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Patent Agency Ranking
公开(公告)号：US12271712B2
公开(公告)日：2025-04-08
申请号：US18457678
申请日：2023-08-29
Applicant: The MathWorks, Inc.
Inventor： Huanhuan Xu , Partha Biswas , Madhav Rajan , Sherman Braganza , Chirag Gupta , Neha Pal , Radhey Shyam Meena
Abstract: Systems and methods for providing metric data for patterns in a modeling environment are disclosed. In some aspects, contexts for generating metric data for a pattern are constructed. The pattern represents one or more computations executable in the modeling environment and associated with operation or behavior of a real-world system. The contexts include information about the pattern. The metric data is associated with one or more objectives with which the use of the pattern is associated. Code for the pattern for each context is generated. Metric data is generated for the pattern and under each context. The metric data of the pattern under each context is associated with the objectives. The metric data and the association are stored for use in providing information about or based on the metric data when the pattern is to be or is used in a model representing the real-world system.
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公开(公告)号：US10915302B2
公开(公告)日：2021-02-09
申请号：US16383132
申请日：2019-04-12
Applicant: The MathWorks, Inc.
Inventor： Xiaocang Lin , Wuwei Liang , Sherman Braganza , Wei Wang , Yong Huang , Michael Iannicelli
Abstract: A system determines what aspects of input sources contribute to code generation and provides associations between the input sources and components of features of the generated code. These associations may be visualized by displaying visual cues of the associations. The input sources may be of different types, including but not limited to a model, a code generator and values for atomic configuration setting for code generation. The visual cue that is displayed may take the form of a visible connection between the input sources and the relative portion or portions of the generated programming code. Suggestions may be generated in response to edits to the generated programming code as to how the sources may be modified to provide desired changes in the generated programming code. Analysis may be performed to identify artifacts in the generated programming code and associations to the sources may be identified to specify what source contributed to portions of the generated programming code.
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公开(公告)号：US20230409296A1
公开(公告)日：2023-12-21
申请号：US18457678
申请日：2023-08-29
Applicant: The MathWorks, Inc.
Inventor： Huanhuan Xu , Partha Biswas , Madhav Rajan , Sherman Braganza , Chirag Gupta , Neha Pal , Radhey Shyam Meena
Abstract: Systems and methods for providing metric data for patterns in a modeling environment are disclosed. In some aspects, contexts for generating metric data for a pattern are constructed. The pattern represents one or more computations executable in the modeling environment and associated with operation or behavior of a real-world system. The contexts include information about the pattern. The metric data is associated with one or more objectives with which the use of the pattern is associated. Code for the pattern for each context is generated. Metric data is generated for the pattern and under each context. The metric data of the pattern under each context is associated with the objectives. The metric data and the association are stored for use in providing information about or based on the metric data when the pattern is to be or is used in a model representing the real-world system.
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公开(公告)号：US11782682B2
公开(公告)日：2023-10-10
申请号：US17374806
申请日：2021-07-13
Applicant: The MathWorks, Inc.
Inventor： Huanhuan Xu , Partha Biswas , Madhav Rajan , Sherman Braganza , Chirag Gupta , Neha Pal , Radhey Shyam Meena
Abstract: Systems and methods for providing metric data for patterns in a modeling environment are disclosed. In some aspects, contexts for generating metric data for a pattern are constructed. The pattern represents one or more computations executable in the modeling environment and associated with operation or behavior of a real-world system. The contexts include information about the pattern. The metric data is associated with one or more objectives with which the use of the pattern is associated. Code for the pattern for each context is generated. Metric data is generated for the pattern and under each context. The metric data of the pattern under each context is associated with the objectives. The metric data and the association are stored for use in providing information about or based on the metric data when the pattern is to be or is used in a model representing the real-world system.
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公开(公告)号：US20230021771A1
公开(公告)日：2023-01-26
申请号：US17374806
申请日：2021-07-13
Applicant: The MathWorks, Inc.
Inventor： Huanhuan Xu , Partha Biswas , Madhav Rajan , Sherman Braganza , Chirag Gupta , Neha Pal , Radhey Shyam Meena
Abstract: Systems and methods for providing metric data for patterns in a modeling environment are disclosed. In some aspects, contexts for generating metric data for a pattern are constructed. The pattern represents one or more computations executable in the modeling environment and associated with operation or behavior of a real-world system. The contexts include information about the pattern. The metric data is associated with one or more objectives with which the use of the pattern is associated. Code for the pattern for each context is generated. Metric data is generated for the pattern and under each context. The metric data of the pattern under each context is associated with the objectives. The metric data and the association are stored for use in providing information about or based on the metric data when the pattern is to be or is used in a model representing the real-world system.
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