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公开(公告)号:US11593545B2
公开(公告)日:2023-02-28
申请号:US17443397
申请日:2021-07-26
Applicant: Techinsights Inc.
Inventor: Dale Carlson
IPC: G06F9/455 , G06F30/39 , G06T7/00 , G06F30/398
Abstract: Described are various embodiments of a system and method for verifying extracted integrated circuit (IC) features representative of a source IC and stored in a feature dataset structure. Generally, a set of extracted IC features imaged within a designated IC area is converted into a static tile image. The static tile image is then rendered for visualization as an interactive mapping of the feature dataset structure within the area. Corrections for one or more of the set of extracted IC features are received based on the static tile image and input corrections are executed on the feature dataset structure to produce an updated feature dataset structure.
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公开(公告)号:US11074389B2
公开(公告)日:2021-07-27
申请号:US16692900
申请日:2019-11-22
Applicant: TechInsights Inc.
Inventor: Dale Carlson
IPC: G06F9/445 , G06F30/39 , G06T7/00 , G06F30/398
Abstract: Described are various embodiments of a system and method for verifying extracted integrated circuit (IC) features representative of a source IC and stored in a feature dataset structure. Generally, a set of extracted IC features imaged within a designated IC area is converted into a static tile image. The static tile image is then rendered for visualization as an interactive mapping of the feature dataset structure within the area. Corrections for one or more of the set of extracted IC features are received based on the static tile image and input corrections are executed on the feature dataset structure to produce an updated feature dataset structure.
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公开(公告)号:US20200167517A1
公开(公告)日:2020-05-28
申请号:US16692900
申请日:2019-11-22
Applicant: TechInsights Inc.
Inventor: Dale Carlson
IPC: G06F30/39 , G06F30/398 , G06T7/00
Abstract: Described are various embodiments of a system and method for verifying extracted integrated circuit (IC) features representative of a source IC and stored in a feature dataset structure. Generally, a set of extracted IC features imaged within a designated IC area is converted into a static tile image. The static tile image is then rendered for visualization as an interactive mapping of the feature dataset structure within the area. Corrections for one or more of the set of extracted IC features are received based on the static tile image and input corrections are executed on the feature dataset structure to produce an updated feature dataset structure.
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