公开(公告)号：US10859370B2

公开(公告)日：2020-12-08

申请号：US15763889

申请日：2016-09-30

Applicant: ARCELORMITTAL

Inventor： Gabriel Fricout ,  David Glijer

IPC: G01B11/06 ,  G01N21/84 ,  B08B3/08 ,  C23C2/02 ,  G01N21/3563

Abstract: A method for the fabrication of a steel product is provided. The method includes the steps of characterizing a layer of oxides present on a running steel substrate which includes providing a portion of the steel substrate comprising a layer of oxides and the portion defines an oxide surface, collecting light (Lr) from the oxide surface using a hyperspectral camera (20) in order to obtain intensity values (Iλ,M) respectively representative of an intensity of a part (Lrλ,M) of the collected light, each part being respectively collected from one of a plurality of points (M) located on the oxide surface and respectively has a wavelength (λ) from a plurality of wavelengths, comparing the obtained intensity values with reference intensity values obtained for reference oxides, and calculating amounts of reference oxides in the layer. A device for characterizing a layer of oxides present on a steel substrate is also provided.

公开(公告)号：US20180283849A1

公开(公告)日：2018-10-04

申请号：US15763889

申请日：2016-09-30

Applicant: ARCELORMITTAL

Inventor： Gabriel Fricout ,  David Glijer

IPC: G01B11/06 ,  G01N21/84 ,  G01N21/3563 ,  B08B3/08 ,  C23C2/02

Abstract: A method for the fabrication of a steel product is provided. The method includes the steps of characterizing a layer of oxides present on a running steel substrate which includes providing a portion of the steel substrate comprising a layer of oxides and the portion defines an oxide surface, collecting light (Lr) from the oxide surface using a hyperspectral camera (20) in order to obtain intensity values (Iλ,M) respectively representative of an intensity of a part (Lrλ,M) of the collected light, each part being respectively collected from one of a plurality of points (M) located on the oxide surface and respectively has a wavelength (λ) from a plurality of wavelengths, comparing the obtained intensity values with reference intensity values obtained for reference oxides, and calculating amounts of reference oxides in the layer. A device for characterizing a layer of oxides present on a steel substrate is also provided.