公开(公告)号：US08867043B2

公开(公告)日：2014-10-21

申请号：US12834689

申请日：2010-07-12

Applicant: Peter Schwarz ,  Uwe Sperling

Inventor： Peter Schwarz ,  Uwe Sperling

IPC: G01B11/30 ,  G01B11/06 ,  G01N21/55

CPC classification number: G01B11/0608 ,  G01N21/55

Abstract: A method of determining optical properties of textured surfaces by irradiation of the surface to be investigated. At least part of the radiation irradiated onto the surface and reflected by the latter is detected by a detector device which permits a location-resolved evaluation of the radiation striking it. A first characteristic value from the radiation detected, characteristic of a texture of the surface is detected. A second characteristic value from the radiation detected, characteristic of a further optical property of the surface is detected. And, a result value is determined on the basis of the first characteristic value and the second characteristic value.

Abstract translation: 通过照射待研究的表面来确定纹理表面的光学性质的方法。 辐射到表面上并被后者反射的辐射的至少一部分由检测器装置检测，该检测器装置允许对其进行的辐射的位置分辨评估。 检测出来的辐射的第一特征值，表面纹理的特征。 检测到来自检测到的辐射的第二特征值，表面的另一光学特性的特征。 并且，基于第一特征值和第二特征值来确定结果值。

公开(公告)号：US07741629B2

公开(公告)日：2010-06-22

申请号：US11859673

申请日：2007-09-21

Applicant: Peter Schwarz ,  Uwe Sperling

Inventor： Peter Schwarz ,  Uwe Sperling

IPC: G01N21/86 ,  G01N21/00 ,  G01N21/47

CPC classification number: G01N21/55 ,  G01N21/4738 ,  G01N21/474 ,  G01N2021/4754

Abstract: An apparatus (1) for analysing surface properties, comprising a first radiation device (4) which emits radiation directly onto a surface (9) to be analyzed, a first illumination device (6, 7) for indirectly illuminating the surface (9) to be analyzed, a first radiation detector device (8) which receives at least part of the radiation thrown back from the surface (9) to be analyzed and outputs at least one signal which is characteristic of this part of the radiation. According to the invention, a radiation scattering device (10, 11) is provided which is at least partially illuminated by the first illumination device (6, 7) and which transmits scattered radiation onto the surface (9) to be analyzed.

Abstract translation: 一种用于分析表面特性的装置（1），包括：第一辐射装置（4），其将辐射直接发射到待分析的表面（9）上;第一照明装置（6,7），用于将表面（9）间接照射到 分析第一辐射检测器装置（8），其接收从待分析的表面（9）向后抛射的至少一部分辐射，并且输出至少一个是该辐射部分特征的信号。 根据本发明，提供了辐射散射装置（10,11），其至少部分地被第一照明装置（6,7）照射，并且将散射的辐射传播到待分析的表面（9）上。

公开(公告)号：US07525648B2

公开(公告)日：2009-04-28

申请号：US11241827

申请日：2005-09-30

Applicant: Uwe Sperling ,  Konrad Lex

Inventor： Uwe Sperling ,  Konrad Lex

IPC: G01J1/44

CPC classification number: G01N21/55 ,  G01N21/8806

Abstract: A device for examining the optical properties of surfaces includes a first radiation source which emits radiation to an examination surface, at least one first detector device, for detecting the radiation reflected off the surface and emitting at least one signal that is characteristic of at least one parameter of the detected radiation, wherein the detector device includes a plurality of image capturing components arranged in a specified detection area and wherein a control is provided for compensating signal changes caused by a shift of the location where the reflected radiation is incident on the detection area.

Abstract translation: 用于检查表面的光学性质的装置包括向检查表面发射辐射的第一辐射源，至少一个第一检测器装置，用于检测从表面反射的辐射，并发射至少一个特征为至少一个的信号 参数，其中所述检测器装置包括布置在指定检测区域中的多个图像捕获部件，并且其中提供控制以补偿由所述反射辐射入射到所述检测区域上的位置的偏移引起的信号变化 。

公开(公告)号：US20060092417A1

公开(公告)日：2006-05-04

申请号：US11175903

申请日：2005-07-06

Applicant: Peter Schwarz ,  Uwe Sperling

Inventor： Peter Schwarz ,  Uwe Sperling

IPC: G01N21/00

CPC classification number: G01N21/474 ,  G01N21/8806 ,  G01N2021/8835

Abstract: A device for examining the optical properties of surfaces includes at least one first radiation device which emits radiation to a surface to be examined at a first predetermined spatial angle; at least one first detector device for capturing the radiation emitted to and reflected back from the surface, wherein the first detector device, allowing a local resolution of detected radiation, is positioned at least at a second predetermined spatial angle relative to the surface; and at least one further radiation device or second detector device emitting radiation to the surface to be examined at a third predetermined spatial angle or detecting radiation emitted to and reflected back from the surface.

