axial movement of the first and second members. A key is then inserted into a keyway in the first and second members to lock the angular orientation, thereby coupling the first and second members to one another.

    Abstract translation: 联接器连接第一构件和第二构件。 第一构件具有从轴向端部的外周表面径向向外延伸的第一联锁构件。 第二构件包括从轴向端部的内周表面径向向内延伸的第二互锁构件。 第一构件的轴向端插入第二构件的轴向端部，使得第一互锁构件插入经过第二互锁构件。 然后第一和第二构件相对于彼此旋转到锁定的角度定向，其中第一互锁构件与第二互锁构件互锁，以防止第一和第二构件的相对轴向运动。 然后将钥匙插入第一和第二构件中的键槽中以锁定角度定向，从而将第一和第二构件彼此连接。

    Targeted Artifacts and Methods for Evaluating 3-D Coordinate System Measurement Accuracy of Optical 3-D Measuring Systems using Such Targeted Artifacts
    6.
    发明申请
    Targeted Artifacts and Methods for Evaluating 3-D Coordinate System Measurement Accuracy of Optical 3-D Measuring Systems using Such Targeted Artifacts 有权
    用于评估使用这种目标人工制品的光学三维测量系统的三维坐标系测量精度的目标人工制品和方法

    公开(公告)号：US20090161122A1

    公开(公告)日：2009-06-25

    申请号：US11962278

    申请日：2007-12-21

    Applicant: Jesse R. Boyer ,  Jeffry K. Pearson ,  Randall W. Joyner ,  Joseph D. Drescher

    Inventor： Jesse R. Boyer ,  Jeffry K. Pearson ,  Randall W. Joyner ,  Joseph D. Drescher

    IPC: G01B11/14

    CPC classification number: G01B21/042

    Abstract: A method for evaluating three-dimensional (3-D) coordinate system measurement accuracy of an optical 3-D measuring system using targeted artifacts is provided. In this regard, an exemplary embodiment of a method for evaluating 3-D coordinate system measurement accuracy using targeted artifacts comprises: taking a series of measurements from different positions and orientations using target dots on a targeted artifact with an optical 3-D measuring system; and calculating measurement errors using the series of measurements. An exemplary embodiment of a targeted artifact used with the method includes a base and target dots located on the base.

    Abstract translation: 提供了一种用于评估使用目标伪像的光学3-D测量系统的三维（3-D）坐标系测量精度的方法。 在这方面，使用目标伪像来评估3-D坐标系测量精度的方法的示例性实施例包括：使用光学3-D测量系统在目标伪影上使用目标点从不同位置和取向进行一系列测量; 并使用一系列测量来计算测量误差。 与该方法一起使用的目标人造物的示例性实施例包括位于基座上的基点和目标点。

    On-machine automatic inspection of workpiece features using a lathe rotary table
    7.
    发明授权
    On-machine automatic inspection of workpiece features using a lathe rotary table 有权
    使用车床旋转工作台对工件特征进行机上自动检查

    公开(公告)号：US07191535B2

    公开(公告)日：2007-03-20

    申请号：US11068248

    申请日：2005-02-28

    Applicant: Anton Banks ,  Joseph D. Drescher ,  Christian Jesse

    Inventor： Anton Banks ,  Joseph D. Drescher ,  Christian Jesse

    IPC: G01B5/004 ,  G01B21/04

    CPC classification number: G01B5/008

    Abstract: To enable the on-machine measurement of selected features of a workpiece formed on a live spindle lathe with a positioning rotary table, both the machine itself and the electronic touch probe used to conduct the measurements are calibrated. The accuracy of the machine itself is measured and calculated by including the measured errors not only in the x and z linear axes, but also in the y linear axis. Calibration of the touch probe is made by determining a correction factor which is obtained by the touch probe measurement of an artifact whose dimensions are precisely known by other means. This correction factor is then made to the nominal measurements made by the touch probe on the selected features of the workpiece to be measured, to obtain the actual dimensions thereof. Adjustments are also made to compensate for the differences in radial positions between the workpiece and the artifact.

