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公开(公告)号:US12206185B2
公开(公告)日:2025-01-21
申请号:US17503228
申请日:2021-10-15
Applicant: Advanced Semiconductor Engineering, Inc.
Inventor: Mark Gerber
Abstract: The present disclosure provides an antenna device. The antenna device includes a dielectric element including a first region and a second region, a first antenna disposed on the first region, and a second antenna disposed on the second region. The first antenna and the second antenna are configured to operate in different frequencies. The first antenna and the second antenna are misaligned in directions perpendicular and parallel to a surface of the dielectric element on which the first antenna or the second antenna is disposed.
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公开(公告)号:US11146234B2
公开(公告)日:2021-10-12
申请号:US16443545
申请日:2019-06-17
Applicant: Advanced Semiconductor Engineering, Inc.
Inventor: Mark Gerber
Abstract: An electrical device includes an electronic component, a membrane and a cover. The electronic component has a first surface and a second surface opposite to the first surface. The electronic component has a cavity extending from the first surface of the electronic component into the electronic component. The membrane is disposed within the cavity of the electronic component. The cover is disposed on the first surface of the electronic component.
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公开(公告)号:US11342282B2
公开(公告)日:2022-05-24
申请号:US16798170
申请日:2020-02-21
Applicant: Advanced Semiconductor Engineering, Inc.
Inventor: Hsu-Chiang Shih , Hung-Yi Lin , Meng-Wei Hsieh , Yu Sheng Chang , Hsiu-Chi Liu , Mark Gerber
IPC: H01L23/00 , H01L21/56 , H01L23/48 , H01L23/528
Abstract: A semiconductor device package includes an electronic component, an electrical contact and a reinforcement layer. The electronic component has a first conductive layer on a first surface of the electronic component. The electronic component has a through-silicon-via (TSV) penetrating the electronic component and electrically connected to the first conductive layer. The electrical contact is disposed on the first surface of the electronic component and electrically connected to the first conductive layer. The reinforcement layer is disposed on the first surface of the electronic component.
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公开(公告)号:US10177099B2
公开(公告)日:2019-01-08
申请号:US15482464
申请日:2017-04-07
Applicant: Advanced Semiconductor Engineering, Inc.
Inventor: Mark Gerber , Rich Rice , Bradford Factor
IPC: H01L23/00 , H01L23/373 , H01L25/065 , H01L25/00 , H01L25/10
Abstract: A semiconductor package structure includes a substrate, a first semiconductor device, a first encapsulant and a second encapsulant. The substrate has a first coefficient of thermal expansion CTE1. The first semiconductor device is disposed adjacent to a first surface of the substrate. The first encapsulant is disposed on the first surface of the substrate, and covers at least a portion of the first semiconductor device. The first encapsulant has a second coefficient of thermal expansion CTE2. The second encapsulant is disposed on a second surface of the substrate and has a third coefficient of thermal expansion CTE3. A difference between CTE1 and CTE2 is substantially equal to a difference between CTE1 and CTE3.
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公开(公告)号:US11862587B2
公开(公告)日:2024-01-02
申请号:US16937493
申请日:2020-07-23
Applicant: Advanced Semiconductor Engineering, Inc.
Inventor: Mark Gerber
CPC classification number: H01L24/05 , H01L21/56 , H01L24/11 , H01L24/16 , H01L24/24 , H01L24/25 , H01L24/32 , H01L24/73 , H01L24/92 , H01L25/18 , H01L25/50 , H01L2224/02379 , H01L2224/02381 , H01L2224/11616 , H01L2224/13084 , H01L2224/13111 , H01L2224/13144 , H01L2224/13147 , H01L2224/13155 , H01L2224/13166 , H01L2224/16148 , H01L2224/24155 , H01L2224/2518 , H01L2224/25171 , H01L2224/32145 , H01L2224/73204 , H01L2224/73209 , H01L2224/92143
Abstract: A semiconductor package structure and a method of manufacturing the semiconductor package structure are disclosed. The semiconductor package structure includes a first semiconductor device having an active surface, a redistribution structure in electrical connection with the first semiconductor device, and a second semiconductor device bonded to the active surface of the first semiconductor device, and disposed between the first semiconductor device and the redistribution structure.
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