公开(公告)号：US12165740B2

公开(公告)日：2024-12-10

申请号：US17821413

申请日：2022-08-22

Applicant: Micron Technology, Inc.

Inventor： Aaron P. Boehm ,  Scott E. Schaefer ,  Scott D. Van De Graaff ,  Mark D. Ingram ,  Todd Jackson Plum

IPC: G11C7/24 ,  G11C7/04 ,  G11C7/10

Abstract: Methods, systems, and devices for memory traffic monitoring are described. The monitoring may include traffic monitoring of access operations performed at various components of the memory device, or may include sensors that may measure parameters of components of the memory device to detect wear. The traffic monitoring or the parameters measured by the sensors may be represented by a characteristic related to an operational bias of circuits of the memory device. The memory device may use the characteristic (e.g., along with a threshold) to determine whether to adjust a parameter associated with performing access operations received by the memory device, in order to implement a corrective action.

公开(公告)号：US12066927B2

公开(公告)日：2024-08-20

申请号：US18093762

申请日：2023-01-05

Applicant: Micron Technology, Inc.

Inventor： Aaron P. Boehm ,  Todd Jackson Plum ,  Mark D. Ingram ,  Scott E. Schaefer ,  Scott D. Van De Graaff

IPC: G06F12/00 ,  G06F11/34 ,  G06F12/02

CPC classification number: G06F12/023 ,  G06F11/3495 ,  G06F2212/7211

Abstract: Methods, systems, and devices for adaptive user defined health indications are described. A host device may be configured to dynamically indicate adaptive health flags for monitoring health and wear information for a memory device. The host device may indicate, to a memory device, a first index. The first index may correspond to a first level of wear of a set of multiple indexed levels of wear for the memory device. The memory device may determine that a metric of the memory device satisfies the first level of wear and indicate, to the host device, that the first level of wear is satisfied. The host device may receive the indication that the first level of wear is satisfied and indicate, to the memory device, a second level of wear of the set of indexed levels of wear that is different than the first level of wear.

公开(公告)号：US20230393935A1

公开(公告)日：2023-12-07

申请号：US17807813

申请日：2022-06-20

Applicant: Micron Technology, Inc.

Inventor： Scott E. Schaefer ,  Aaron P. Boehm ,  Scott D. Van De Graaff ,  Mark D. Ingram ,  Todd Jackson Plum

IPC: G06F11/10 ,  G06F11/07 ,  G06F9/30 ,  G06F11/30

CPC classification number: G06F11/1068 ,  G06F11/0772 ,  G06F9/30189 ,  G06F11/3051

Abstract: Methods, systems, and devices for evaluation of memory device health monitoring logic are described. For example, a memory device may include health monitoring logic operable to activate certain internal health monitors of a set of multiple monitors and to communicate an output associated with the activated monitors. In a first mode of operation, the health monitoring logic may provide a single output that is generated from multiple outputs of the set of monitors. In a second mode of operation, the health monitoring logic may cycle through certain monitors (e.g., in a test mode), and may generate an output corresponding to respective active monitors as it cycles through the set of monitors. The health monitoring logic may communicate an output specific to each monitor to a host device such that the host device may evaluate an output from each monitor of the set of monitors.

公开(公告)号：US20230315599A1

公开(公告)日：2023-10-05

申请号：US18156594

申请日：2023-01-19

Applicant: Micron Technology, Inc.

Inventor： Scott E. Schaefer ,  Aaron P. Boehm ,  Todd Jackson Plum ,  Mark D. Ingram ,  Scott D. Van De Graaff

IPC: G06F11/27 ,  G06F11/30 ,  G06F11/07

CPC classification number: G06F11/27 ,  G06F11/0772 ,  G06F11/3037

Abstract: Methods, systems, and devices for evaluation of memory device health monitoring logic are described. A memory device may include health monitoring logic that is operable to be enabled in a configuration that corresponds to an output, such as an expected output, regardless of a degradation level of the memory device. Such a configuration may be enabled in a mode, such as a test mode, during which the memory device, or a host device coupled with the memory device, or some combination, may evaluate a difference between the output and an actual output of the health monitoring logic. The actual output being the same as the output may provide an indication that at least a portion of the health monitoring logic is functioning properly, and the actual output being different than the output may provide an indication that at least a portion of the health monitoring logic is not functioning properly.

公开(公告)号：US12189974B2

公开(公告)日：2025-01-07

申请号：US17345267

申请日：2021-06-11

Applicant: Micron Technology, Inc.

Inventor： Aaron P. Boehm ,  Todd J. Plum ,  Scott D. Van De Graaff ,  Scott E. Schaefer ,  Mark D. Ingram

IPC: G06F3/06 ,  G06F1/06

Abstract: Methods, systems, and devices for operational monitoring for memory devices are described. Some memory devices may degrade over time, and this degradation may include or refer to a reduction of an ability of the memory device to reliably store, read, process, or communicate information, among other degradation. In accordance with examples as disclosed herein, a memory device may include components configured for monitoring health or life expectancy or both of the memory device, such as components internal to the memory device that identify and store various indications of a duration of operating a memory device. An operational duration stored at the memory device may be used in various operations, such as calculations or comparisons, to evaluate health or life expectancy of the memory device, which may include or be supported by various signaling with a host device.