Abstract translation: 用于检查表面的光学性质的装置包括至少一个第一辐射装置，其以第一预定空间角发射到被检查表面的辐射; 至少一个第一检测器装置，用于捕获从表面发射和反射的辐射，其中允许检测到的辐射的局部分辨率的第一检测器装置相对于表面至少定位在第二预定的空间角度; 以及至少一个另外的辐射装置或第二检测器装置，以第三预定的空间角发射到待检测的表面的辐射，或者检测从表面发射并从表面反射的辐射。

公开(公告)号：US07391518B1

公开(公告)日：2008-06-24

申请号：US09607827

申请日：2000-06-30

Applicant: Peter Schwarz ,  Uwe Sperling

Inventor： Peter Schwarz ,  Uwe Sperling

IPC: G01N21/00 ,  G01N21/55 ,  G01N21/47 ,  G01B11/30

CPC classification number: G01J3/10 ,  G01B11/30 ,  G01J3/2803 ,  G01J3/465 ,  G01J3/501 ,  G01J3/51 ,  G01J2003/1282 ,  G01N21/255

Abstract: The present invention relates to a device and method for making quantified determinations of the quality of surfaces and wherein the device comprises an optical system with a first optical means and a second optical means as well as a control and evaluation means and an output (display) means. Said first optical means comprises an illuminating means having at least one LED as its light source and serves the function of illuminating the measurement surface at a predetermined angle. Said second optical means is likewise directed at a predetermined angle to the measurement surface and receives the reflected light. A photo sensor of said second optical means emits an electrical measurement signal which is characteristic of said reflected light.The light emitted from the illuminating means is configured such that its spectral characteristic comprises blue, green and red spectral components in the visible light spectrum. A filter means is arranged in the path of radiation between the light source and the photo sensor and which changes the spectral characteristics of the incident light so as to approach a predetermined spectral distribution. The control and evaluation means control the measurement sequence and evaluate the reflected light, deriving therefrom at least one parameter which is characteristic of the surface.

Abstract translation: 本发明涉及一种用于对表面质量进行量化确定的装置和方法，其中该装置包括具有第一光学装置和第二光学装置的光学系统以及控制和评估装置以及输出（显示） 手段。 所述第一光学装置包括具有至少一个LED作为其光源并具有以预定角度照射测量表面的功能的照明装置。 所述第二光学装置同样指向与测量表面成预定的角度，并接收反射光。 所述第二光学装置的光传感器发射作为所述反射光的特征的电测量信号。 从照明装置发射的光被配置为使得其光谱特性包括可见光光谱中的蓝色，绿色和红色光谱分量。 滤光器装置布置在光源和光传感器之间的辐射路径中，并且改变入射光的光谱特性以接近预定的光谱分布。 控制和评估装置控制测量序列并评估反射光，由此导出至少一个是表面特征的参数。

公开(公告)号：USD421401S

公开(公告)日：2000-03-07

申请号：US98460

申请日：1998-12-30

Applicant: Peter Schwarz ,  Uwe Sperling

Designer： Peter Schwarz ,  Uwe Sperling

公开(公告)号：US20110013176A1

公开(公告)日：2011-01-20

申请号：US12834689

申请日：2010-07-12

Applicant: Peter Schwarz ,  Uwe Sperling

Inventor： Peter Schwarz ,  Uwe Sperling

IPC: G01N21/00 ,  G01J3/46 ,  G01B11/24

CPC classification number: G01B11/0608 ,  G01N21/55

Abstract: A method of determining properties of textured surfaces with the steps: irradiation of radiation onto the surface (10) to be investigated; detection of at least part of the radiation irradiated onto the surface (10) and reflected by the latter by means of a detector device (4) which permits a location-resolved evaluation of the radiation striking it; determination of a first characteristic value (ΔP) from the radiation detected, wherein the first characteristic value (ΔP) is characteristic of a texture of the surface (10); determination of a second characteristic value (ΔE) from the radiation detected, wherein the second characteristic value is characteristic of a further optical property of the surface (10); determination of a result value (ΔI) on the basis of the first characteristic value (ΔP) and the second characteristic value (ΔE).

