公开(公告)号：US11504850B2

公开(公告)日：2022-11-22

申请号：US16869629

申请日：2020-05-08

Applicant: Gecko Robotics, Inc.

Inventor： Edward A. Bryner ,  Kevin Y. Low ,  Joshua D. Moore ,  Dillon R. Jourde ,  Benjamin A. Guise ,  Alexander C. Watt ,  Logan A. MacKenzie ,  Ian Miller ,  Mark Cho ,  Edwin H. Cho ,  Francesco H. Trogu ,  Domenic P. Rodriguez

IPC: B25J9/16 ,  B25J9/00 ,  B25J5/00 ,  G05D1/00 ,  G05D1/02 ,  B25J19/00 ,  B25J19/02 ,  B25J9/10 ,  G01B11/06 ,  G01B11/24 ,  G01B11/30 ,  G01B17/02 ,  G01B17/06 ,  G01B17/08 ,  G01J3/50 ,  G01K13/00 ,  B25J13/08

Abstract: An inspection robot, and methods and a controller thereof are disclosed. An inspection robot may include an inspection chassis including a plurality of inspection sensors and coupled to at least one drive module to drive the robot over an inspection surface. The inspection robot may also include a controller including an inspection data circuit to interpret inspection base data, an inspection processing circuit to determine refined inspection data, and an inspection configuration circuit to determine an inspection response value in response to the refined inspection data. The controller may further include an inspection response circuit to, in response to the inspection response value, provide an inspection command value while the inspection robot is interrogating the inspection surface.

公开(公告)号：US11472033B2

公开(公告)日：2022-10-18

申请号：US16869636

申请日：2020-05-08

Applicant: Gecko Robotics, Inc.

Inventor： Edward A. Bryner ,  Kevin Y. Low ,  Joshua D. Moore ,  Dillon R. Jourde ,  Benjamin A. Guise ,  Alexander C. Watt ,  Logan A. MacKenzie ,  Ian Miller ,  Todd Joslin ,  Yizhu Gu ,  Mark Cho ,  Francesco H. Trogu ,  Edwin H. Cho ,  Domenic P. Rodriguez

IPC: B25J9/16 ,  B25J9/00 ,  B25J5/00 ,  G05D1/00 ,  G05D1/02 ,  B25J19/00 ,  B25J19/02 ,  G01B11/24 ,  G01B17/06 ,  G01B17/08 ,  B25J9/10 ,  G01J3/50 ,  G01K13/00 ,  B25J13/08 ,  G01B11/06 ,  G01B11/30 ,  G01B17/02

Abstract: Systems, apparatus and methods for providing an inspection map are disclosed. An apparatus for performing an inspection may include an inspection data circuit to interpret inspection data, a robot positioning circuit to interpret position data, and a processed data circuit to link the inspection data with the position data to determine position-based inspection data. The apparatus may further include a user interaction circuit to interpret an inspection visualization request for an inspection map and an inspection visualization circuit to determine the inspection map based on the position-based inspection data, and a provisioning circuit structured to provide the inspection map to a user device.

公开(公告)号：US11518030B2

公开(公告)日：2022-12-06

申请号：US16869640

申请日：2020-05-08

Applicant: Gecko Robotics, Inc.

Inventor： Edward A. Bryner ,  Kevin Y. Low ,  Joshua D. Moore ,  Dillon R. Jourde ,  Benjamin A. Guise ,  Alexander C. Watt ,  Edwin H. Cho ,  Mark Cho ,  Francesco H. Trogu ,  Domenic P. Rodriguez ,  Logan A. MacKenzie ,  Yizhu Gu ,  Ian Miller ,  Todd Joslin ,  Mark J. Loosararian

IPC: B25J9/16 ,  B25J9/00 ,  B25J5/00 ,  G05D1/00 ,  G05D1/02 ,  G01B11/24 ,  G01B11/30 ,  G01B17/06 ,  G01B17/08 ,  G01J3/50 ,  G01K13/00 ,  B25J13/08 ,  B25J19/00 ,  B25J19/02 ,  B25J9/10 ,  G01B11/06 ,  G01B17/02

