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公开(公告)号：US20210223291A1
公开(公告)日：2021-07-22
申请号：US17020827
申请日：2020-09-15
Applicant: CHUNGHWA PRECISION TEST TECH. CO., LTD.
Inventor： WEN-TSUNG LEE , Hsun-Tai Wei , KAI-CHIEH HSIEH , WEI-JHIH SU
Abstract: A probe card device and a directivity probe thereof are provided. The directivity probe having an elongated shape includes a conductive pin and a ring-shaped insulator. The conductive pin includes a stroke segment and two end segments respectively extending from the stroke segment. The stroke segment has two broad side surfaces and two narrow side surfaces, and has only one transverse slot that is recessed in one of the two broad side surfaces and that extends from one of the two narrow side surfaces to the other narrow side surface. The transverse groove has a maximum depth that is 1%-10% of a maximum distance between the two broad side surfaces. The stroke segment of the directivity probe can be bent by applying a force to the two end segments, and an inflection point of the bent stroke segment is located in the transverse slot.
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公开(公告)号：US20210349129A1
公开(公告)日：2021-11-11
申请号：US17020833
申请日：2020-09-15
Applicant: CHUNGHWA PRECISION TEST TECH. CO., LTD.
Inventor： WEN-TSUNG LEE , Hsun-Tai Wei , KAI-CHIEH HSIEH , CHAO-CHIANG LIU
IPC: G01R1/073
Abstract: A thin-film probe card and a test module thereof are provided. The test module includes a carrying unit, a plurality of vertical probes fixed in position by the carrying unit, an elastic cushion disposed on the carrying unit, and a thin sheet. The thin sheet includes a carrier partially disposed on the elastic cushion, a plurality of signal circuits disposed on the carrier, and a plurality of electrically conductive protrusions that are respectively formed on the signal circuits. An end of the vertical probes is arranged at an inner side of the electrically conductive protrusions and is coplanar with free ends of the electrically conductive protrusions.
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公开(公告)号：US20210223289A1
公开(公告)日：2021-07-22
申请号：US17019361
申请日：2020-09-14
Applicant: CHUNGHWA PRECISION TEST TECH. CO., LTD.
Inventor： WEN-TSUNG LEE , Hsun-Tai Wei , KAI-CHIEH HSIEH , WEI-JHIH SU
Abstract: A probe card device and a neck-like probe thereof are provided. The neck-like probe includes a conductive pin and a ring-shaped insulator. The conductive pin includes a stroke segment and two end segments extending from the stroke segment. The stroke segment has two broad side surfaces and two narrow side surfaces, and each of the broad side surfaces has a long slot extending from one of the narrow side surfaces to the other one. The two long slots have a minimum distance therebetween that is 75%-95% of a maximum distance between the two broad side surfaces. The ring-shaped insulator surrounds a portion of the conductive pin having the two long slots, and a portion of the neck-like probe corresponding in position to a part of the ring-shaped insulator on the two broad side surfaces has a thickness that is 85%-115% of the maximum distance.
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公开(公告)号：US20190265274A1
公开(公告)日：2019-08-29
申请号：US16154846
申请日：2018-10-09
Applicant: CHUNGHWA PRECISION TEST TECH. CO., LTD.
Inventor： WEN-TSUNG LEE , KAI-CHIEH HSIEH , YUAN-CHIANG TENG
Abstract: A probe component and a probe structure thereof are provided. The probe structure includes a first contacting segment, a first connecting segment, a second connecting segment and a second contacting segment. The first contacting segment has an abutting portion and a first end portion connected to the abutting portion. The first connecting segment is connected to the first contacting segment. The second connecting segment is connected to the first connecting segment. The second contacting segment is connected to the second connecting segment and has a second end portion.
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公开(公告)号：US20220018876A1
公开(公告)日：2022-01-20
申请号：US17020826
申请日：2020-09-15
Applicant: CHUNGHWA PRECISION TEST TECH. CO., LTD.
Inventor： WEN-TSUNG LEE , Hsun-Tai Wei , KAI-CHIEH HSIEH , WEI-JHIH SU
IPC: G01R1/073
Abstract: A probe card device and a fence-like probe thereof are provided. The fence-like probe includes a stroke segment, a fan-out segment, and a testing segment. The stroke segment is in an elongated shape defining a longitudinal direction, and the stroke segment has two end portions and a plurality of penetrating slots that are arranged along a fan-out direction perpendicular to the longitudinal direction, so that the stroke segment is deformable to store an elastic force by being applied with a force. The fan-out segment and the testing segment are respectively connected to the two end portions of the stroke segment. The fan-out segment has a fixing point arranged away from the stroke segment, and the testing segment has an abutting point arranged away from the stroke segment. Along the fan-out direction, the fixing point is spaced apart from the abutting point by a fan-out distance.
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Patent Agency Ranking
公开(公告)号：US20210325430A1
公开(公告)日：2021-10-21
申请号：US17022094
申请日：2020-09-16
Applicant: CHUNGHWA PRECISION TEST TECH. CO., LTD.
