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公开(公告)号:US09875765B2
公开(公告)日:2018-01-23
申请号:US15271359
申请日:2016-09-21
Applicant: SHOWA DENKO K.K.
Inventor: Koji Yukimatsu , Isao Murase , Kiminori Sugimoto , Tomoya Kobayashi
CPC classification number: G11B5/7315 , C22C21/04 , C22C21/08
Abstract: A base for a magnetic recording medium includes, a substrate made of an Al alloy, and a film made of a NiP-based alloy and provided on the substrate. The Al alloy of the substrate includes Mg in a range of 0.2 mass % to 6 mass %, Si in a range of 3 mass % to 17 mass %, Zn in a range of 0.05 mass % to 2 mass %, and Sr in a range of 0.001 mass % to 1 mass %. An average grain diameter of Si grains in an alloy structure of the substrate is 2 μm or less. The film has a thickness of 10 μm or greater. The substrate has an outer diameter of 53 mm or greater, a thickness of 0.9 mm or less, and a Young's modulus of 79 GPa or higher.
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公开(公告)号:US12134805B2
公开(公告)日:2024-11-05
申请号:US17603843
申请日:2020-03-11
Applicant: SHOWA DENKO K.K.
Inventor: Isao Murase
Abstract: An aluminum alloy member forms a fluoride film thereon, which does not form a black dot-shaped bulged portion and, therefore, has excellent smoothness and excellent corrosion resistance against a corrosive gas, plasma, and others. An aluminum alloy member for forming a fluoride film thereon, consists of: Si: 0.01 mass % to 0.3 mass %; Mg: 0.5 mass % to 5.0 mass %; Fe: 0.05 mass % to 0.5 mass %; Cu: 0.5 mass % or less; Mn: 0.30 mass % or less; Cr: 0.30 mass % or less, and the balance being Al and inevitable impurities, wherein when an average major diameter of Fe-based crystallized products in the aluminum alloy member is “D” (μm), and an average crystalline particle diameter in the aluminum alloy member is “Y” (μm), a relational expression: Log10 Y
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公开(公告)号:US10593359B2
公开(公告)日:2020-03-17
申请号:US15621319
申请日:2017-06-13
Applicant: SHOWA DENKO K.K.
Inventor: Isao Murase , Kiminori Sugimoto
Abstract: A magnetic recording medium substrate is provided in which a NiP type plating film is formed on a surface of an aluminum alloy substrate that includes Si in a range of 9.5 mass % or more and 11.0 mass % or less, Mn in a rage of 0.45 mass % or more and 0.90 mass % or less, Zn in a range of 0.32 mass % or more and 0.38 mass % or less, Sr in a range of 0.01 mass % or more and 0.05 mass % or less. In the alloy structure of the aluminum alloy substrate, an average particle diameter of Si particles is 2 μm or less, the film thickness of the NiP type plating film is 7 μm or more. An outer diameter of the magnetic recording medium substrate is 53 mm or more, the thickness is 0.9 mm or less, and the Young's modulus is 79 GPa or more.
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公开(公告)号:US12054811B2
公开(公告)日:2024-08-06
申请号:US17257677
申请日:2019-04-19
Applicant: SHOWA DENKO K.K.
Inventor: Isao Murase
Abstract: Provided is an aluminum alloy member for forming a fluoride film thereon, the fluoride film being excellent in smoothness without occurrence of a black dot-shaped bulged portion and excellent in corrosion resistance against corrosive gas and plasma, etc. The aluminum alloy member for forming a fluoride film thereon 1 for use in a semiconductor producing apparatus consists of Si: 0.3 mass % to 0.8 mass %; Mg: 0.5 mass % to 5.0 mass %; Fe: 0.05 mass % to 0.5 mass %; Cu: 0 mass % or more and 0.5 mass % or less; Mn: 0 mass % or more and 0.30 mass % or less; Cr: 0 mass % or more and 0.30 mass % or less 0.5 mass % or less; and the balance being Al and inevitable impurities. When an average major diameter of a Fe-based crystallized product in the aluminum alloy member is D (μm), and an average crystalline particle diameter in the aluminum alloy member is Y (μm), a relation expression of log10 Y←0.320D+4.60 is satisfied. A fluoride film 2 is formed on at least a part of a surface of the aluminum alloy member 1 for forming a fluoride film thereon.
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公开(公告)号:US10573342B2
公开(公告)日:2020-02-25
申请号:US15866831
申请日:2018-01-10
Applicant: SHOWA DENKO K.K.
Inventor: Isao Murase , Kiminori Sugimoto
Abstract: A base for a magnetic recording medium, includes a substrate made of an Al alloy and having a surface, and a film made of a NiP-based alloy and plated on the surface of the substrate. The film has a thickness of 7 μm or greater, and a ratio E/ρ is 29 or greater, where E [GPa] denotes the Young's modulus of the substrate, and ρ [g/cm3] denotes a density of the substrate.
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