公开(公告)号：US10043757B2

公开(公告)日：2018-08-07

申请号：US14708249

申请日：2015-05-10

Applicant: Siliconware Precision Industries Co., Ltd.

Inventor： Yu-Cheng Pai ,  Wei-Chung Hsiao ,  Shih-Chao Chiu ,  Chun-Hsien Lin ,  Ming-Chen Sun ,  Tzu-Chieh Shen ,  Chia-Cheng Chen

IPC: H01L29/40 ,  H01L23/538 ,  H01L23/00 ,  H01L21/56 ,  H01L23/31

Abstract: A semiconductor package structure and a method of fabricating the same are provided. The semiconductor package structure includes a package body having opposing first and second surfaces; a plurality of first conductive pads and a plurality of second conductive pads formed on the first surface of the package body; a semiconductor component embedded in the package body and electrically connected to the first conductive pads; and a plurality of conductive elements embedded in the package body, each of the conductive elements having a first end electrically connected to a corresponding one of the second conductive pads and a second end opposing the first end and exposed from the second surface of the package body. Since the semiconductor component is embedded in the package body, the thickness of the semiconductor package structure is reduced.

公开(公告)号：US20170236725A1

公开(公告)日：2017-08-17

申请号：US15466063

申请日：2017-03-22

Applicant: Siliconware Precision Industries Co., Ltd.

Inventor： Ming-Chen Sun ,  Chun-Hsien Lin ,  Tzu-Chieh Shen ,  Shih-Chao Chiu ,  Yu-Cheng Pai

IPC: H01L21/48 ,  H01L23/00 ,  H01L23/498

CPC classification number: H01L21/4853 ,  H01L21/486 ,  H01L21/563 ,  H01L23/3114 ,  H01L23/3121 ,  H01L23/49811 ,  H01L23/49827 ,  H01L23/49838 ,  H01L24/16 ,  H01L24/17 ,  H01L24/81 ,  H01L2224/0401 ,  H01L2224/13082 ,  H01L2224/131 ,  H01L2224/16238 ,  H01L2224/81191 ,  H01L2224/81815 ,  H01L2224/8182 ,  H01L2924/15313 ,  H05K1/111 ,  H05K3/20 ,  H05K3/205 ,  H05K3/428 ,  H05K2201/0376 ,  H05K2201/09481 ,  H05K2201/09563 ,  H05K2201/10674 ,  H01L2924/00014 ,  H01L2924/014

Abstract: A package substrate and a semiconductor package are provided. The package substrate includes an insulating layer having opposing first and second surfaces; a first wiring layer formed in the insulating layer, exposed from the first surface of the insulating layer, and having a plurality of first conductive pads; a second wiring layer formed in the insulating layer, exposed from the second surface, and having a plurality of second conductive pads; a third wiring layer formed on the first surface and electrically connected with the first wiring layer; a plurality of first metal bumps formed on the first conductive pads corresponding; and at least one conductive via vertically embedded in the insulating layer and electrically connected to the second and third wiring layers. Therefore, the surfaces of first conductive pads are reduced, and the non-wetting between the first conductive pads and the solder materials formed on conductive bumps is avoided.

公开(公告)号：US20160079151A1

公开(公告)日：2016-03-17

申请号：US14692769

申请日：2015-04-22

Applicant: Siliconware Precision Industries Co., Ltd.

Inventor： Shih-Chao Chiu ,  Chun-Hsien Lin ,  Yu-Cheng Pai ,  Wei-Chung Hsiao ,  Ming-Chen Sun ,  Tzu-Chieh Shen ,  Chia-Cheng Chen

IPC: H01L23/498 ,  H01L21/48 ,  H01L21/683 ,  H01L23/31 ,  H05K1/18 ,  H05K3/00 ,  H01L23/538 ,  H01L21/56 ,  H01L23/00 ,  H05K3/32

