公开(公告)号：US11307097B1

公开(公告)日：2022-04-19

申请号：US17069020

申请日：2020-10-13

Applicant: ABB Schweiz AG

Inventor： Florent M. Prel ,  Frederic J. Grandmont ,  Louis M. Moreau ,  Eric A. Carbonneau ,  Martin C. Larouche

IPC: G01J3/453 ,  G01J3/28 ,  G01J3/45

Abstract: Technologies for a high resolution and wide swath spectrometer are disclosed. In the illustrative embodiment, an inverted image slicer converts a linear field of view into a grid shape, allowing for an interferometer of a Fourier transform spectrometer to operate on a narrow range of field of views, improving the average spectral resolution of the spectrometer.

公开(公告)号：US20220113192A1

公开(公告)日：2022-04-14

申请号：US17069020

申请日：2020-10-13

Applicant: ABB Schweiz AG

Inventor： Florent M. Prel ,  Frederic J. Grandmont ,  Louis M. Moreau ,  Eric A. Carbonneau ,  Martin C. Larouche

IPC: G01J3/453 ,  G01J3/28

Abstract: Technologies for a high resolution and wide swath spectrometer are disclosed. In the illustrative embodiment, an inverted image slicer converts a linear field of view into a grid shape, allowing for an interferometer of a Fourier transform spectrometer to operate on a narrow range of field of views, improving the average spectral resolution of the spectrometer.