Abstract: Systems, apparatus and methods for providing an interactive inspection map are disclosed. An example apparatus for providing an interactive inspection map of an inspection surface may include an inspection visualization circuit to provide an inspection map to a user device in response to inspection data provided by a plurality of sensors operationally coupled to an inspection robot traversing the inspection surface, wherein the inspection map corresponds to at least a portion of the inspection surface. The apparatus may further include a user interaction circuit to interpret a user focus value from the user device, and an action request circuit to determine an action in response to the user focus value. The inspection visualization circuit may further update the inspection map in response to the determined action.

公开(公告)号：US11472031B2

公开(公告)日：2022-10-18

申请号：US16863594

申请日：2020-04-30

Applicant: Gecko Robotics, Inc.

Inventor： Edward A. Bryner ,  Kevin Y. Low ,  Joshua D. Moore ,  Dillon R. Jourde ,  Francesco H. Trogu ,  Jeffrey J. Mrkonich ,  William J. Pridgen ,  Domenic P. Rodriguez ,  Alexander C. Watt ,  Michael Stephen Auda ,  Logan A. MacKenzie ,  Ian Miller ,  Samuel Theodore Westenberg ,  Katherine Virginia Denner ,  Benjamin A. Guise ,  Yizhu Gu ,  Todd Joslin ,  Mark J. Loosararian ,  Mark Cho ,  Edwin H. Cho

IPC: B25J9/16 ,  B25J9/00 ,  B25J5/00 ,  G05D1/00 ,  G05D1/02 ,  B25J9/10 ,  B25J19/00 ,  B25J19/02 ,  G01B11/06 ,  G01B11/24 ,  G01B11/30 ,  G01B17/02 ,  G01B17/06 ,  G01B17/08 ,  G01J3/50 ,  G01K13/00 ,  B25J13/08

Abstract: Systems, methods and apparatus for rapid development of an inspection scheme for an inspection robot are disclosed. An apparatus may include an inspection definition circuit to interpret an inspection description value, and a robot configuration circuit to determine an inspection robot configuration description in response to the inspection description value. The apparatus may further include a configuration implementation circuit, communicatively coupled to a configuration interface of an inspection robot, to provide at least a portion of the inspection robot configuration description to the configuration interface.

公开(公告)号：US11511426B2

公开(公告)日：2022-11-29

申请号：US16863594

申请日：2020-04-30

Applicant: Gecko Robotics, Inc.

Inventor： Edward A. Bryner ,  Kevin Y. Low ,  Joshua D. Moore ,  Dillon R. Jourde ,  Francesco H. Trogu ,  Jeffrey J. Mrkonich ,  William J. Pridgen ,  Domenic P. Rodriguez ,  Alexander C. Watt ,  Michael Stephen Auda ,  Logan A. MacKenzie ,  Ian Miller ,  Samuel Theodore Westenberg ,  Katherine Virginia Denner ,  Benjamin A. Guise ,  Yizhu Gu ,  Todd Joslin ,  Mark J. Loosararian ,  Mark Cho ,  Edwin H. Cho

IPC: B25J9/16 ,  B25J9/00 ,  B25J5/00 ,  G05D1/00 ,  G05D1/02 ,  B25J9/10 ,  B25J19/00 ,  B25J19/02 ,  G01B11/06 ,  G01B11/24 ,  G01B11/30 ,  G01B17/02 ,  G01B17/06 ,  G01B17/08 ,  G01J3/50 ,  G01K13/00 ,  B25J13/08 ,  B60G17/015 ,  B60G17/02 ,  B60G21/00 ,  B62D37/04 ,  B62D57/024 ,  G01M3/04 ,  G01N21/88 ,  G01N27/82 ,  G01N29/04 ,  G05B15/02

Abstract: Systems, methods and apparatus for rapid development of an inspection scheme for an inspection robot are disclosed. An apparatus may include an inspection definition circuit to interpret an inspection description value, and a robot configuration circuit to determine an inspection robot configuration description in response to the inspection description value. The apparatus may further include a configuration implementation circuit, communicatively coupled to a configuration interface of an inspection robot, to provide at least a portion of the inspection robot configuration description to the configuration interface.