CPC classification number: H01L23/49838 ,  H01L21/6835 ,  H01L23/3121 ,  H01L23/49822 ,  H01L23/49827 ,  H01L23/5389 ,  H01L24/13 ,  H01L24/16 ,  H01L24/29 ,  H01L24/32 ,  H01L24/81 ,  H01L24/83 ,  H01L2221/68318 ,  H01L2221/68345 ,  H01L2224/131 ,  H01L2224/13147 ,  H01L2224/16227 ,  H01L2224/16237 ,  H01L2224/26175 ,  H01L2224/2919 ,  H01L2224/32058 ,  H01L2224/32105 ,  H01L2224/32106 ,  H01L2224/32237 ,  H01L2224/73204 ,  H01L2224/81801 ,  H01L2224/83101 ,  H01L2924/15313 ,  H01L2924/18161 ,  H01L2924/19041 ,  H01L2924/19103 ,  H01L2924/19104 ,  H05K1/0231 ,  H05K1/185 ,  H05K1/186 ,  H05K1/189 ,  H05K3/0026 ,  H05K3/007 ,  H05K3/108 ,  H05K3/32 ,  H05K3/4682 ,  H05K2201/0376 ,  H05K2201/10515 ,  H05K2201/1053 ,  H05K2201/10674 ,  H05K2201/10977 ,  H01L2924/014 ,  H01L2924/00014 ,  H01L2924/0665

Abstract: The present invention provides a package structure with an embedded electronic component and a method of fabricating the package structure. The method includes: forming a first wiring layer on a carrier; removing the carrier and forming the first wiring layer on a bonding carrier; disposing an electronic component on the first wiring layer; forming an encapsulating layer, a second wiring layer and an insulating layer on the first wiring layer; disposing a chip on the electronic component and the second wiring layer; and forming a covering layer that covers the chip. The present invention can effectively reduce the thickness of the package structure and the electronic component without using adhesives.

Abstract translation: 本发明提供一种具有嵌入式电子部件的封装结构和制造封装结构的方法。 该方法包括：在载体上形成第一布线层; 移除载体并在键合载体上形成第一布线层; 在第一布线层上设置电子部件; 在所述第一布线层上形成封装层，第二布线层和绝缘层; 在所述电子部件和所述第二布线层上设置芯片; 并形成覆盖芯片的覆盖层。 本发明可以有效地减少包装结构和电子部件的厚度而不使用粘合剂。

公开(公告)号：US20150333029A1

公开(公告)日：2015-11-19

申请号：US14459713

申请日：2014-08-14

Applicant: Siliconware Precision Industries Co., Ltd.

Inventor： Yu-cheng Pai ,  Chun- Hsien Lin ,  Shih-Chao Chiu ,  Wei-Chung Hsiao ,  Ming-Chen Sun ,  Tzu-Chieh Shen ,  Chia-Cheng Chen

IPC: H01L23/00 ,  H01L23/48

CPC classification number: H01L21/486 ,  H01L21/4853 ,  H01L23/481 ,  H01L23/49811 ,  H01L23/49827 ,  H01L24/03 ,  H01L24/09 ,  H01L24/11 ,  H01L24/17 ,  H01L2224/02185 ,  H01L2224/0219 ,  H01L2924/0002

Abstract: A package substrate and a method of fabricating the same are provided. The method includes providing a substrate body having a first surface, a second surface opposing the first surface, a plurality of first electrical connecting pads disposed on the first surface; mounting a metal board on the first electrical connecting pads; and patterning the metal board so as to define a plurality of metal pillars corresponding to the first electrical connecting pads. Therefore, drawbacks of raw edges and unequal heights of the metal pillars can be obviated.

Abstract translation: 提供封装基板及其制造方法。 该方法包括提供具有第一表面，与第一表面相对的第二表面的衬底主体，设置在第一表面上的多个第一电连接焊盘; 将金属板安装在第一电连接垫上; 以及图案化所述金属板以限定对应于所述第一电连接焊盘的多个金属柱。 因此，可以消除金属柱的原始边缘和不等高度的缺点。

