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公开(公告)号:US12288753B2
公开(公告)日:2025-04-29
申请号:US17369654
申请日:2021-07-07
Applicant: STATS ChipPAC Pte. Ltd.
Inventor: ChangOh Kim , KyoungHee Park , KyoWang Koo , SungWon Cho
IPC: H01L23/552 , H01L21/56 , H01L21/78 , H01L23/04 , H01L23/31 , H01L25/00 , H01L25/065
Abstract: A semiconductor device has a substrate. A lid is disposed over the substrate. An encapsulant is deposited over the substrate. A film mask is disposed over the encapsulant with the lid exposed from the film mask and encapsulant. A conductive layer is formed over the film mask, encapsulant, and lid. The film mask is removed after forming the conductive layer.
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公开(公告)号:US11715703B2
公开(公告)日:2023-08-01
申请号:US17660093
申请日:2022-04-21
Applicant: STATS ChipPAC Pte. Ltd.
Inventor: SungWon Cho , ChangOh Kim , Il Kwon Shim , InSang Yoon , KyoungHee Park
IPC: H01L23/552 , H01L23/31 , H01L23/367 , H01L23/498 , H01L23/50 , H01L23/522 , H01L23/00 , H01L23/36 , H01L23/60 , H01L27/02
CPC classification number: H01L23/552 , H01L23/3107 , H01L23/36 , H01L23/367 , H01L23/49816 , H01L23/50 , H01L23/5225 , H01L23/562 , H01L23/60 , H01L24/26 , H01L27/0248 , H01L2924/181
Abstract: A semiconductor device has a substrate and a semiconductor die disposed over the substrate. An encapsulant is deposited over the semiconductor die and substrate with a surface of the semiconductor die exposed from the encapsulant. A first shielding layer is formed over the semiconductor die. In some embodiments, the first shielding layer includes a stainless steel layer in contact with the surface of the semiconductor die and a copper layer formed over the stainless steel layer. The first shielding layer may further include a protective layer formed over the copper layer. One embodiment has a heatsink bonded to the semiconductor die through a solder layer. A second shielding layer can be formed over a side surface of the semiconductor die.
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公开(公告)号:US11688697B2
公开(公告)日:2023-06-27
申请号:US17662977
申请日:2022-05-11
Applicant: STATS ChipPAC Pte. Ltd.
Inventor: Dong Won Son , Byeonghoon Kim , Sung Ho Choi , Sung Jae Lim , Jong Ho Shin , SungWon Cho , ChangOh Kim , KyoungHee Park
IPC: H01L23/552 , H01L23/31 , H01L23/367 , H01L23/498 , H01L23/00
CPC classification number: H01L23/552 , H01L23/3107 , H01L23/3128 , H01L23/367 , H01L23/49816 , H01L23/562 , H01L24/14 , H01L2224/32225 , H01L2224/73204 , H01L2924/181 , H01L2924/3025
Abstract: A semiconductor device has a substrate and a semiconductor die disposed over the substrate. An encapsulant is deposited over the semiconductor die and substrate with a surface of the semiconductor die exposed from the encapsulant. A first shielding layer is formed over the semiconductor die. In some embodiments, the first shielding layer includes a stainless steel layer in contact with the surface of the semiconductor die and a copper layer formed over the stainless steel layer. The first shielding layer may further include a protective layer formed over the copper layer. One embodiment has a heatsink bonded to the semiconductor die through a solder layer. A second shielding layer can be formed over a side surface of the semiconductor die.
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公开(公告)号:US11444035B2
公开(公告)日:2022-09-13
申请号:US16991370
申请日:2020-08-12
Applicant: STATS ChipPAC Pte. Ltd.
Inventor: ChangOh Kim , KyoWang Koo , SungWon Cho , BongWoo Choi , JiWon Lee
Abstract: A semiconductor device has a substrate. A first component and second component are disposed over the substrate. The first component includes an antenna. A lid is disposed over the substrate between the first component and second component. An encapsulant is deposited over the substrate and lid. A conductive layer is formed over the encapsulant and in contact with the lid. A first portion of the conductive layer over the first component is removed using laser ablation.
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公开(公告)号:US11355452B2
公开(公告)日:2022-06-07
申请号:US17068482
申请日:2020-10-12
Applicant: STATS ChipPAC Pte. Ltd.
Inventor: Dong Won Son , Byeonghoon Kim , Sung Ho Choi , Sung Jae Lim , Jong Ho Shin , SungWon Cho , ChangOh Kim , KyoungHee Park
IPC: H01L23/34 , H01L23/28 , H01L21/00 , H05K7/20 , H01L23/552 , H01L23/31 , H01L23/00 , H01L23/498 , H01L23/367
Abstract: A semiconductor device has a substrate and a semiconductor die disposed over the substrate. An encapsulant is deposited over the semiconductor die and substrate with a surface of the semiconductor die exposed from the encapsulant. A first shielding layer is formed over the semiconductor die. In some embodiments, the first shielding layer includes a stainless steel layer in contact with the surface of the semiconductor die and a copper layer formed over the stainless steel layer. The first shielding layer may further include a protective layer formed over the copper layer. One embodiment has a heatsink bonded to the semiconductor die through a solder layer. A second shielding layer can be formed over a side surface of the semiconductor die.
