公开(公告)号：US08717560B2

公开(公告)日：2014-05-06

申请号：US13100495

申请日：2011-05-04

Applicant: David Roger Labrecque

Inventor： David Roger Labrecque

IPC: G01J3/40 ,  G01J3/18 ,  G01J3/28 ,  G01J3/02

CPC classification number: G01J3/18 ,  G01J3/02 ,  G01J3/0229 ,  G01J3/0243 ,  G01J3/20 ,  G01J3/28 ,  G01J3/2823 ,  G01J3/2846 ,  G01J3/4406 ,  Y10T29/49826

Abstract: The present invention provides apparatuses including a point light source, a diffraction grating oriented in a light path generated from the point light source wherein the diffraction grating diffracts and concentrates light from the point light source into one or more rings of light, a detector positioned to detect one or more of the rings of light or light transmitted from a sample exposed to said rings of light, and a computer operably connected to the detector to analyze the intensity of one or more of the rings of light or said light transmitted from said sample. Variations including samples and additional components and methods of making the apparatuses of the present invention are also disclosed.

Abstract translation: 本发明提供了一种装置，包括点光源，衍射光栅，其定向在从点光源产生的光路中，其中衍射光栅将来自点光源的光衍射并集中到一个或多个光环中，检测器定位成 检测从暴露于所述光环的样品透射的光或光的一个或多个环，以及可操作地连接到所述检测器的计算机，以分析从所述样品透射的一个或多个所述光或所述光的强度 。 还公开了包括样品和附加组分的变化以及制备本发明的装置的方法。