Inventor： WEN-TSUNG LEE , Hsun-Tai Wei , KAI-CHIEH HSIEH , CHAO-CHIANG LIU
IPC: G01R1/073
Abstract: A split thin-film probe card and an elastic module thereof are provided. The elastic module includes an elastic cushion and a thin-film sheet. The elastic cushion has a plurality of partition slots so as to define a plurality of independent elastic segments. The thin-film sheet includes a carrier, a plurality of signal circuits disposed on the carrier, and a plurality of conductive protrusions that are respectively formed on the signal circuits. The carrier has a plurality of grooves so as to divide the carrier into a plurality of action segments respectively disposed on the independent elastic segments. The signal circuits are respectively disposed on the action segments. When any one of the conductive protrusions is pressed, only the corresponding independent elastic segment is deformed through the corresponding signal circuit and the corresponding action segment.
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公开(公告)号：US20200166543A1
公开(公告)日：2020-05-28
申请号：US16404176
申请日：2019-05-06
Applicant: CHUNGHWA PRECISION TEST TECH. CO., LTD.
Inventor： WEN-TSUNG LEE , KAI-CHIEH HSIEH , CHAO-HUI TSENG , HSIEN-YU WANG
Abstract: A probe carrier of a probe card device includes an upper die unit, a lower die unit, a spacer sandwiched between the upper and lower die units, and an impedance adjusting member. The upper die unit includes a first die, a second die spaced apart from the first die, and a flexible board disposed on the second die and arranged away from the first die. The flexible board includes a plurality of penetrating holes and a circuit layer. The impedance adjusting member is disposed on the flexible board and is electrically coupled to the circuit layer. The circuit layer includes at least one plated wall arranged in at least one of the penetrating holes, a part of the flexible board having the at least one plated wall is separable from the second die by receiving an internal force.
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公开(公告)号：US20160349315A1
公开(公告)日：2016-12-01
申请号：US15159031
申请日：2016-05-19
Applicant: CHUNGHWA PRECISION TEST TECH. CO., LTD.
Inventor： WEN-TSUNG LEE , KAI-CHIEH HSIEH , YUAN-CHIANG TENG
IPC: G01R31/28 , H01L23/498
CPC classification number: G01R31/2889
Abstract: Disclosed is a multilayer interposer with high bonding strength, which is used in wafer testing. The multilayer interposer with high bonding strength comprises a plurality of thin-film layer structures overlapping sequentially. One of the thin-film layer structures comprises at least one first conductive blind via. An interconnection layer electrically connected to the first conductive blind via is configured on the surface of the one of the thin-film layer structures, and the interconnection layer comprises at least one head portion. Another one of the thin-film layer structures comprises at least one second conductive blind via. The bottom of the second conductive blind via contacts both of the corresponding head portion and part of the surface of the one of the thin-film layer structures. Thereby, the bonding strength between layers can be dramatically increased, and the resistance to the thermal shock can be also increased.
Abstract translation: 公开了一种具有高结合强度的多层插入件，用于晶片测试。 具有高接合强度的多层插入件包括多个顺序重叠的薄膜层结构。 薄膜层结构之一包括至少一个第一导电盲孔。 电连接到第一导电盲通孔的互连层被配置在薄膜层结构之一的表面上，并且互连层包括至少一个头部。 另一个薄膜层结构包括至少一个第二导电盲孔。 第二导电盲孔通孔的底部接触相应的头部和薄膜层结构之一的表面的一部分。 因此，可以显着提高层间的接合强度，并且还可以提高耐热冲击性。
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公开(公告)号：US20230033013A1
公开(公告)日：2023-02-02
申请号：US17574694
申请日：2022-01-13
Applicant: CHUNGHWA PRECISION TEST TECH. CO., LTD.
Inventor： WEN-TSUNG LEE , Hsun-Tai Wei , Pang-Chi Huang , MENG-CHIEH CHENG
IPC: G01R1/073
Abstract: A probe card device and a transmission structure are provided. The transmission structure includes a supporting layer, a plurality of metal conductors spaced apart from each other and slantingly inserted into the supporting layer, and an insulating resilient layer formed on the supporting layer. Each of the metal conductors includes a positioning segment held in the supporting layer, a connecting segment and an embedded segment respectively extending from two ends of the positioning segment, and an exposed segment extending from the embedded segment. Each of the embedded segments is embedded and fixed in the insulating resilient layer, and each of the exposed segments protrudes from the insulating resilient layer. When any one of the exposed segments is pressed by an external force, the insulating resilient layer is configured to absorb the external force through the corresponding embedded segment so as to have a deformation providing a stroke distance.
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公开(公告)号：US20220011346A1
公开(公告)日：2022-01-13
申请号：US17019360
申请日：2020-09-14
Applicant: CHUNGHWA PRECISION TEST TECH. CO., LTD.
Inventor： WEN-TSUNG LEE , Hsun-Tai Wei , KAI-CHIEH HSIEH , WEI-JHIH SU
Abstract: A probe card device and a fan-out probe thereof are provided. The fan-out probe includes a stroke segment, a fan-out segment, and a testing segment. The stroke segment is in a straight shape defining a longitudinal direction, and the stroke segment has two end portions. The stroke segment is bendable when the two end portions are respectively applied with forces along two opposite directions. The fan-out segment and the testing segment are respectively connected to the two end portions of the stroke segment. The fan-out segment has a fixing point arranged away from the stroke segment, and the testing segment has an abutting point arranged away from the stroke segment. Along a fan-out direction perpendicular to the longitudinal direction, the fixing point is spaced apart from the abutting point by a fan-out distance.
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