公开(公告)号：US20220036527A1

公开(公告)日：2022-02-03

申请号：US16944165

申请日：2020-07-31

Applicant: Novatek Microelectronics Corp.

Inventor： Chih-Yu Chu ,  Po-Yuan Hsieh ,  Chieh-En Lee ,  Chung-Hao Tien ,  Shih-Hsuan Chen

IPC: G06T7/00 ,  G06T7/11 ,  G06K9/62 ,  G06T5/20

Abstract: A method and an image processing device for mura detection on a display are proposed. The method includes the following steps. An original image of the display is received and segmented into region of interest (ROI) patches. A predetermined range of spatial frequency components are filtered out from the ROI patches to generate filtered ROI patches. A mura defect is identified from the display according to the filtered ROI patches and predetermined mura patterns.

公开(公告)号：US11676265B2

公开(公告)日：2023-06-13

申请号：US16944165

申请日：2020-07-31

Applicant: Novatek Microelectronics Corp.

Inventor： Chih-Yu Chu ,  Po-Yuan Hsieh ,  Chieh-En Lee ,  Chung-Hao Tien ,  Shih-Hsuan Chen

IPC: G06T5/20 ,  G06T7/00 ,  G06T7/11 ,  G06V10/25 ,  G06F18/22

CPC classification number: G06T7/001 ,  G06F18/22 ,  G06T5/20 ,  G06T7/11 ,  G06T2207/30168 ,  G06V10/25

Abstract: A method and an image processing device for mura detection on a display are proposed. The method includes the following steps. An original image of the display is received and segmented into region of interest (ROI) patches. A predetermined range of spatial frequency components are filtered out from the ROI patches to generate filtered ROI patches. A mura defect is identified from the display according to the filtered ROI patches and predetermined mura patterns.