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公开(公告)号:US20240099154A1
公开(公告)日:2024-03-21
申请号:US18515273
申请日:2023-11-21
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Hui-Lin Wang , Si-Han Tsai , Dong-Ming Wu , Chen-Yi Weng , Ching-Hua Hsu , Ju-Chun Fan , Yi-Yu Lin , Che-Wei Chang , Po-Kai Hsu , Jing-Yin Jhang
CPC classification number: H10N50/10 , G11C11/161 , H01F10/3254 , H10B61/00 , H10N50/80 , H10N50/85
Abstract: A magnetoresistive random access memory (MRAM) device includes a first array region and a second array region on a substrate, a first magnetic tunneling junction (MTJ) on the first array region, a first top electrode on the first MTJ, a second MTJ on the second array region, and a second top electrode on the second MTJ. Preferably, the first top electrode and the second top electrode include different nitrogen to titanium (N/Ti) ratios.
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公开(公告)号:US12232425B2
公开(公告)日:2025-02-18
申请号:US18515273
申请日:2023-11-21
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Hui-Lin Wang , Si-Han Tsai , Dong-Ming Wu , Chen-Yi Weng , Ching-Hua Hsu , Ju-Chun Fan , Yi-Yu Lin , Che-Wei Chang , Po-Kai Hsu , Jing-Yin Jhang
Abstract: A magnetoresistive random access memory (MRAM) device includes a first array region and a second array region on a substrate, a first magnetic tunneling junction (MTJ) on the first array region, a first top electrode on the first MTJ, a second MTJ on the second array region, and a second top electrode on the second MTJ. Preferably, the first top electrode and the second top electrode include different nitrogen to titanium (N/Ti) ratios.
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公开(公告)号:US20250160217A1
公开(公告)日:2025-05-15
申请号:US19019509
申请日:2025-01-14
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Hui-Lin Wang , Si-Han Tsai , Dong-Ming Wu , Chen-Yi Weng , Ching-Hua Hsu , Ju-Chun Fan , Yi-Yu Lin , Che-Wei Chang , Po-Kai Hsu , Jing-Yin Jhang
Abstract: A magnetoresistive random access memory (MRAM) device includes a first array region and a second array region on a substrate, a first magnetic tunneling junction (MTJ) on the first array region, a first top electrode on the first MTJ, a second MTJ on the second array region, and a second top electrode on the second MTJ. Preferably, the first top electrode and the second top electrode include different nitrogen to titanium (N/Ti) ratios.
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公开(公告)号:US11864468B2
公开(公告)日:2024-01-02
申请号:US17348776
申请日:2021-06-16
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Hui-Lin Wang , Si-Han Tsai , Dong-Ming Wu , Chen-Yi Weng , Ching-Hua Hsu , Ju-Chun Fan , Yi-Yu Lin , Che-Wei Chang , Po-Kai Hsu , Jing-Yin Jhang
CPC classification number: H10N50/10 , G11C11/161 , H01F10/3254 , H10B61/00 , H10N50/80 , H10N50/85
Abstract: A magnetoresistive random access memory (MRAM) device includes a first array region and a second array region on a substrate, a first magnetic tunneling junction (MTJ) on the first array region, a first top electrode on the first MTJ, a second MTJ on the second array region, and a second top electrode on the second MTJ. Preferably, the first top electrode and the second top electrode include different nitrogen to titanium (N/Ti) ratios.
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公开(公告)号:US20230232638A1
公开(公告)日:2023-07-20
申请号:US17673760
申请日:2022-02-16
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Hui-Lin Wang , Ju-Chun Fan , Ching-Hua Hsu , Chun-Hao Wang , Yi-Yu Lin , Dong-Ming Wu , Po-Kai Hsu
IPC: H01L27/22 , H01L43/02 , H01L43/08 , G11C5/02 , H01L23/522 , H01L23/528
CPC classification number: H01L27/226 , H01L43/02 , H01L43/08 , G11C5/02 , H01L23/5226 , H01L23/5283
Abstract: Abstract of Disclosure A memory array includes at least one strap region, at least two sub-arrays, a plurality of staggered, dummy magnetic storage elements, and a plurality of bit line structures. The strap region includes a plurality of source line straps and a plurality of word line straps. The two sub-arrays include a plurality of staggered, active magnetic storage elements. The two sub -arrays are separated by the strap region. The staggered, dummy magnetic storage elements are disposed within the strap region. The bit line structures are disposed in the two sub-arrays, and each of the bit line structures is disposed above and directly connected with at least one of the staggered, active magnetic storage elements.
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公开(公告)号:US20220367791A1
公开(公告)日:2022-11-17
申请号:US17348776
申请日:2021-06-16
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Hui-Lin Wang , Si-Han Tsai , Dong-Ming Wu , Chen-Yi Weng , Ching-Hua Hsu , Ju-Chun Fan , Yi-Yu Lin , Che-Wei Chang , Po-Kai Hsu , Jing-Yin Jhang
Abstract: A magnetoresistive random access memory (MRAM) device includes a first array region and a second array region on a substrate, a first magnetic tunneling junction (MTJ) on the first array region, a first top electrode on the first MTJ, a second MTJ on the second array region, and a second top electrode on the second MTJ. Preferably, the first top electrode and the second top electrode include different nitrogen to titanium (N/Ti) ratios.
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