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公开(公告)号：US09402042B2
公开(公告)日：2016-07-26
申请号：US14052251
申请日：2013-10-11
Applicant: Thorlabs, Inc.
Inventor： Martin Parker , Jason Mills , Ash Prabala , Frank Armstrong , Jeffrey Erickson , Gregory Havenga , Charles Taylor , William Ratdke
CPC classification number: H04N5/37213 , H04N5/353 , H04N5/37206
Abstract: A method for operating a focal plane array in a Time Delay Integration (TDI) mode, the method including: shifting a number of rows during TDI integration, wherein the number of rows shifted is less than a total number of rows of the focal plane array; and reading out a number of rows equal to the total number of rows of the focal plane array minus the number of rows shifted, leaving behind the partially-integrated rows.
Abstract translation: 一种用于在时间延迟积分（TDI）模式中操作焦平面阵列的方法，所述方法包括：在TDI积分期间移动多个行，其中移位的行数小于焦平面阵列的总行数 ; 并且读出等于焦平面阵列的总行数减去移动的行数的行数，留下部分集成的行。
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Patent Agency Ranking
公开(公告)号：US20170343787A1
公开(公告)日：2017-11-30
申请号：US15680962
申请日：2017-08-18
Applicant: Thorlabs, Inc.
Inventor： Alex CABLE , Jörn Wollenzin , Ross Johnstone , Kirk Gossage , Jeffrey S. Brooker , Jason Mills , James Jiang , Dierck Hillmann
CPC classification number: G02B21/245 , G01B9/02059 , G01B9/02063 , G01B9/02077 , G01B9/0209 , G02B7/28 , G02B21/0004 , G02B21/26
Abstract: Disclosed are several technical approaches of using low coherence interferometry techniques to create an autofocus apparatus for optical microscopy. These approaches allow automatic focusing on thin structures that are positioned closely to reflective surfaces and behind refractive material like a cover slip, and automated adjustment of focus position into the sample region without disturbance from reflection off adjacent surfaces. The measurement offset induced by refraction of material that covers the sample is compensated for. Proposed are techniques of an instrument that allows the automatic interchange of imaging objectives in a low coherence interferometry autofocus system, which is of major interest in combination with TDI (time delay integration) imaging, confocal and two-photon fluorescence microscopy.
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公开(公告)号：US09869852B2
公开(公告)日：2018-01-16
申请号：US14994835
申请日：2016-01-13
Applicant: Thorlabs, Inc.
Inventor： Alex Cable , Jörn Wollenzin , Ross Johnstone , Kirk Gossage , Jeffrey S. Brooker , Jason Mills , James Jiang , Dierck Hillmann
CPC classification number: G02B21/245 , G01B9/02059 , G01B9/02063 , G01B9/02077 , G01B9/0209 , G02B7/28 , G02B21/0004 , G02B21/26
Abstract: Disclosed are several technical approaches of using low coherence interferometry techniques to create an autofocus apparatus for optical microscopy. These approaches allow automatic focusing on thin structures that are positioned closely to reflective surfaces and behind refractive material like a cover slip, and automated adjustment of focus position into the sample region without disturbance from reflection off adjacent surfaces. The measurement offset induced by refraction of material that covers the sample is compensated for. Proposed are techniques of an instrument that allows the automatic interchange of imaging objectives in a low coherence interferometry autofocus system, which is of major interest in combination with TDI (time delay integration) imaging, confocal and two-photon fluorescence microscopy.
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公开(公告)号：US09989749B2
公开(公告)日：2018-06-05
申请号：US15680962
申请日：2017-08-18
Applicant: Thorlabs, Inc.