公开(公告)号：US09082723B2

公开(公告)日：2015-07-14

申请号：US14143700

申请日：2013-12-30

Applicant: Siliconware Precision Industries Co., Ltd

Inventor： Tzu-Chieh Chen ,  Shih-Chao Chiu ,  Chia-Cheng Chen

IPC: H01L23/00 ,  H01L21/768 ,  H01L23/522

CPC classification number: H01L24/32 ,  H01L21/4857 ,  H01L21/568 ,  H01L21/6835 ,  H01L21/768 ,  H01L23/49822 ,  H01L23/49827 ,  H01L23/5226 ,  H01L23/5389 ,  H01L24/19 ,  H01L24/20 ,  H01L24/27 ,  H01L2221/68345 ,  H01L2224/04105 ,  H01L2224/16245 ,  H01L2224/73259 ,  H01L2224/81005 ,  H01L2224/92224 ,  H01L2924/12042 ,  H01L2924/15153 ,  H01L2924/00

Abstract: A semiconductor package is provided, which includes: a first dielectric layer having opposite first and second surfaces and a cavity penetrating the first and second surfaces; a first circuit layer embedded in the first dielectric layer and exposed from the first surface of the first dielectric layer; at least an adhesive member formed in the cavity and adjacent to the first surface of the first dielectric layer; an electronic element disposed on the adhesive member; a second dielectric layer formed on the second surface of the first dielectric layer and in the cavity to encapsulate the adhesive member and the electronic element; a second circuit layer formed on the second dielectric layer; and a plurality of conductive vias formed in the second dielectric layer for electrically connecting the second circuit layer and the electronic element, thereby reducing the package size and cost and increasing the wiring space and flexibility.

Abstract translation: 提供一种半导体封装，其包括：具有相对的第一和第二表面的第一介电层和穿透第一表面和第二表面的空腔; 第一电路层，其被嵌入在所述第一电介质层中并从所述第一介电层的所述第一表面露出; 至少形成在所述空腔中并且与所述第一介电层的所述第一表面相邻的粘合构件; 设置在所述粘合构件上的电子元件; 第二电介质层，形成在所述第一介电层的所述第二表面上并且在所述空腔中，以封装所述粘合剂构件和所述电子元件; 形成在所述第二电介质层上的第二电路层; 以及形成在第二电介质层中的多个导电通孔，用于电连接第二电路层和电子元件，由此减小封装尺寸和成本并增加布线空间和柔性。

公开(公告)号：US20150102484A1

公开(公告)日：2015-04-16

申请号：US14136238

申请日：2013-12-20

Applicant: SILICONWARE PRECISION INDUSTRIES CO., LTD

Inventor： Chia-Cheng Chen ,  Ming-Chen Sun ,  Tzu-Chieh Shen ,  Liang-yi Hung ,  Wei-chung Hsiao ,  Yu-cheng Pai ,  Shih-Chao Chiu ,  Don-Son Jiang ,  Yi-Feng Chang ,  Lung-Yuan Wang

IPC: H01L23/00 ,  H01L23/31 ,  H01L23/535

CPC classification number: H01L25/105 ,  H01L23/13 ,  H01L23/3121 ,  H01L23/3135 ,  H01L23/49822 ,  H01L23/49833 ,  H01L23/5384 ,  H01L23/5385 ,  H01L23/5389 ,  H01L24/13 ,  H01L24/16 ,  H01L24/48 ,  H01L2224/131 ,  H01L2224/16227 ,  H01L2224/48227 ,  H01L2224/73204 ,  H01L2225/1011 ,  H01L2225/1058 ,  H01L2924/00014 ,  H01L2924/12042 ,  H01L2924/181 ,  H05K1/181 ,  H05K1/183 ,  H05K3/284 ,  H05K2201/10515 ,  H05K2201/10674 ,  H01L2924/00 ,  H01L2924/014 ,  H01L2224/45099 ,  H01L2924/00012

Abstract: A package structure is disclosed, which includes: a first substrate; a build-up layer formed on and electrically connected to the first substrate and having a cavity; at least an electronic element disposed in the cavity and electrically connected to the first substrate; a stack member disposed on the build-up layer so as to be stacked on the first substrate; and an encapsulant formed between the build-up layer and the stack member. The build-up layer facilitates to achieve a stand-off effect and prevent solder bridging.