    Abstract translation: 为了能够在带有定位旋转台的活动车床上形成的工件的所选特征进行机上测量，校准用于进行测量的机器本身和电子测头。 通过将测量的误差包括在x和z直线轴上，而且在y直线轴上，测量和计算机器本身的精度。 通过确定通过触摸测量测量尺寸通过其他方式精确地知道的假象获得的校正因子来进行触摸探针的校准。 然后将该校正因子设定为由待测量的待测工件的选定特征上的触摸探针进行的标称测量，以获得其实际尺寸。 还进行了调整以补偿工件与伪像之间的径向位置的差异。

    APPARATUS FOR MEASURING A RADIUS OF A WORKPIECE
    9.
    发明申请
    APPARATUS FOR MEASURING A RADIUS OF A WORKPIECE 有权
    用于测量工作半径的装置

    公开(公告)号：US20130069674A1

    公开(公告)日：2013-03-21

    申请号：US13236190

    申请日：2011-09-19

    Applicant: Joseph D. Drescher

    Inventor： Joseph D. Drescher

    IPC: G01R27/26

    CPC classification number: G01B7/293

    Abstract: An apparatus for measuring a workpiece includes a capacitance probe mounted to a probe housing and a non-conductive spacer. The capacitance probe includes a probe tip with a sensor surface that emits an electric field. The non-conductive spacer extends between a probe contact surface and a workpiece contact surface. The probe contact surface covers the sensor surface, and the workpiece contact surface contacts the workpiece during the measuring of the radius.

    Abstract translation: 用于测量工件的装置包括安装到探针壳体和非导电间隔件的电容探针。 电容探针包括具有发射电场的传感器表面的探针尖端。 非导电间隔件在探针接触表面和工件接触表面之间延伸。 探头接触表面覆盖传感器表面，测量半径时工件接触面接触工件。

    Targeted artifacts and methods for evaluating 3-D coordinate system measurement accuracy of optical 3-D measuring systems using such targeted artifacts
    10.
    发明授权
    Targeted artifacts and methods for evaluating 3-D coordinate system measurement accuracy of optical 3-D measuring systems using such targeted artifacts 有权
    用于评估使用这种目标人工制品的光学3-D测量系统的3-D坐标系测量精度的目标工件和方法

    公开(公告)号：US07869026B2

    公开(公告)日：2011-01-11

    申请号：US11962278

    申请日：2007-12-21

    Applicant: Jesse R. Boyer ,  Jeffry K. Pearson ,  Randall W. Joyner ,  Joseph D Drescher

    Inventor： Jesse R. Boyer ,  Jeffry K. Pearson ,  Randall W. Joyner ,  Joseph D Drescher

    IPC: G01J1/10 ,  G01B11/14

    CPC classification number: G01B21/042

    Abstract: A method for evaluating three-dimensional (3-D) coordinate system measurement accuracy of an optical 3-D measuring system using targeted artifacts is provided. In this regard, an exemplary embodiment of a method for evaluating 3-D coordinate system measurement accuracy using targeted artifacts comprises: taking a series of measurements from different positions and orientations using target dots on a targeted artifact with an optical 3-D measuring system; and calculating measurement errors using the series of measurements. An exemplary embodiment of a targeted artifact used with the method includes a base and target dots located on the base.

    Abstract translation: 提供了一种用于评估使用目标伪像的光学3-D测量系统的三维（3-D）坐标系测量精度的方法。 在这方面，使用目标伪像来评估3-D坐标系测量精度的方法的示例性实施例包括：使用光学3-D测量系统在目标伪影上使用目标点从不同位置和取向进行一系列测量; 并使用一系列测量来计算测量误差。 与该方法一起使用的目标人造物的示例性实施例包括位于基座上的基点和目标点。

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