Inspection apparatus and inspection method using electromagnetic wave
    1.
    发明授权
    Inspection apparatus and inspection method using electromagnetic wave 失效
    检验仪器和检验方法采用电磁波

    公开(公告)号:US08344324B2

    公开(公告)日:2013-01-01

    申请号:US12682248

    申请日:2008-11-27

    CPC classification number: G01N21/3586 G01N21/7703

    Abstract: An apparatus for acquiring information on a time waveform of a terahertz wave is comprised of a terahertz wave-generating unit, a waveform information-detecting unit, and a delay unit for changing the time after the terahertz wave is generated in the generating unit until it is detected as waveform information of the terahertz wave in the detecting unit, wherein the delay unit is configured so as to change a propagating distance of the terahertz wave generated by the generating unit, and associates waveform information of the terahertz wave, which is detected in the detecting unit, and the propagating distance every terahertz wave generated by the generating unit.

    Abstract translation: 用于获取关于太赫兹波的时间波形的信息的装置包括太赫兹波发生单元,波形信息检测单元和延迟单元,用于在生成单元中产生太赫兹波之后的时间改变直到它 被检测为检测单元中的太赫兹波的波形信息,其中延迟单元被配置为改变由发生单元产生的太赫兹波的传播距离,并且将在该波长信号中检测到的太赫兹波的波形信息相关联 检测单元和由发生单元产生的每太赫兹波的传播距离。

    PHOTO-SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
    2.
    发明申请
    PHOTO-SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME 有权
    照相半导体器件及其制造方法

    公开(公告)号:US20120108004A1

    公开(公告)日:2012-05-03

    申请号:US13342304

    申请日:2012-01-03

    Inventor: Toshihiko Ouchi

    Abstract: A method of manufacturing photo-semiconductor device that has a photoconductive semiconductor film provided with electrodes and formed on a second substrate, the semiconductor film being formed by epitaxial growth on a first semiconductor substrate different from the second substrate, the second substrate being also provided with electrodes, the electrodes of the second substrate and the electrodes of the photoconductive semiconductor film being held in contact with each other.

    Abstract translation: 一种制造光电半导体器件的方法,所述光电半导体器件具有设置有电极并形成在第二衬底上的光导半导体膜,所述半导体膜通过在与所述第二衬底不同的第一半导体衬底上外延生长而形成,所述第二衬底还设置有 电极,第二基板的电极和光电导半导体膜的电极保持彼此接触。

    Inspection apparatus and inspection method using electromagnetic wave
    3.
    发明授权
    Inspection apparatus and inspection method using electromagnetic wave 有权
    检验仪器和检验方法采用电磁波

    公开(公告)号:US07963168B2

    公开(公告)日:2011-06-21

    申请号:US12196084

    申请日:2008-08-21

    Inventor: Toshihiko Ouchi

    CPC classification number: G01N21/3581 G01N21/8806 G01N21/94 G01N21/9508

    Abstract: The present invention is to provide inspection apparatus and method of being able to acquire electromagnetic wave response information of an inspection object at high speed as average information using an electromagnetic wave. An inspection apparatus using an electromagnetic wave 2 includes an electromagnetic wave generation and irradiation unit 9 which generates an electromagnetic wave and irradiates the electromagnetic wave on an inspection object 11, and an electromagnetic wave detection unit 10 having a plurality of detection units. The plurality of detection units is arranged so as to detect the electromagnetic wave which is irradiated by the electromagnetic wave generation and irradiation unit and is transmitted or reflected with interacting with different sites of the inspection object 11, and is constructed so as to detect the electromagnetic wave from the different sites in different detection time or detection frequencies respectively. The inspection apparatus acquires electromagnetic wave response information on the inspection object 11 based on detection signals from the plurality of detection units.

    Abstract translation: 本发明提供一种检测装置和方法,能够使用电磁波作为平均信息以高速度获取检查对象的电磁波响应信息。 使用电磁波2的检查装置包括产生电磁波并将电磁波照射在检查对象11上的电磁波产生和照射单元9以及具有多个检测单元的电磁波检测单元10。 多个检测单元被布置为检测由电磁波产生和照射单元照射的电磁波,并且与检查对象11的不同位置相互作用而被透射或反射,并且被构造成检测电磁波 来自不同地点的波浪分别在不同的检测时间或检测频率。 检查装置基于来自多个检测单元的检测信号,获取关于检查对象11的电磁波响应信息。

    Photoconductive element and sensor device
    4.
    发明授权
    Photoconductive element and sensor device 有权
    光电元件和传感器装置

