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公开(公告)号:US08928029B2
公开(公告)日:2015-01-06
申请号:US13712122
申请日:2012-12-12
Applicant: California Institute of Technology
Inventor: David Z. Ting , Sarath D. Gunapala , Alexander Soibel , Jean Nguyen , Arezou Khoshakhlagh
IPC: H01L29/74 , H01L31/02 , H01L31/109
CPC classification number: H01L31/109 , H01L31/02016 , H01L31/02019 , H01L31/101 , H01L31/1013
Abstract: Bias-switchable dual-band infrared detectors and methods of manufacturing such detectors are provided. The infrared detectors are based on a back-to-back heterojunction diode design, where the detector structure consists of, sequentially, a top contact layer, a unipolar hole barrier layer, an absorber layer, a unipolar electron barrier, a second absorber, a second unipolar hole barrier, and a bottom contact layer. In addition, by substantially reducing the width of one of the absorber layers, a single-band infrared detector can also be formed.
Abstract translation: 提供了可偏压切换的双频带红外探测器和制造这种探测器的方法。 红外检测器基于背对背异质结二极管设计,其中检测器结构依次由顶部接触层,单极性空穴阻挡层,吸收层,单极电子势垒,第二吸收体, 第二单极孔阻挡层和底部接触层。 此外,通过显着减小吸收层之一的宽度,也可以形成单频带红外检测器。
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公开(公告)号:US09647164B2
公开(公告)日:2017-05-09
申请号:US14516359
申请日:2014-10-16
Applicant: California Institute of Technology
Inventor: David Z. Ting , Sarath D. Gunapala , Alexander Soibel , Jean Nguyen , Arezou Khoshakhlagh
IPC: H01L31/109 , H01L31/02 , H01L31/101
CPC classification number: H01L31/109 , H01L31/02016 , H01L31/02019 , H01L31/101 , H01L31/1013
Abstract: Bias-switchable dual-band infrared detectors and methods of manufacturing such detectors are provided. The infrared detectors are based on a back-to-back heterojunction diode design, where the detector structure consists of, sequentially, a top contact layer, a unipolar hole barrier layer, an absorber layer, a unipolar electron barrier, a second absorber, a second unipolar hole barrier, and a bottom contact layer. In addition, by substantially reducing the width of one of the absorber layers, a single-band infrared detector can also be formed.
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公开(公告)号:US20150145091A1
公开(公告)日:2015-05-28
申请号:US14516359
申请日:2014-10-16
Applicant: California Institute of Technology
Inventor: David Z. Ting , Sarath D. Gunapala , Alexander Soibel , Jean Nguyen , Arezou Khoshakhlagh
IPC: H01L31/109 , H01L31/02
CPC classification number: H01L31/109 , H01L31/02016 , H01L31/02019 , H01L31/101 , H01L31/1013
Abstract: Bias-switchable dual-band infrared detectors and methods of manufacturing such detectors are provided. The infrared detectors are based on a back-to-back heterojunction diode design, where the detector structure consists of, sequentially, a top contact layer, a unipolar hole barrier layer, an absorber layer, a unipolar electron barrier, a second absorber, a second unipolar hole barrier, and a bottom contact layer. In addition, by substantially reducing the width of one of the absorber layers, a single-band infrared detector can also be formed.
Abstract translation: 提供了可偏压切换的双频带红外探测器和制造这种探测器的方法。 红外检测器基于背对背异质结二极管设计,其中检测器结构依次由顶部接触层,单极性空穴阻挡层,吸收层,单极电子势垒,第二吸收体, 第二单极孔阻挡层和底部接触层。 此外,通过显着减小吸收层之一的宽度,也可以形成单频带红外检测器。
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公开(公告)号:US20130146998A1
公开(公告)日:2013-06-13
申请号:US13712122
申请日:2012-12-12
Applicant: California Institute of Technology
Inventor: David Z. Ting , Sarath D. Gunapala , Alexander Soibel , Jean Nguyen , Arezo Khoshakhlagh
IPC: H01L31/02
CPC classification number: H01L31/109 , H01L31/02016 , H01L31/02019 , H01L31/101 , H01L31/1013
Abstract: Bias-switchable dual-band infrared detectors and methods of manufacturing such detectors are provided. The infrared detectors are based on a back-to-back heterojunction diode design, where the detector structure consists of, sequentially, a top contact layer, a unipolar hole barrier layer, an absorber layer, a unipolar electron barrier, a second absorber, a second unipolar hole barrier, and a bottom contact layer. In addition, by substantially reducing the width of one of the absorber layers, a single-band infrared detector can also be formed.
Abstract translation: 提供了可偏压切换的双频带红外探测器和制造这种探测器的方法。 红外检测器基于背对背异质结二极管设计,其中检测器结构依次由顶部接触层,单极性空穴阻挡层,吸收层,单极电子势垒,第二吸收体, 第二单极孔阻挡层和底部接触层。 此外,通过显着减小吸收层之一的宽度,也可以形成单频带红外检测器。
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