公开(公告)号：US11472032B2

公开(公告)日：2022-10-18

申请号：US16869629

申请日：2020-05-08

Applicant: Gecko Robotics, Inc.

Inventor： Edward A. Bryner ,  Kevin Y. Low ,  Joshua D. Moore ,  Dillon R. Jourde ,  Benjamin A. Guise ,  Alexander C. Watt ,  Logan A. MacKenzie ,  Ian Miller ,  Mark Cho ,  Edwin H. Cho ,  Francesco H. Trogu ,  Domenic P. Rodriguez

IPC: B25J9/16 ,  B25J9/00 ,  B25J5/00 ,  G05D1/00 ,  G05D1/02 ,  B25J19/00 ,  B25J19/02 ,  B25J9/10 ,  G01B11/06 ,  G01B11/24 ,  G01B11/30 ,  G01B17/02 ,  G01B17/06 ,  G01B17/08 ,  G01J3/50 ,  G01K13/00 ,  B25J13/08

Abstract: An inspection robot, and methods and a controller thereof are disclosed. An inspection robot may include an inspection chassis including a plurality of inspection sensors and coupled to at least one drive module to drive the robot over an inspection surface. The inspection robot may also include a controller including an inspection data circuit to interpret inspection base data, an inspection processing circuit to determine refined inspection data, and an inspection configuration circuit to determine an inspection response value in response to the refined inspection data. The controller may further include an inspection response circuit to, in response to the inspection response value, provide an inspection command value while the inspection robot is interrogating the inspection surface.

公开(公告)号：US11648671B2

公开(公告)日：2023-05-16

申请号：US16869656

申请日：2020-05-08

Applicant: Gecko Robotics, Inc.

Inventor： Edward A. Bryner ,  Kevin Y. Low ,  Joshua D. Moore ,  Dillon R. Jourde ,  Edwin H. Cho ,  William J. Pridgen ,  Domenic P. Rodriguez ,  Jeffrey J. Mrkonich ,  Mark Cho ,  Francesco H. Trogu ,  Benjamin A. Guise ,  Todd Joslin ,  Logan A. MacKenzie ,  Ian Miller ,  Alexander C. Watt

IPC: B25J9/16 ,  B25J5/00 ,  B25J9/00 ,  B25J9/10 ,  B25J13/08 ,  B25J19/02 ,  G05D1/02 ,  B25J19/00 ,  G01B11/06 ,  G01B11/24 ,  G01B11/30 ,  G01B17/02 ,  G01B17/06 ,  G01B17/08 ,  G01J3/50 ,  G01K13/00 ,  G05D1/00 ,  B60G17/015 ,  B60G17/02 ,  B60G21/00 ,  B62D37/04 ,  B62D57/024 ,  G01M3/04 ,  G01N21/88 ,  G01N27/82 ,  G01N29/04 ,  G05B15/02

CPC classification number: B25J9/1669 ,  B25J5/007 ,  B25J9/0009 ,  B25J9/0015 ,  B25J9/102 ,  B25J9/1602 ,  B25J9/162 ,  B25J9/1617 ,  B25J9/1633 ,  B25J9/1664 ,  B25J9/1666 ,  B25J9/1679 ,  B25J9/1697 ,  B25J13/088 ,  B25J19/0029 ,  B25J19/02 ,  B60G17/015 ,  B60G17/02 ,  B60G21/002 ,  B60G21/007 ,  B62D37/04 ,  B62D57/024 ,  G01B11/0616 ,  G01B11/24 ,  G01B11/303 ,  G01B17/025 ,  G01B17/06 ,  G01B17/08 ,  G01J3/50 ,  G01K13/00 ,  G05D1/0016 ,  G05D1/0094 ,  G05D1/0272 ,  G05D1/0274 ,  G01M3/04 ,  G01N21/88 ,  G01N27/82 ,  G01N29/04 ,  G01N2291/0289 ,  G05B15/02 ,  G05D2201/0207