公开(公告)号：US11977772B2

公开(公告)日：2024-05-07

申请号：US17464333

申请日：2021-09-01

Applicant: Micron Technology, Inc.

Inventor： Aaron P. Boehm ,  Todd Jackson Plum ,  Scott D. Van De Graaff ,  Scott E. Schaefer ,  Mark D. Ingram

IPC: G06F3/06

CPC classification number: G06F3/0659 ,  G06F3/0604 ,  G06F3/0653 ,  G06F3/0679

Abstract: Methods, systems, and devices for temperature monitoring for memory devices are described for monitoring one or more temperature ranges experienced by a memory device. The memory device may include monitoring circuitry or logic that may identify one or more durations of operating the memory device within the one or more temperature ranges. The memory device may store an indication of the one or more durations, or an indication of information associated with the one or more durations. The indication may be accessed a host device associated with the memory device or may be transmitted by the memory device to the host device. The host device may use information included in the indication to perform an operation associated with the memory device.

公开(公告)号：US11880291B2

公开(公告)日：2024-01-23

申请号：US17354690

申请日：2021-06-22

Applicant: Micron Technology, Inc.

Inventor： Todd Jackson Plum ,  Scott D. Van De Graaff ,  Scott E. Schaefer ,  Aaron P Boehm ,  Mark D. Ingram

IPC: G06F11/00 ,  G06F11/30 ,  G06F11/14 ,  G06F11/07

CPC classification number: G06F11/3037 ,  G06F11/0772 ,  G06F11/1417 ,  G06F11/3075

Abstract: Methods, systems, and devices for monitoring and reporting a status of a memory device are described. A memory device may include monitoring circuitry that may be configured to monitor health and wear information for the memory device. A host device may write to a dedicated register of the memory device, to configure the memory device with health status information reporting parameters. The memory device may monitor and report the health status information of the memory device based on the received reporting configuration or based on a default configuration, and may write one or more values indicative of the health status information to a dedicated register. The host device may perform a read on the readout register to obtain the health status information, as indicated by the one or more values, and may adjust operating procedures or take other actions based on the received health status information.

公开(公告)号：US11561891B1

公开(公告)日：2023-01-24

申请号：US17500751

申请日：2021-10-13

Applicant: Micron Technology, Inc.

Inventor： Aaron P. Boehm ,  Todd Jackson Plum ,  Mark D. Ingram ,  Scott E. Schaefer ,  Scott D. Van De Graaff

IPC: G06F12/00 ,  G06F12/02 ,  G06F11/34

Abstract: Methods, systems, and devices for adaptive user defined health indications are described. A host device may be configured to dynamically indicate adaptive health flags for monitoring health and wear information for a memory device. The host device may indicate, to a memory device, a first index. The first index may correspond to a first level of wear of a set of multiple indexed levels of wear for the memory device. The memory device may determine that a metric of the memory device satisfies the first level of wear and indicate, to the host device, that the first level of wear is satisfied. The host device may receive the indication that the first level of wear is satisfied and indicate, to the memory device, a second level of wear of the set of indexed levels of wear that is different than the first level of wear.

公开(公告)号：US20240345932A1

公开(公告)日：2024-10-17

申请号：US18630614

申请日：2024-04-09

Applicant: Micron Technology, Inc.

Inventor： Scott E. Schaefer ,  Aaron P. Boehm ,  Todd Jackson Plum ,  Mark D. Ingram ,  Scott D. Van De Graaff

IPC: G06F11/30

CPC classification number: G06F11/3034 ,  G06F11/3062 ,  G06F11/3075

Abstract: Methods, systems, and devices for memory device health monitoring logic are described. In accordance with examples as disclosed herein, a memory device may include health monitoring logic configured to monitor a degradation level of the memory device. Further, the health monitoring logic may include a self-check logic to monitor the degradation level of the health monitoring logic. Using the health monitoring logic, the memory device may evaluate and store a health state of the memory device, which may be used to flag a fault in the memory device, among other responsive operations. Additionally, using the self-check logic, the memory device may evaluate and store a health state of the health monitoring logic, which may be used to flag a fault of the previously evaluated health state of the memory device. Based on the self-check flag, a host device may halt or adjust the response operations associated with the memory device.

公开(公告)号：US20240320093A1

公开(公告)日：2024-09-26

申请号：US18680470

申请日：2024-05-31

Applicant: Micron Technology, Inc.

Inventor： Scott E. Schaefer ,  Aaron P. Boehm ,  Scott D. Van De Graaff ,  Mark D. Ingram ,  Todd Jackson Plum

IPC: G06F11/10 ,  G06F9/30 ,  G06F11/07 ,  G06F11/30

CPC classification number: G06F11/1068 ,  G06F9/30189 ,  G06F11/0772 ,  G06F11/3051

Abstract: Methods, systems, and devices for evaluation of memory device health monitoring logic are described. For example, a memory device may include health monitoring logic operable to activate certain internal health monitors of a set of multiple monitors and to communicate an output associated with the activated monitors. In a first mode of operation, the health monitoring logic may provide a single output that is generated from multiple outputs of the set of monitors. In a second mode of operation, the health monitoring logic may cycle through certain monitors (e.g., in a test mode), and may generate an output corresponding to respective active monitors as it cycles through the set of monitors. The health monitoring logic may communicate an output specific to each monitor to a host device such that the host device may evaluate an output from each monitor of the set of monitors.