Abstract translation: 公开了一种封装结构，其包括：第一基板; 形成在第一基板上并电连接到第一基板并具有空腔的积聚层; 至少电子元件设置在所述空腔中并电连接到所述第一基板; 堆叠构件，其设置在堆积层上以堆叠在第一基板上; 以及形成在堆积层和堆叠构件之间的密封剂。 堆积层有助于实现隔离效应并防止焊料桥接。

公开(公告)号：US20180247891A1

公开(公告)日：2018-08-30

申请号：US15968093

申请日：2018-05-01

Applicant: Siliconware Precision Industries Co., Ltd.

Inventor： Shih-Chao Chiu ,  Chun-Hsien Lin ,  Ming-Chen Sun ,  Yu-Cheng Pai ,  Tzu-Chieh Shen

IPC: H01L23/522

CPC classification number: H01L23/5226 ,  H01L23/3121 ,  H01L23/49822 ,  H01L23/50 ,  H01L23/5389 ,  H01L24/13 ,  H01L24/16 ,  H01L24/17 ,  H01L24/32 ,  H01L24/73 ,  H01L24/92 ,  H01L25/0657 ,  H01L25/16 ,  H01L25/50 ,  H01L2224/131 ,  H01L2224/13147 ,  H01L2224/16145 ,  H01L2224/16227 ,  H01L2224/16235 ,  H01L2224/16265 ,  H01L2224/1703 ,  H01L2224/32225 ,  H01L2224/73253 ,  H01L2224/92242 ,  H01L2225/06513 ,  H01L2225/06517 ,  H01L2924/15153 ,  H01L2924/15313 ,  H01L2924/1579 ,  H01L2924/19041 ,  H01L2924/19042 ,  H01L2924/19043 ,  H01L2924/19103 ,  H01L2924/19104 ,  H01L2924/014

Abstract: A method of fabricating a semiconductor package is provided, including providing a carrier provided having a circuit layer and a blocking member, forming on the carrier an encapsulating layer having a first surface and a second surface opposing the first surface and encapsulating the circuit layer and the blocking member, with the first surface coupled with the carrier, and removing the carrier and the blocking member to form in the encapsulating layer via the first surface thereof an opening for an electronic component to be received therein. Before the electronic component is disposed in the opening, the circuit layer and the electronic component can be tested in advance, in order to retire the defectives. Therefore, as a defective electronic component is prevented from being disposed in the opening, no defective semiconductor package will be fabricated.

公开(公告)号：US20170309537A1

公开(公告)日：2017-10-26

申请号：US15648089

申请日：2017-07-12

Applicant: Siliconware Precision Industries Co., Ltd.

Inventor： Shih-Chao Chiu ,  Chun-Hsien Lin ,  Yu-Cheng Pai ,  Wei-Chung Hsiao ,  Ming-Chen Sun ,  Tzu-Chieh Shen ,  Chia-Cheng Chen

IPC: H01L23/31 ,  H01L23/498 ,  H01L21/56 ,  H01L21/48

CPC classification number: H01L23/49861 ,  H01L21/4846 ,  H01L23/3128 ,  H01L23/49811 ,  H01L23/49827 ,  H01L2224/73204 ,  H01L2224/92125 ,  H01L2924/181 ,  H01L2924/00012

Abstract: A single-layer wiring package substrate and a method of fabricating the same are provided, the method including: forming on a carrier a wiring layer having a first surface and a second surface opposing the first surface and being in contact with the carrier; forming on the carrier and on the wiring layer a dielectric body that has a first side having a first opening, from which a portion of the wiring layer is exposed, and a second side opposing the first side and disposed at the same side as the second surface of the wiring layer; and removing the carrier, with the second side of the dielectric body and the second surface of the wiring layer exposed. Therefore, a coreless package substrate is fabricated, and the overall thickness and cost of the substrate are reduced.

公开(公告)号：US09716060B2

公开(公告)日：2017-07-25

申请号：US14692769

申请日：2015-04-22

Applicant: Siliconware Precision Industries Co., Ltd.

