公开(公告)号：US20130294143A1

公开(公告)日：2013-11-07

申请号：US13936313

申请日：2013-07-08

Applicant: Analog Devices, Inc.

Inventor： James M. Lee ,  Howard R. Samuels ,  Thomas W. Kelly

IPC: G11C29/02 ,  G11C17/18

CPC classification number: G11C29/021 ,  G11C17/14 ,  G11C17/18 ,  G11C29/02 ,  G11C29/027 ,  G11C29/50 ,  G11C29/50008 ,  G11C2029/5006

Abstract: An apparatus and method of testing one-time-programmable memory provides one-time-programmable memory having one or more memory locations for storing data and corresponding programming circuitry for each memory location. In addition, each programming circuitry has a circuit element configured to permanently change state to store the data in the memory. The method also reads each memory location to verify that the memory location is unprogrammed and activates the programming circuitry for each memory location, which applies a test current to the programming circuitry. The test current is less than a threshold current needed to permanently change the state of the circuit element. The method then determines whether the programming circuitry is functioning properly.

Abstract translation: 测试一次可编程存储器的装置和方法提供具有用于存储数据的一个或多个存储器位置的一次可编程存储器和用于每个存储器位置的对应编程电路。 此外，每个编程电路具有被配置为永久地改变状态以将数据存储在存储器中的电路元件。 该方法还读取每个存储器位置以验证存储器位置是否未编程，并激活每个存储器位置的编程电路，其将测试电流施加到编程电路。 测试电流小于永久改变电路元件状态所需的阈值电流。 然后该方法确定编程电路是否正常工作。

公开(公告)号：US08665627B2

公开(公告)日：2014-03-04

申请号：US13936313

申请日：2013-07-08

Applicant: Analog Devices, Inc.

Inventor： James M. Lee ,  Howard R. Samuels ,  Thomas W. Kelly

IPC: G11C17/00

CPC classification number: G11C29/021 ,  G11C17/14 ,  G11C17/18 ,  G11C29/02 ,  G11C29/027 ,  G11C29/50 ,  G11C29/50008 ,  G11C2029/5006

Abstract: An apparatus and method of testing one-time-programmable memory provides one-time-programmable memory having one or more memory locations for storing data and corresponding programming circuitry for each memory location. In addition, each programming circuitry has a circuit element configured to permanently change state to store the data in the memory. The method also reads each memory location to verify that the memory location is unprogrammed and activates the programming circuitry for each memory location, which applies a test current to the programming circuitry. The test current is less than a threshold current needed to permanently change the state of the circuit element. The method then determines whether the programming circuitry is functioning properly.

Abstract translation: 测试一次可编程存储器的装置和方法提供具有用于存储数据的一个或多个存储器位置的一次可编程存储器和用于每个存储器位置的对应编程电路。 此外，每个编程电路具有被配置为永久地改变状态以将数据存储在存储器中的电路元件。 该方法还读取每个存储器位置以验证存储器位置是否未编程，并激活每个存储器位置的编程电路，其将测试电流施加到编程电路。 测试电流小于永久改变电路元件状态所需的阈值电流。 然后该方法确定编程电路是否正常工作。