公开(公告)号：US09726498B2

公开(公告)日：2017-08-08

申请号：US14090966

申请日：2013-11-26

Applicant: Sensor Platforms, Inc.

Inventor： Deborah Meduna ,  Dev Rajnarayan ,  James V. Steele ,  Ian Chen

IPC: G01C21/16 ,  G06F1/32 ,  G01C21/34

CPC classification number: G01C21/165 ,  G01C21/3423 ,  G06F1/3206 ,  G06F1/324 ,  Y02D10/126

Abstract: A processing apparatus including one or more processors and memory obtains one or more sensor measurements generated by one or more monitoring sensors of one or more devices, including one or more monitoring sensor measurements from a respective monitoring sensor of a respective device and obtains one or more system signals including a respective system signal corresponding to current operation of the respective device. The processing apparatus determines device context information for the respective device based on the one or more sensor measurements and the one or more system signals and adjusts operation of the device in accordance with the device context information.

公开(公告)号：US08775128B2

公开(公告)日：2014-07-08

申请号：US13939126

申请日：2013-07-10

Applicant: Sensor Platforms, Inc.

Inventor： Deborah Meduna ,  Tom Waite ,  Dev Rajnarayan

IPC: G21C17/00 ,  G06F17/40

CPC classification number: G06F3/011 ,  A61B5/1123 ,  G06F3/017 ,  G06F3/0346 ,  G06F17/00 ,  G06K9/00335 ,  G06K9/00342

Abstract: A processing apparatus including one or more processors and memory receives sensor measurements generated by one or more sensors of one or more devices, pre-classifies the sensor measurements as belonging to one of a plurality of pre-classifications, and selects one or more feature types to extract from the sensor measurements based at least in part on the pre-classification of the sensor measurements. The processing apparatus also extracts features of the one or more selected feature types from the sensor measurements and determines a state of a respective device of the one or more devices in accordance with a classification of the sensor measurements determined based on the one or more features extracted from the sensor measurements.

Abstract translation: 包括一个或多个处理器和存储器的处理设备接收由一个或多个设备的一个或多个传感器产生的传感器测量，将传感器测量值预先分类为属于多个预分类之一，并且选择一个或多个特征类型 至少部分地基于传感器测量的预分类从传感器测量中提取。 处理设备还从传感器测量中提取一个或多个所选择的特征类型的特征，并且根据基于提取的一个或多个特征确定的传感器测量的分类来确定一个或多个设备的相应设备的状态 从传感器测量。

公开(公告)号：US20140149060A1

公开(公告)日：2014-05-29

申请号：US14090966

申请日：2013-11-26

Applicant: Sensor Platforms, Inc.

Inventor： Deborah Meduna ,  Dev Rajnarayan ,  James V. Steele ,  Ian Chen

IPC: G01C25/00

CPC classification number: G01C21/165 ,  G01C21/3423 ,  G06F1/3206 ,  G06F1/324 ,  Y02D10/126

Abstract: A processing apparatus including one or more processors and memory obtains one or more sensor measurements generated by one or more monitoring sensors of one or more devices, including one or more monitoring sensor measurements from a respective monitoring sensor of a respective device and obtains one or more system signals including a respective system signal corresponding to current operation of the respective device. The processing apparatus determines device context information for the respective device based on the one or more sensor measurements and the one or more system signals and adjusts operation of the device in accordance with the device context information.

Abstract translation: 一种包括一个或多个处理器和存储器的处理设备获得由一个或多个设备的一个或多个监测传感器产生的一个或多个传感器测量值，包括来自相应设备的相应监测传感器的一个或多个监测传感器测量值，并获得一个或多个 系统信号包括对应于相应设备的当前操作的相应系统信号。 处理装置基于一个或多个传感器测量值和一个或多个系统信号来确定各个设备的设备上下文信息，并根据设备上下文信息来调整设备的操作。

公开(公告)号：US20150012248A1

公开(公告)日：2015-01-08

申请号：US14321707

申请日：2014-07-01

Applicant: Sensor Platforms, Inc.

Inventor： Deborah Meduna ,  Tom Waite ,  Dev Rajnarayan

IPC: G06F3/01

CPC classification number: G06F3/011 ,  A61B5/1123 ,  G06F3/017 ,  G06F3/0346 ,  G06F17/00 ,  G06K9/00335 ,  G06K9/00342

Abstract: A processing apparatus including one or more processors and memory receives sensor measurements generated by one or more sensors of one or more devices, pre-classifies the sensor measurements as belonging to one of a plurality of pre-classifications, and selects one or more feature types to extract from the sensor measurements based at least in part on the pre-classification of the sensor measurements. The processing apparatus also extracts features of the one or more selected feature types from the sensor measurements and determines a state of a respective device of the one or more devices in accordance with a classification of the sensor measurements determined based on the one or more features extracted from the sensor measurements.

Abstract translation: 包括一个或多个处理器和存储器的处理设备接收由一个或多个设备的一个或多个传感器产生的传感器测量，将传感器测量值预先分类为属于多个预分类之一，并且选择一个或多个特征类型 至少部分地基于传感器测量的预分类从传感器测量中提取。 处理设备还从传感器测量中提取一个或多个所选择的特征类型的特征，并且根据基于提取的一个或多个特征确定的传感器测量的分类来确定一个或多个设备的相应设备的状态 从传感器测量。

公开(公告)号：US20140129178A1

公开(公告)日：2014-05-08

申请号：US13939126

申请日：2013-07-10

Applicant: Sensor Platforms, Inc.

Inventor： Deborah Meduna ,  Tom Waite ,  Dev Rajnarayan

IPC: G06F17/00

CPC classification number: G06F3/011 ,  A61B5/1123 ,  G06F3/017 ,  G06F3/0346 ,  G06F17/00 ,  G06K9/00335 ,  G06K9/00342

Abstract: A processing apparatus including one or more processors and memory receives sensor measurements generated by one or more sensors of one or more devices, pre-classifies the sensor measurements as belonging to one of a plurality of pre-classifications, and selects one or more feature types to extract from the sensor measurements based at least in part on the pre-classification of the sensor measurements. The processing apparatus also extracts features of the one or more selected feature types from the sensor measurements and determines a state of a respective device of the one or more devices in accordance with a classification of the sensor measurements determined based on the one or more features extracted from the sensor measurements.

Abstract translation: 包括一个或多个处理器和存储器的处理设备接收由一个或多个设备的一个或多个传感器产生的传感器测量，将传感器测量值预先分类为属于多个预分类之一，并且选择一个或多个特征类型 至少部分地基于传感器测量的预分类从传感器测量中提取。 处理设备还从传感器测量中提取一个或多个所选择的特征类型的特征，并且根据基于提取的一个或多个特征确定的传感器测量的分类来确定一个或多个设备的相应设备的状态 从传感器测量。