    公开(公告)号:US07947942B2

    公开(公告)日:2011-05-24

    申请号:US12612798

    申请日:2009-11-05

    Inventor: Toshihiko Ouchi

    CPC classification number: G01J3/42 G01N21/3581 H01S1/02

    Abstract: There is provided a photoconductive element capable of generating and detecting broadband electromagnetic waves such as terahertz waves at a comparatively high efficiency by decreasing or avoiding the absorption of electromagnetic waves into a substrate. A photoconductive element 1 includes a photoconductive film 5 exhibiting conductivity by the radiation of light, a substrate 6 holding the photoconductive film and a thin film sandwiched between the photoconductive film 5 and the substrate 6, the thin film being different in composition from the photoconductive film 5 and the substrate 6. The photoconductive film 5 is provided with an antenna 7 having a gap portion 2 and an electrode 4 electrically connectable to the antenna 7. At least a part of the photoconductive film where the gap portion 2 of the antenna 7 is located is single crystal. The substrate 6 has an opening portion 3 at a part corresponding to a part of the photoconductive film 5 where the gap portion 2 of the antenna 7 is located.

    Abstract translation: 提供了一种光电元件,其能够通过减少或避免电磁波吸收到衬底中,以相当高的效率产生和检测诸如太赫兹波的宽带电磁波。 光电导元件1包括通过照射光而显示导电性的光电导膜5,保持光电导膜的基板6和夹在光电导膜5和基板6之间的薄膜,该薄膜的组成与光导膜不同 光电导膜5设置有具有间隙部分2的天线7和可与天线7电连接的电极4.至少一部分天线7的间隙部分2的光电导膜是 位于单晶。 基板6在对应于天线7的间隙部分2所在的光电导膜5的一部分的部分处具有开口部分3。

    Device for generating or detecting electromagnetic radiation, and fabrication method of the same
    5.
    发明授权
    Device for generating or detecting electromagnetic radiation, and fabrication method of the same 有权
    用于产生或检测电磁辐射的装置及其制造方法

    公开(公告)号:US07933305B2

    公开(公告)日:2011-04-26

    申请号:US11376203

    申请日:2006-03-16

    Abstract: A device for generating or detecting electromagnetic radiation includes a substrate, a gain medium provided on the substrate, a plurality of reflectors for confining electromagnetic radiation at a predetermined frequency range and substantially perpendicular to a face of the substrate, and spacer means for spacing the reflectors from each other at a predetermined distance, with the gain medium being sandwiched between the reflectors. The gain medium has a quantum well structure formed of a semiconductor material, and gives a gain to electromagnetic radiation by transitioning between subbands created in at least a quantum well in the quantum well structure. The spacer means is formed of a material different from a material of the gain medium.

    Abstract translation: 用于产生或检测电磁辐射的装置包括基板,设置在基板上的增益介质,用于限制预定频率范围内并基本上垂直于基板的面的电磁辐射的多个反射器,以及用于间隔反射器 彼此间隔预定距离,增益介质夹在反射器之间。 增益介质具有由半导体材料形成的量子阱结构,并且通过在量子阱结构中的至少一个量子阱中产生的子带之间的过渡来给予电磁辐射的增益。 间隔装置由不同于增益介质的材料的材料形成。

    INSPECTION APPARATUS AND INSPECTION METHOD USING ELECTROMAGNETIC WAVE
    6.
    发明申请
    INSPECTION APPARATUS AND INSPECTION METHOD USING ELECTROMAGNETIC WAVE 失效
    使用电磁波的检查装置和检查方法

    公开(公告)号:US20100252738A1

    公开(公告)日:2010-10-07

    申请号:US12682248

    申请日:2008-11-27

    CPC classification number: G01N21/3586 G01N21/7703

    Abstract: An apparatus for acquiring information on a time waveform of a terahertz wave is comprised of a terahertz wave-generating unit, a waveform information-detecting unit, and a delay unit for changing the time after the terahertz wave is generated in the generating unit until it is detected as waveform information of the terahertz wave in the detecting unit, wherein the delay unit is configured so as to change a propagating distance of the terahertz wave generated by the generating unit, and associates waveform information of the terahertz wave, which is detected in the detecting unit, and the propagating distance every terahertz wave generated by the generating unit.

    Abstract translation: 用于获取关于太赫兹波的时间波形的信息的装置包括太赫兹波发生单元,波形信息检测单元和延迟单元,用于在生成单元中产生太赫兹波之后的时间改变直到它 被检测为检测单元中的太赫兹波的波形信息,其中延迟单元被配置为改变由发生单元产生的太赫兹波的传播距离,并且将在该波长信号中检测到的太赫兹波的波形信息相关联 检测单元和由发生单元产生的每太赫兹波的传播距离。

    High frequency electrical signal control device and sensing system
    7.
    发明授权
    High frequency electrical signal control device and sensing system 失效
    高频电信号控制装置及感应系统

    公开(公告)号:US07689070B2

    公开(公告)日:2010-03-30

    申请号:US12189076

    申请日:2008-08-08

    Inventor: Toshihiko Ouchi

    Abstract: A high frequency electrical signal control device comprises a transmitter for generating a high frequency electrical signal, a receiver, a transmission line for propagating the electrical signal, and a structure for radiating the electrical signal propagated through the transmission line to the space or receiving a signal from the space. The degree of coupling of the electrical signal between the space and the transmission line provided by the structure can be variably controlled.

