Abstract:
An illumination assembly includes a light source, which is configured to emit optical radiation. A transparency containing a plurality of micro-lenses, which are arranged in a non-uniform pattern and are configured to focus the optical radiation to form, at a focal plane, respective focal spots in the non-uniform pattern. Optics are configured to project the non-uniform pattern of the focal spots from the focal plane onto an object.
Abstract:
A method for monitoring includes providing a device (64) including a first part (46) and a second part (72) and a movable joint (70) connecting the first part to the second part. An electrical characteristic of a conductive path (80) crossing the movable joint is measured, and a remedial action is initiated in response to detecting a change of the electrical characteristic.
Abstract:
Optical apparatus includes an image sensor and objective optics, which are configured to collect and focus optical radiation over a range of wavelengths along a common optical axis toward a plane of the image sensor. A dispersive element is positioned to spread the optical radiation collected by the objective optics so that different wavelengths in the range are focused along different, respective optical axes toward the plane.
Abstract:
Control apparatus includes an optical subsystem, which is configured to direct first light toward a scene that includes a hand of a user in proximity to a wall of a room and to receive the first light that is reflected from the scene, and to direct second light toward the wall so as to project an image of a control device onto the wall. A processor is configured to control the optical subsystem so as to generate, responsively to the received first light, a depth map of the scene, to process the depth map so as to detect a proximity of the hand to the wall in a location of the projected image, and to control electrical equipment in the room responsively to the proximity.
Abstract:
Sensing apparatus includes a transmitter, which emits a beam comprising optical pulses toward a scene, and a receiver, which receives reflections of the optical pulses and outputs electrical pulses in response thereto. Processing circuitry is coupled to the receiver so as to receive, in response to each of at least some of the optical pulses emitted by the transmitter, a first electrical pulse output by the receiver at a first time due to stray reflection within the apparatus and a second electrical pulse output by the receiver at a second time due to the beam reflected from the scene, and to generate a measure of a time of flight of the optical pulses to and from points in the scene by taking a difference between the respective first and second times of output of the first and second electrical pulses.
Abstract:
A method for fabrication of a device (206) from a wafer (170) of semiconductor material includes locally thinning the wafer in an area of the device to a predefined thickness by removing the semiconductor material from at least a first side of the wafer using a wet etching process, and etching through the thinned wafer in the area of the device so as to release a moving part (202) of the device. Other methods and systems for fabrication are also described.
Abstract:
An optoelectronic module includes a beam transmitter, which emits at least one beam of light along a beam axis, and a receiver, which senses the light received by the module along a collection axis of the receiver, which is parallel to the beam axis within the module. Beam-combining optics direct the beam and the received light so that the beam axis is aligned with the collection axis outside the module. The beam-combining optics include multiple faces, including at least a first face configured for internal reflection and a second face comprising a beamsplitter, which is intercepted by both the beam axis and the collection axis.
Abstract:
An illumination assembly includes a light source, which is configured to emit optical radiation. A transparency containing a plurality of micro-lenses, which are arranged in a non-uniform pattern and are configured to focus the optical radiation to form, at a focal plane, respective focal spots in the non-uniform pattern. Optics are configured to project the non-uniform pattern of the focal spots from the focal plane onto an object.
Abstract:
Scanning apparatus includes a transmitter, which is configured to emit a beam comprising pulses of light, and a scanning mirror, which is configured to scan the beam over a scene. A receiver is configured to receive the light reflected from the scene and to generate an output indicative of the pulses returned from the scene. A grating is formed on an optical surface in the apparatus and is configured to diffract a portion of the beam at a predetermined angle, so as to cause the diffracted portion to be returned from the scanning mirror to the receiver. A controller is coupled to process the output of the receiver so as to detect the diffracted portion and to monitor a scan of the mirror responsively thereto.
Abstract:
An optoelectronic module includes a beam transmitter, which emits at least one beam of light along a beam axis, and a receiver, which senses the light received by the module along a collection axis of the receiver, which is parallel to the beam axis within the module. Beam-combining optics direct the beam and the received light so that the beam axis is aligned with the collection axis outside the module. The beam-combining optics include multiple faces, including at least a first face configured for internal reflection and a second face comprising a beamsplitter, which is intercepted by both the beam axis and the collection axis.