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公开(公告)号：US11460425B2
公开(公告)日：2022-10-04
申请号：US17130233
申请日：2020-12-22
Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
Inventor： Kengo Kobayashi , Shinya Nishimura , Hirohito Fujiwara
Abstract: Provided is a thermal analyzer, with which a sample can be observed even under a state in which a heat sink is cooled to a room temperature or lower. The thermal analyzer includes: the heat sink, in which a measurement sample container and a reference sample container are placed; a heat sink cover configured to cover the heat sink; a heat sink window provided in the heat sink; a heat sink cover window provided in the heat sink cover; an imaging device configured to image the sample in the heat sink through the heat sink window and the heat sink cover window; a purge gas introduction portion, through which a purge gas is introduced into the heat sink; and a discharge port, through which the purge gas is allowed to flow from one of the heat sink window and the heat sink to a space inside the heat sink cover.
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公开(公告)号：US11598737B2
公开(公告)日：2023-03-07
申请号：US16105194
申请日：2018-08-20
Applicant: Hitachi High-Tech Science Corporation
Inventor： Takeshi Umemoto , Shinya Nishimura , Susumu Ito , Nobuaki Okubo
IPC: G01N25/48
Abstract: An analyzing apparatus includes a memory unit that stores analysis conditions of each standards specifying analysis conditions for each analytical technique, a control unit, and an analysis unit that performs an analysis in accordance with a predetermined analytical technique. The control unit reads out the analysis conditions of the standard, and the control unit displays analysis conditions in time sequence, the displayed analysis conditions being necessary for the analysis and selected from out of the read-out analysis conditions, or the control unit prompts to input the analysis conditions in time sequence. When the analysis conditions are input, the control unit determines whether or not the input analysis conditions comply with the read-out analysis conditions, and in a case where a result of the determination is positive, the control unit displays a next analysis condition being necessary for the analysis, or the control unit prompts to input the next analysis condition.
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公开(公告)号：US20150260665A1
公开(公告)日：2015-09-17
申请号：US14657141
申请日：2015-03-13
Applicant: Hitachi High-Tech Science Corporation
Inventor： Shinya Nishimura , Hirohito Fujiwara
IPC: G01N25/00
CPC classification number: G01N5/04
Abstract: A thermal analyzer is provided with: a furnace tube; a sample holder; a heating furnace; a measurement chamber; and a measurement unit. The heating furnace comprises a fixing section to be fixed to the furnace tube. The furnace tube is configured to be attachable to and detachable from the heating furnace and provided with an engagement portion that is configured to be engaged with the fixing section at a variable position in the radial direction. A is configured to be detachable from the heating furnace and the furnace tube after inserting the furnace tube into the heating furnace and engaging the engagement portion of the furnace tube with the fixing section while the gap jig is interposed between the heating furnace and the furnace tube to maintain the gap between the heating furnace and the furnace tube in the radial direction to be in the predetermined distance.
Abstract translation: 热分析仪配有：炉管; 样品架 加热炉; 测量室; 和测量单元。 加热炉包括固定在炉管上的固定部分。 炉管被构造成可附接到加热炉并可从其拆卸，并且设置有接合部分，该接合部分构造成在径向方向上的可变位置处与固定部分接合。 A被配置为在将炉管插入加热炉中之后与加热炉和炉管分离，并且将炉管的接合部分与固定部分接合，同时间隙夹具插入在加热炉和炉管之间 以将加热炉和炉管之间的径向方向保持在预定距离。
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公开(公告)号：US09885645B2
公开(公告)日：2018-02-06
申请号：US14657141
申请日：2015-03-13
Applicant: Hitachi High-Tech Science Corporation
Inventor： Shinya Nishimura , Hirohito Fujiwara
IPC: G01N5/04
CPC classification number: G01N5/04
Abstract: A thermal analyzer is provided with: a furnace tube; a sample holder; a heating furnace; a measurement chamber; and a measurement unit. The heating furnace comprises a fixing section to be fixed to the furnace tube. The furnace tube is configured to be attachable to and detachable from the heating furnace and provided with an engagement portion that is configured to be engaged with the fixing section at a variable position in the radial direction. A gap jig is configured to be detachable from the heating furnace and the furnace tube after inserting the furnace tube into the heating furnace and engaging the engagement portion of the furnace tube with the fixing section while the gap jig is interposed between the heating furnace and the furnace tube to maintain the gap between the heating furnace and the furnace tube in the radial direction to be in the predetermined distance.