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公开(公告)号:US20220157739A1
公开(公告)日:2022-05-19
申请号:US16950295
申请日:2020-11-17
Applicant: STATS ChipPAC Pte. Ltd.
Inventor: HunTeak Lee , KyungHwan Kim , HeeSoo Lee , ChangOh Kim , KyoungHee Park , JinHee Jung , OMin Kwon , JiWon Lee , YuJeong Jang
IPC: H01L23/552 , H01L21/56
Abstract: A semiconductor package has a substrate, a first component disposed over the substrate, an encapsulant deposited over the first component, and a second component disposed over the substrate outside the encapsulant. A metal mask is disposed over the second component. A shielding layer is formed over the semiconductor package. The metal mask after forming the shielding layer. The shielding layer is optionally formed on a contact pad of the substrate while a conic area above the contact pad that extends 40 degrees from vertical remains free of the encapsulant and metal mask while forming the shielding layer. Surfaces of the metal mask and encapsulant oriented toward the contact pad can be sloped. The metal mask can be disposed and removed using a pick-and-place machine.
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公开(公告)号:US10804217B2
公开(公告)日:2020-10-13
申请号:US16529486
申请日:2019-08-01
Applicant: STATS ChipPAC Pte. Ltd.
Inventor: SungWon Cho , ChangOh Kim , Il Kwon Shim , InSang Yoon , KyoungHee Park
IPC: H01L27/14 , H01L21/00 , H01L23/552 , H01L23/00 , H01L23/36 , H01L23/522 , H01L23/50 , H01L23/60 , H01L23/498 , H01L27/02 , H01L23/31
Abstract: A semiconductor device has a substrate and a semiconductor die disposed over the substrate. An encapsulant is deposited over the semiconductor die and substrate with a surface of the semiconductor die exposed from the encapsulant. A first shielding layer is formed over the semiconductor die. In some embodiments, the first shielding layer includes a stainless steel layer in contact with the surface of the semiconductor die and a copper layer formed over the stainless steel layer. The first shielding layer may further include a protective layer formed over the copper layer. One embodiment has a heatsink bonded to the semiconductor die through a solder layer. A second shielding layer can be formed over a side surface of the semiconductor die.
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8.
公开(公告)号:US12255152B2
公开(公告)日:2025-03-18
申请号:US18359688
申请日:2023-07-26
Applicant: STATS ChipPAC Pte. Ltd.
Inventor: ChangOh Kim , JinHee Jung , JiWon Lee , YuJeong Jang
IPC: H01L23/552 , H01L21/3213 , H01L23/31 , H01L25/065
Abstract: A semiconductor device is formed by providing a semiconductor package including a shielding layer and forming a slot in the shielding layer using a laser. The laser is turned on and exposed to the shielding layer with a center of the laser disposed over a first point of the shielding layer. The laser is moved in a loop while the laser remains on and exposed to the shielding layer. Exposure of the laser to the shielding layer is stopped when the center of the laser is disposed over a second point of the shielding layer. A distance between the first point and the second point is approximately equal to a radius of the laser.
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公开(公告)号:US11990424B2
公开(公告)日:2024-05-21
申请号:US18303308
申请日:2023-04-19
Applicant: STATS ChipPAC Pte. Ltd.
Inventor: HunTeak Lee , KyungHwan Kim , HeeSoo Lee , ChangOh Kim , KyoungHee Park , JinHee Jung , OMin Kwon , JiWon Lee , YuJeong Jang
IPC: H01L23/552 , H01L21/56 , H01L23/498
CPC classification number: H01L23/552 , H01L21/56 , H01L21/561 , H01L21/568 , H01L23/49822
Abstract: A semiconductor package has a substrate, a first component disposed over the substrate, an encapsulant deposited over the first component, and a second component disposed over the substrate outside the encapsulant. A metal mask is disposed over the second component. A shielding layer is formed over the semiconductor package. The metal mask after forming the shielding layer. The shielding layer is optionally formed on a contact pad of the substrate while a conic area above the contact pad that extends 40 degrees from vertical remains free of the encapsulant and metal mask while forming the shielding layer. Surfaces of the metal mask and encapsulant oriented toward the contact pad can be sloped. The metal mask can be disposed and removed using a pick-and-place machine.
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公开(公告)号:US11935840B2
公开(公告)日:2024-03-19
申请号:US17817461
申请日:2022-08-04
Applicant: STATS ChipPAC Pte. Ltd.
Inventor: ChangOh Kim , KyoWang Koo , SungWon Cho , BongWoo Choi , JiWon Lee
CPC classification number: H01L23/552 , H01L21/56 , H01L23/28 , H01L23/66 , H01L24/94 , H01L25/50 , H01L2021/60112
Abstract: A semiconductor device has a substrate. A first component and second component are disposed over the substrate. The first component includes an antenna. A lid is disposed over the substrate between the first component and second component. An encapsulant is deposited over the substrate and lid. A conductive layer is formed over the encapsulant and in contact with the lid. A first portion of the conductive layer over the first component is removed using laser ablation.
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