公开(公告)号：USD1060072S1

公开(公告)日：2025-02-04

申请号：US29938966

申请日：2024-04-24

Applicant: CMP Scientific Corp

Designer： Qiangwei Xia ,  Paul Nurmi ,  Joshua Wiley ,  Raphael Hebert

公开(公告)号：US12293909B2

公开(公告)日：2025-05-06

申请号：US17816734

申请日：2022-08-02

Applicant: CMP Scientific Corp.

Inventor： Joshua Wiley ,  Paul Nurmi ,  Qiangwei Xia

IPC: H01J49/06 ,  H01J49/00 ,  H01J49/26

Abstract: Systems and methods for analyzing samples are provided. In some embodiments, a mass spectrometer may include a source configured to output one or more ions, a plurality of chambers having different pressures, a detector configured to detect the one or more ions, and a particle guide. The plurality of chambers may include at least a first chamber having a first pressure that is less than atmospheric pressure and a second chamber having a second pressure that is less than the first pressure. In some embodiments, the particle guide may include a conduit through which the one or more ions may travel an entire length of the particle guide. The conduit may be disposed within at least the first chamber and the second chamber, and vents may be disposed to define passages between the chambers and the conduit.

公开(公告)号：US20240047188A1

公开(公告)日：2024-02-08

申请号：US17816734

申请日：2022-08-02

Applicant: CMP Scientific Corp.

Inventor： Joshua Wiley ,  Paul Nurmi ,  Qiangwei Xia

IPC: H01J49/06 ,  H01J49/00 ,  H01J49/26

CPC classification number: H01J49/063 ,  H01J49/0031 ,  H01J49/26

Abstract: Systems and methods for analyzing samples are provided. In some embodiments, a mass spectrometer may include a source configured to output one or more ions, a plurality of chambers having different pressures, a detector configured to detect the one or more ions, and a particle guide. The plurality of chambers may include at least a first chamber having a first pressure that is less than atmospheric pressure and a second chamber having a second pressure that is less than the first pressure. In some embodiments, the particle guide may include a conduit through which the one or more ions may travel an entire length of the particle guide. The conduit may be disposed within at least the first chamber and the second chamber, and vents may be disposed to define passages between the chambers and the conduit.

公开(公告)号：USD1030528S1

公开(公告)日：2024-06-11

申请号：US29872323

申请日：2023-03-10

Applicant: CMP Scientific Corp

Designer： Qiangwei Xia ,  Paul Nurmi ,  Joshua Wiley ,  Raphael Hebert

Abstract: FIG. 1 is a left side view of the mass spectrometry instrument.
FIG. 2 is a front view thereof.
FIG. 3 is a right side view thereof.
FIG. 4 is a back view thereof.
FIG. 5 is a top view thereof.
FIG. 6 is a bottom view thereof; and,
FIG. 7 is a right perspective view thereof.
Features shown in broken lines are shown for the purpose of illustrating portions of the mass spectrometry instrument and form no part of the claimed design.

公开(公告)号：US20240047189A1

公开(公告)日：2024-02-08

申请号：US18048049

申请日：2022-10-20

Applicant: CMP Scientific Corp.

Inventor： Paul Nurmi ,  Joshua Wiley ,  Qiangwei Xia

IPC: H01J49/06 ,  H01J49/26

CPC classification number: H01J49/067 ,  H01J49/061 ,  H01J49/26

Abstract: Systems and methods for analyzing samples are provided. In some embodiments, a mass spectrometer may include a source configured to output a plurality of particles, a tube having a central axis, and a skimmer. In some embodiments, the skimmer may include an aperture arranged to receive the one or more charged particles deflected by a deflector and a contact surface comprising an intersection point that intersects the central axis of the tube. The intersection point may be spaced from the aperture by a distance of at least 5 mm.