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    TRACE DETECTION DEVICE
    2.
    发明公开
    TRACE DETECTION DEVICE 审中-公开

    公开(公告)号：US20230236150A1

    公开(公告)日：2023-07-27

    申请号：US17999201

    申请日：2021-05-14

    Applicant: Nuctech Company Limited ,  Tsinghua University

    Inventor： Qingjun ZHANG ,  Yuanjing LI ,  Zhiqiang CHEN ,  Jianmin LI ,  Weiping ZHU ,  Qiufeng MA ,  Biao CAO ,  Lili YAN ,  Ge LI ,  Nei YANG

    IPC: G01N27/622 ,  G01N30/20

    CPC classification number: G01N27/622 ,  G01N30/20 ,  G01N2030/025 ,  G01N2030/201

    Abstract: A trace detection device including: an ion mobility tube ; a sampling gas path module ; a sample injection gas path module configured to introduce a sample carrier gas containing a sample collected by the sampling gas path module toward the ion mobility tube; and a gas chromatography apparatus capable of pre-separating the sample carrier gas, so as to form a pre-separated sample carrier gas; wherein the sample injection gas path module is further configured to be capable of switching between a first mode and a second mode, in the first mode, the sample injection gas path module introduces the sample carrier gas into the ion mobility tube; and in the second mode, the sample injection gas path module introduces the sample carrier gas into the gas chromatography apparatus to pre-separate the sample carrier gas, and the pre-separated sample carrier gas is introduced into the ion mobility tube.

    FORK-ARM LIFT TRACTOR
    6.
    发明申请
    FORK-ARM LIFT TRACTOR 审中-公开

    公开(公告)号：US20190193691A1

    公开(公告)日：2019-06-27

    申请号：US16233398

    申请日：2018-12-27

    Applicant: TSINGHUA UNIVERSITY ,  Nuctech Company Limited

    Inventor： Yuan HE ,  Jianmin LI ,  Hongqi LI ,  Yulan LI ,  Qiangqiang WANG ,  Yuanjing LI ,  Zhiqiang CHEN ,  Li ZHANG

    IPC: B60S13/00

    CPC classification number: B60S13/00 ,  B60S5/00 ,  B62D49/02 ,  B62D49/0692

    Abstract: A fork-arm lift tractor includes a vehicle body, a supporting plate disposed above the vehicle body, a lifting device for driving the supporting plate to be lifted, a front and rear fork-arm assemblies, a front and rear fork-arm drive assemblies. The front fork-arm assembly includes two front fork-arms rotatably disposed at the supporting plate. The rear fork-arm assembly includes two rear fork-arms rotatably disposed at the supporting plate, and the front and rear fork-arms may be deployed or retracted from both sides of the supporting plate. The front fork-arm driving assembly includes a front transmission part, and a front power device disposed at the supporting plate and may drive the front transmission part to move horizontally linearly so as to rotate the two front fork-arms. The rear fork-arm driving assembly has almost the same structure of the front fork-arm driving assembly and is used to rotate the two rear fork-arms.

    METHOD AND APPARATUS FOR PROCESSING SIGNALS OF SEMICONDUCTOR DETECTOR
    10.
    发明申请
    METHOD AND APPARATUS FOR PROCESSING SIGNALS OF SEMICONDUCTOR DETECTOR 有权
    用于处理半导体检测器信号的方法和装置

    公开(公告)号：US20160018537A1

    公开(公告)日：2016-01-21

    申请号：US14800635

    申请日：2015-07-15

    Applicant: TSINGHUA UNIVERSITY ,  NUCTECH COMPANY LIMITED

    Inventor： Lan ZHANG ,  Yulan LI ,  Yuanjing LI ,  Jianqiang FU ,  Yingshuai DU ,  Wei ZHANG ,  Xuming MA ,  Jun LI

    IPC: G01T1/24 ,  H04N5/32

    CPC classification number: G01T1/247 ,  G01T1/241 ,  H04N5/32

    Abstract: The present invention provides a method and apparatus for processing signals of a semiconductor detector, including: acquiring a relationship of a time difference between anode and cathode signals of the semiconductor detector with an anode signal amplitude; obtaining an optimal data screening interval according to the relationship of the time difference between anode and cathode signals of the semiconductor detector with the anode signal amplitude, wherein the optimal data screening interval is an interval where the time difference between the anode and cathode signals is greater than 50 ns; and screening and processing the collected data according to the optimal data screening interval when the semiconductor detector collects data. The present invention better overcomes the inherent crystal defects of the detector, reduces the effect of background noise, increases the energy resolution of the cadmium zinc telluride detector under room temperature, and improves the peak-to-compton ratio.

    Abstract translation: 本发明提供了一种用于处理半导体检测器的信号的方法和装置，包括：用阳极信号振幅获取半导体检测器的阳极和阴极信号之间的时间差的关系; 根据半导体检测器的阳极和阴极信号的时间差与阳极信号幅度的关系获得最佳数据筛选间隔，其中最佳数据筛选间隔是阳极和阴极信号之间的时间差较大的间隔 超过50 ns; 并且当半导体检测器收集数据时，根据最佳数据筛选间隔筛选和处理收集的数据。 本发明更好地克服了检测器的固有晶体缺陷，降低了背景噪声的影响，提高了碲化锌碲化镉检测器在室温下的能量分辨率，提高了峰 - 峰比。

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