Inventor： Shih-Chao Chiu ,  Chun-Hsien Lin ,  Yu-Cheng Pai ,  Wei-Chung Hsiao ,  Ming-Chen Sun ,  Tzu-Chieh Shen ,  Chia-Cheng Chen

IPC: H01L23/498 ,  H05K3/00 ,  H05K3/32 ,  H05K1/18 ,  H01L23/538 ,  H01L23/00 ,  H05K1/02 ,  H05K3/10 ,  H05K3/46 ,  H01L23/31 ,  H01L21/683

CPC classification number: H01L23/49838 ,  H01L21/6835 ,  H01L23/3121 ,  H01L23/49822 ,  H01L23/49827 ,  H01L23/5389 ,  H01L24/13 ,  H01L24/16 ,  H01L24/29 ,  H01L24/32 ,  H01L24/81 ,  H01L24/83 ,  H01L2221/68318 ,  H01L2221/68345 ,  H01L2224/131 ,  H01L2224/13147 ,  H01L2224/16227 ,  H01L2224/16237 ,  H01L2224/26175 ,  H01L2224/2919 ,  H01L2224/32058 ,  H01L2224/32105 ,  H01L2224/32106 ,  H01L2224/32237 ,  H01L2224/73204 ,  H01L2224/81801 ,  H01L2224/83101 ,  H01L2924/15313 ,  H01L2924/18161 ,  H01L2924/19041 ,  H01L2924/19103 ,  H01L2924/19104 ,  H05K1/0231 ,  H05K1/185 ,  H05K1/186 ,  H05K1/189 ,  H05K3/0026 ,  H05K3/007 ,  H05K3/108 ,  H05K3/32 ,  H05K3/4682 ,  H05K2201/0376 ,  H05K2201/10515 ,  H05K2201/1053 ,  H05K2201/10674 ,  H05K2201/10977 ,  H01L2924/014 ,  H01L2924/00014 ,  H01L2924/0665

Abstract: The present invention provides a package structure with an embedded electronic component and a method of fabricating the package structure. The method includes: forming a first wiring layer on a carrier; removing the carrier and forming the first wiring layer on a bonding carrier; disposing an electronic component on the first wiring layer; forming an encapsulating layer, a second wiring layer and an insulating layer on the first wiring layer; disposing a chip on the electronic component and the second wiring layer; and forming a covering layer that covers the chip. The present invention can effectively reduce the thickness of the package structure and the electronic component without using adhesives.

公开(公告)号：US20160163621A1

公开(公告)日：2016-06-09

申请号：US14876404

申请日：2015-10-06

Applicant: Siliconware Precision Industries Co., Ltd.

Inventor： Shih-Chao Chiu ,  Chun-Hsien Lin ,  Yu-Cheng Pai ,  Wei-Chung Hsiao ,  Ming-Chen Sun ,  Tzu-Chieh Shen ,  Chia-Cheng Chen

IPC: H01L23/498 ,  H01L21/56 ,  H01L23/31 ,  H01L21/48

CPC classification number: H01L23/49861 ,  H01L21/4846 ,  H01L23/3128 ,  H01L23/49811 ,  H01L23/49827 ,  H01L2224/73204 ,  H01L2224/92125 ,  H01L2924/181 ,  H01L2924/00012

Abstract: A single-layer wiring package substrate and a method of fabricating the same are provided, the method including: forming on a carrier a wiring layer having a first surface and a second surface opposing the first surface and being in contact with the carrier; forming on the carrier and on the wiring layer a dielectric body that has a first side having a first opening, from which a portion of the wiring layer is exposed, and a second side opposing the first side and disposed at the same side as the second surface of the wiring layer; and removing the carrier, with the second side of the dielectric body and the second surface of the wiring layer exposed. Therefore, a coreless package substrate is fabricated, and the overall thickness and cost of the substrate are reduced.

Abstract translation: 提供一种单层布线封装基板及其制造方法，该方法包括：在载体上形成具有与第一表面相对并与载体接触的第一表面和第二表面的布线层; 在所述载体上和所述布线层上形成绝缘体，所述绝缘体具有第一侧面，所述第一侧面具有第一开口，所述布线层的一部分从该第一开口露出;以及与所述第一侧相对的第二侧， 布线层表面; 并且在绝缘体的第二面和布线层的第二表面露出的同时移除载体。 因此，制造无芯封装基板，并且减小基板的整体厚度和成本。