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公开(公告)号：US20150153292A1
公开(公告)日：2015-06-04
申请号：US14560003
申请日：2014-12-04
Applicant: Hitachi High-Tech Science Corporation
Inventor： Shinya Nishimura , Kentaro Yamada , Kanji Nagasawa , Ryoji Takasawa
IPC: G01N25/02
CPC classification number: G01N5/00
Abstract: A thermal analyzer is provided with: a furnace tube; a pair of sample holders; a heating furnace; a measurement chamber; and a measurement unit arranged inside the measurement chamber. The sample holders are arranged inside the furnace tube and are provided with mounting faces on which a pair of sample containers are mounted respectively. The heating furnace has an opening through which a measurement sample is observable, the opening being located at a position above the center of a virtual segment which connects centers of gravity of the mounting faces of the sample holders. The opening is formed to have a size, as viewed in a direction perpendicular to the axial direction and the mounting faces, of 7 mm or more in the direction along the virtual segment and of 3 mm or more in the direction perpendicular to the virtual segment.
Abstract translation: 热分析仪配有：炉管; 一对样品架; 加热炉; 测量室; 以及设置在测量室内的测量单元。 样品保持器布置在炉管内部并且分别设置有安装面，一对样品容器分别安装在该安装面上。 加热炉具有可观察到测量样品的开口，该开口位于连接样品保持器的安装面的重心的虚拟段的中心上方的位置。 开口形成为沿垂直于轴线方向和安装面的方向沿着虚拟段的方向具有7mm或更大的尺寸并且在垂直于虚拟段的方向上具有3mm或更大的尺寸 。
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Patent Agency Ranking
6.发明申请Imaging Apparatus for Thermal Analyzer and Thermal Analyzer Including the Same 有权用于热分析仪和热分析仪的成像仪器包括它公开(公告)号：US20150264277A1
公开(公告)日：2015-09-17
申请号：US14606345
申请日：2015-01-27
Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
Inventor： Shinya Nishimura , Hirohito Fujiwara , Kentaro Yamada
CPC classification number: G06F1/206 , G01N5/04 , G01N25/4853 , H04N5/2252 , H04N5/2254
Abstract: An imaging apparatus for a thermal analyzer is configured to image a heated sample inside a thermal analyzer main body section from an observation window provided in the thermal analyzer main body section. The imaging apparatus is provided with: an imaging device that is provided with a lens housing and a main body section; a holding section configured to hold the imaging device to have an orientation in which the lens housing is oriented toward the observation window, and the main body section is positioned on the opposite side of the observation window across the lens housing; and a cooling fan configured to provide airflow inside the holding section. The holding section is provided with a cooling air passage having an intake portion and an exhaust portion. At least a portion of the lens housing is arranged in the cooling air passage to be cooled by the airflow provided by the cooling fan.