Abstract: Systems, methods, and apparatus for tracking location of an inspection robot are disclosed. An example apparatus for tracking inspection data may include an inspection chassis having a plurality of inspection sensors configured to interrogate an inspection surface, a first drive module and a second drive module, both coupled to the inspection chassis. The first and second drive module may each include a passive encoder wheel and a non-contact sensor positioned in proximity to the passive encoder wheel, wherein the non-contact sensor provides a movement value corresponding to the first passive encoder wheel. An inspection position circuit may determine a relative position of the inspection chassis in response to the movement values from the first and second drive modules.

公开(公告)号：US11511427B2

公开(公告)日：2022-11-29

申请号：US16869636

申请日：2020-05-08

Applicant: Gecko Robotics, Inc.

Inventor： Edward A. Bryner ,  Kevin Y. Low ,  Joshua D. Moore ,  Dillon R. Jourde ,  Benjamin A. Guise ,  Alexander C. Watt ,  Logan A. MacKenzie ,  Ian Miller ,  Todd Joslin ,  Yizhu Gu ,  Mark Cho ,  Francesco H. Trogu ,  Edwin H. Cho ,  Domenic P. Rodriguez ,  Mark J. Loosararian

IPC: B25J9/16 ,  B25J9/00 ,  B25J5/00 ,  G05D1/00 ,  G05D1/02 ,  B25J19/00 ,  B25J19/02 ,  G01B11/24 ,  G01B17/06 ,  G01B17/08 ,  B25J9/10 ,  G01J3/50 ,  G01K13/00 ,  B25J13/08 ,  G01B11/06 ,  G01B11/30 ,  G01B17/02 ,  B60G17/015 ,  B60G17/02 ,  B60G21/00 ,  B62D37/04 ,  B62D57/024 ,  G01M3/04 ,  G01N21/88 ,  G01N27/82 ,  G01N29/04 ,  G05B15/02

Abstract: Systems, apparatus and methods for providing an inspection map are disclosed. An apparatus for performing an inspection may include an inspection data circuit to interpret inspection data, a robot positioning circuit to interpret position data, and a processed data circuit to link the inspection data with the position data to determine position-based inspection data. The apparatus may further include a user interaction circuit to interpret an inspection visualization request for an inspection map and an inspection visualization circuit to determine the inspection map based on the position-based inspection data, and a provisioning circuit structured to provide the inspection map to a user device.

公开(公告)号：US11135721B2

公开(公告)日：2021-10-05

申请号：US17097422

申请日：2020-11-13

Applicant: Gecko Robotics, Inc.

Inventor： Edward A. Bryner ,  Kevin Y. Low ,  Joshua D. Moore ,  Dillon R. Jourde ,  Benjamin A. Guise ,  Alexander C. Watt

IPC: B25J9/16 ,  G05D1/02 ,  B25J9/00 ,  B25J5/00 ,  G05D1/00 ,  B25J9/10 ,  G01B11/06 ,  G01B11/24 ,  G01B11/30 ,  G01B17/02 ,  G01B17/06 ,  G01B17/08 ,  G01J3/50 ,  G01K13/00 ,  B25J13/08 ,  B25J19/00 ,  B25J19/02

Abstract: Apparatus for providing an interactive inspection map are disclosed. An example apparatus for providing an interactive inspection map of an inspection surface may include an inspection visualization circuit to provide an inspection map to a user device in response to inspection data provided by a plurality of sensors operationally coupled to an inspection robot traversing the inspection surface, wherein the inspection map corresponds to at least a portion of the inspection surface. The apparatus may further include a user interaction circuit to interpret a user focus value from the user device, and an action request circuit to determine an action in response to the user focus value. The inspection visualization circuit may further update the inspection map in response to the determined action.