    Abstract translation: 高频电信号控制装置包括用于产生高频电信号的发射机,接收机,用于传播电信号的传输线,以及用于将通过传输线传播的电信号辐射到空间或接收信号的结构 从空间。 可以可变地控制由结构提供的空间和传输线之间的电信号的耦合度。

    Detecting apparatus for detecting moisture content of media stack
    8.
    发明授权
    Detecting apparatus for detecting moisture content of media stack 失效
    用于检测介质堆的水分含量的检测装置

    公开(公告)号:US07688079B2

    公开(公告)日:2010-03-30

    申请号:US11671069

    申请日:2007-02-05

    CPC classification number: G01N22/04

    Abstract: A detecting apparatus for detecting information of at least a portion of a stack of sheet media includes an illuminating unit and a detecting unit. The illuminating unit illuminates a side of the stack of sheet media, or a portion thereof with electromagnetic waves. The detecting unit detects electromagnetic waves transmitted through or reflected by the stack of sheet media, or a portion thereof. The detecting apparatus is adapted to compare information of the electromagnetic waves detected by the detecting unit with information about attenuation of electromagnetic waves due to moisture contained in the sheet medium, and detect information of the moisture content of at least a portion of the stack of sheet media.

    Abstract translation: 用于检测纸张介质的堆叠的至少一部分的信息的检测装置包括照明单元和检测单元。 照明单元用电磁波照亮片材介质的一侧或其一部分。 检测单元检测由纸张介质堆叠或其一部分传输或反射的电磁波。 所述检测装置适于将由所述检测单元检测出的电磁波的信息与由所述片材介质中含有的水分导致的电磁波衰减的信息进行比较,并且检测所述片材堆叠的至少一部分的水分含量的信息 媒体。

    Detection method using electromagnetic wave and detection apparatus
    9.
    发明授权
    Detection method using electromagnetic wave and detection apparatus 失效
    使用电磁波和检测装置的检测方法

    公开(公告)号:US07542140B2

    公开(公告)日:2009-06-02

    申请号:US11948466

    申请日:2007-11-30

    CPC classification number: G01N21/3581 G01N21/3563

    Abstract: A detection apparatus includes a sample holding section, an irradiation means, a detection means, a calculation means, and an evaluation means. The irradiation means irradiates a substance held in the sample holding section with a THz wave. The detection unit detects a THz wave that has passed through or been reflected from the substance. The calculation unit determines a frequency dependence of a property of the substance with respect to the irradiated THz wave and then calculates a slope of a straight line or a slope of a straight line obtained by straight-line approximation of the frequency dependence of the property of the substance. The evaluation unit evaluates the state change of the substance by comparing a previously-obtained slope of a straight line of the frequency dependence of the property of the substance in a standard state and the slope of the straight line of the substance calculated.

    Abstract translation: 检测装置包括样本保持部,照射装置,检测装置,计算装置和评估装置。 照射装置用THz波照射保持在样品保持部中的物质。 检测单元检测已经通过或被物质反射的太赫兹波。 计算单元确定物质相对于照射的太赫兹波的特性的频率依赖性,然后计算直线的斜率或直线近似的直线的斜率,该直线近似为 物质。 评估单元通过比较以前获得的标准状态下的物质的性质的频率依赖性的直线的斜率与所计算的物质的直线的斜率之间的比例来评估物质的状态变化。

    Oscillation device and inspection apparatus
    10.
    发明申请
    Oscillation device and inspection apparatus 有权
    振荡装置及检查装置

    公开(公告)号:US20090051452A1

    公开(公告)日:2009-02-26

    申请号:US12189914

    申请日:2008-08-12

    CPC classification number: H03B7/08

    Abstract: An oscillation device has a resonant tunneling diode formed by interposing a gain medium including a first barrier layer, a quantum well layer and a second barrier layer between a first thickness adjusting layer and a second thickness adjusting layer. The oscillation device also has a switch for switching the polarity of a bias voltage being applied to the resonant tunneling diode. The first thickness adjusting layer and the second thickness adjusting layer have different thicknesses. Thus, a single oscillation device is driven to oscillate with different oscillation frequencies.

    Abstract translation: 振荡装置具有通过在第一厚度调整层和第二厚度调整层之间插入包括第一阻挡层,量子阱层和第二阻挡层的增益介质而形成的谐振隧道二极管。 振荡装置还具有用于切换施加到谐振隧穿二极管的偏置电压的极性的开关。 第一厚度调节层和第二厚度调节层具有不同的厚度。 因此,单个振荡器件被驱动以不同的振荡频率振荡。

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