Inventor： Alex Cable , Jörn Wollenzin , Ross Johnstone , Kirk Gossage , Jeffrey S. Brooker , Jason Mills , James Jiang , Dierck Hillmann
CPC classification number: G02B21/245 , G01B9/02059 , G01B9/02063 , G01B9/02077 , G01B9/0209 , G02B7/28 , G02B21/0004 , G02B21/26
Abstract: Disclosed are several technical approaches of using low coherence interferometry techniques to create an autofocus apparatus for optical microscopy. These approaches allow automatic focusing on thin structures that are positioned closely to reflective surfaces and behind refractive material like a cover slip, and automated adjustment of focus position into the sample region without disturbance from reflection off adjacent surfaces. The measurement offset induced by refraction of material that covers the sample is compensated for. Proposed are techniques of an instrument that allows the automatic interchange of imaging objectives in a low coherence interferometry autofocus system, which is of major interest in combination with TDI (time delay integration) imaging, confocal and two-photon fluorescence microscopy.
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5.发明申请MICROSCOPY SYSTEM WITH AUTO-FOCUS ADJUSTMENT BY LOW-COHERENCE INTERFEROMETRY 有权具有通过低相干干涉进行自动调焦的微观系统公开(公告)号：US20160216501A1
公开(公告)日：2016-07-28
申请号：US14994835
申请日：2016-01-13
Applicant: Thorlabs, Inc.
Inventor： Alex CABLE , Jörn Wollenzin , Ross Johnstone , Kirk Gossage , Jeffrey S. Brooker , Jason Mills , James Jiang , Dierck Hillmann
CPC classification number: G02B21/245 , G01B9/02059 , G01B9/02063 , G01B9/02077 , G01B9/0209 , G02B7/28 , G02B21/0004 , G02B21/26
Abstract: Disclosed are several technical approaches of using low coherence interferometry techniques to create an autofocus apparatus for optical microscopy. These approaches allow automatic focusing on thin structures that are positioned closely to reflective surfaces and behind refractive material like a cover slip, and automated adjustment of focus position into the sample region without disturbance from reflection off adjacent surfaces. The measurement offset induced by refraction of material that covers the sample is compensated for. Proposed are techniques of an instrument that allows the automatic interchange of imaging objectives in a low coherence interferometry autofocus system, which is of major interest in combination with TDI (time delay integration) imaging, confocal and two-photon fluorescence microscopy.
Abstract translation: 公开了使用低相干干涉测量技术来创建用于光学显微镜的自动聚焦装置的几种技术方法。 这些方法允许自动聚焦在紧邻反射表面并在折射材料之后的薄结构，如覆盖滑动，以及将聚焦位置自动调节到样品区域中，而不受邻近表面反射的干扰。 补偿由覆盖样品的材料折射引起的测量偏移。 提出的是一种仪器的技术，允许在低相干干涉测量自动对焦系统中自动交换成像目标，这与TDI（时间延迟积分）成像，共聚焦和双光子荧光显微镜相结合是主要感兴趣的。
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公开(公告)号：US20140104468A1
公开(公告)日：2014-04-17
申请号：US14052251
申请日：2013-10-11
Applicant: Thorlabs, Inc.
Inventor： Martin Parker , Jason Mills , Ash Prabala , Frank Armstrong , Jeffrey Erickson , Gregory Havenga , Charles Taylor , William Ratdke
IPC: H04N5/372
CPC classification number: H04N5/37213 , H04N5/353 , H04N5/37206
Abstract: A method for operating a focal plane array in a Time Delay Integration (TDI) mode, the method including: shifting a number of rows during TDI integration, wherein the number of rows shifted is less than a total number of rows of the focal plane array; and reading out a number of rows equal to the total number of rows of the focal plane array minus the number of rows shifted, leaving behind the partially-integrated rows.
Abstract translation: 一种用于在时间延迟积分（TDI）模式中操作焦平面阵列的方法，所述方法包括：在TDI积分期间移动多个行，其中移位的行数小于焦平面阵列的总行数 ; 并且读出等于焦平面阵列的总行数减去移动的行数的行数，留下部分集成的行。
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