Abstract translation: 用于热分析器的成像装置被配置为从热分析器主体部分中设置的观察窗对热分析器主体部分内的加热样品进行成像。 成像装置设置有：成像装置，其具有透镜壳体和主体部分; 保持部，其构造成将所述摄像装置保持为具有朝向所述观察窗的方向，所述主体部位于所述观察窗的穿过所述镜片壳体的相反侧; 以及冷却风扇，其构造成在所述保持部内部提供气流。 保持部设有具有进气部和排气部的冷却风通路。 透镜壳体的至少一部分布置在冷却空气通道中，以由冷却风扇提供的气流进行冷却。
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公开(公告)号：US20210285904A1
公开(公告)日：2021-09-16
申请号：US17130233
申请日：2020-12-22
Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
Inventor： Kengo KOBAYASHI , Shinya Nishimura , Hirohito Fujiwara
Abstract: Provided is a thermal analyzer, with which a sample can be observed even under a state in which a heat sink is cooled to a room temperature or lower. The thermal analyzer includes: the heat sink, in which a measurement sample container and a reference sample container are placed; a heat sink cover configured to cover the heat sink; a heat sink window provided in the heat sink; a heat sink cover window provided in the heat sink cover; an imaging device configured to image the sample in the heat sink through the heat sink window and the heat sink cover window; a purge gas introduction portion, through which a purge gas is introduced into the heat sink; and a discharge port, through which the purge gas is allowed to flow from one of the heat sink window and the heat sink to a space inside the heat sink cover.
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公开(公告)号：US20190064091A1
公开(公告)日：2019-02-28
申请号：US16105194
申请日：2018-08-20
Applicant: Hitachi High-Tech Science Corporation
Inventor： Takeshi Umemoto , Shinya Nishimura , Susumu Ito , Nobuaki Okubo
IPC: G01N25/48
Abstract: An analyzing apparatus includes a memory unit that stores analysis conditions of each standards specifying analysis conditions for each analytical technique, a control unit, and an analysis unit that performs an analysis in accordance with a predetermined analytical technique. The control unit reads out the analysis conditions of the standard, and the control unit displays analysis conditions in time sequence, the displayed analysis conditions being necessary for the analysis and selected from out of the read-out analysis conditions, or the control unit prompts to input the analysis conditions in time sequence. When the analysis conditions are input, the control unit determines whether or not the input analysis conditions comply with the read-out analysis conditions, and in a case where a result of the determination is positive, the control unit displays a next analysis condition being necessary for the analysis, or the control unit prompts to input the next analysis condition.
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公开(公告)号：US10088402B2
公开(公告)日：2018-10-02
申请号：US14560003
申请日：2014-12-04
Applicant: Hitachi High-Tech Science Corporation
Inventor： Shinya Nishimura , Kentaro Yamada , Kanji Nagasawa , Ryoji Takasawa
Abstract: A thermal analyzer is provided with: a furnace tube; a pair of sample holders; a heating furnace; a measurement chamber; and a measurement unit arranged inside the measurement chamber. The sample holders are arranged inside the furnace tube and are provided with mounting faces on which a pair of sample containers are mounted respectively. The heating furnace has an opening through which a measurement sample is observable, the opening being located at a position above the center of a virtual segment which connects centers of gravity of the mounting faces of the sample holders. The opening is formed to have a size, as viewed in a direction perpendicular to the axial direction and the mounting faces, of 7 mm or more in the direction along the virtual segment and of 3 mm or more in the direction perpendicular to the virtual segment.
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公开(公告)号：US09753509B2
公开(公告)日：2017-09-05
申请号：US14606345
申请日：2015-01-27
Applicant: Hitachi High-Tech Science Corporation
Inventor： Shinya Nishimura , Hirohito Fujiwara , Kentaro Yamada
CPC classification number: G06F1/206 , G01N5/04 , G01N25/4853 , H04N5/2252 , H04N5/2254
Abstract: An imaging apparatus for a thermal analyzer is configured to image a heated sample inside a thermal analyzer main body section from an observation window provided in the thermal analyzer main body section. The imaging apparatus is provided with: an imaging device that is provided with a lens housing and a main body section; a holding section configured to hold the imaging device to have an orientation in which the lens housing is oriented toward the observation window, and the main body section is positioned on the opposite side of the observation window across the lens housing; and a cooling fan configured to provide airflow inside the holding section. The holding section is provided with a cooling air passage having an intake portion and an exhaust portion. At least a portion of the lens housing is arranged in the cooling air passage to be cooled by the airflow provided by the cooling fan.
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