Abstract translation: 一种确定纹理表面性质的方法，其步骤为：将待研究的表面（10）上的辐射照射; 检测照射到所述表面（10）上并由其通过检测器装置（4）反射的辐射的至少一部分，所述检测器装置（4）允许对所述辐射的位置分辨评估; 确定来自所检测的辐射的第一特征值（＆Dgr; P），其中所述第一特征值（＆Dgr; P）是所述表面（10）的纹理的特征; 从所检测的辐射确定第二特征值（＆Dgr; E），其中所述第二特征值是所述表面（10）的另外的光学性质的特征。 根据第一特征值（＆Dgr; P）和第二特征值（＆Dgr; E）确定结果值（＆Dgr; I）。

公开(公告)号：US07679756B2

公开(公告)日：2010-03-16

申请号：US11187694

申请日：2005-07-22

Applicant: Uwe Sperling ,  Peter Schwarz

Inventor： Uwe Sperling ,  Peter Schwarz

IPC: G01B11/30

CPC classification number: G01N21/57 ,  G01J3/504 ,  G01N2021/575

Abstract: A device for examining the optical properties of surfaces includes at least one first radiation device emitting radiation to a surface to be examined at least at a first predetermined spatial angle, at least one first detector for capturing the radiation emitted to and reflected back from the surface, wherein the detector, allowing a local resolution of detected radiation, is positioned at least at a second predetermined spatial angle relative to the surface. At least one spatial angle at which the radiation device and/or the detector are positioned, is variable and the radiation device and the detector are positioned in a space at least part of which exhibits light-reflecting properties.

Abstract translation: 用于检查表面的光学特性的装置包括至少一个第一辐射装置，至少以第一预定空间角发射到待检测表面的辐射，至少一个第一检测器，用于捕获从表面发射并从表面反射的辐射 ，其中允许检测到的辐射的局部分辨率的所述检测器相对于所述表面至少位于第二预定空间角度。 辐射装置和/或检测器所在的至少一个空间角度是可变的，并且辐射装置和检测器被定位在其至少一部分呈现光反射性质的空间中。

公开(公告)号：US07433055B2

公开(公告)日：2008-10-07

申请号：US11175903

申请日：2005-07-06

Applicant: Peter Schwarz ,  Uwe Sperling

Inventor： Peter Schwarz ,  Uwe Sperling

IPC: G01B11/30

CPC classification number: G01N21/474 ,  G01N21/8806 ,  G01N2021/8835

Abstract: A device for examining the optical properties of surfaces includes at least one first radiation device which emits radiation to a surface to be examined at a first predetermined spatial angle; at least one first detector device for capturing the radiation emitted to and reflected back from the surface, wherein the first detector device, allowing a local resolution of detected radiation, is positioned at least at a second predetermined spatial angle relative to the surface; and at least one further radiation device or second detector device emitting radiation to the surface to be examined at a third predetermined spatial angle or detecting radiation emitted to and reflected back from the surface.

Abstract translation: 用于检查表面的光学性质的装置包括至少一个第一辐射装置，其以第一预定空间角发射到被检查表面的辐射; 至少一个第一检测器装置，用于捕获从表面发射和反射的辐射，其中允许检测到的辐射的局部分辨率的第一检测器装置相对于表面至少定位在第二预定的空间角度; 以及至少一个另外的辐射装置或第二检测器装置，以第三预定的空间角发射到待检测的表面的辐射，或者检测从表面发射并从表面反射的辐射。

公开(公告)号：US20070206195A1

公开(公告)日：2007-09-06

申请号：US11230295

申请日：2005-09-19

Applicant: Uwe Sperling

Inventor： Uwe Sperling

IPC: G01N21/47

CPC classification number: G01N21/57 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/0237 ,  G01J3/10 ,  G01J3/504 ,  G01J3/51 ,  G01J2003/1221

Abstract: A device for determining properties of surfaces having at least one first radiation device having at least one radiation source emitting radiation, having at least one first radiation detector having a first radiation detector element which captures at least a portion of the radiation emitted from the radiation device and subsequently diffused and/or reflected off a measuring surface and emits at least one measuring signal characteristic of the reflected/diffused radiation, and at least one second radiation detector having a second radiation detector element capturing a portion of the radiation from the radiation device and diffused/reflected off a measuring surface and outputs a measuring signal characteristic of the reflected and/or diffused radiation, and at least one filter device which is placeable both in the optical path between the radiation device and the first radiation detector and in the optical path between the radiation device and the second radiation detector.

Abstract translation: 一种用于确定具有至少一个具有至少一个发射辐射源的辐射源的第一辐射装置的表面的特性的装置，具有至少一个具有第一辐射检测器元件的第一辐射检测器，该第一辐射检测器捕获从辐射装置发射的辐射的至少一部分 并且随后从测量表面扩散和/或反射并且发射反射/扩散辐射的特征的至少一个测量信号，并且至少一个第二辐射检测器具有捕获来自辐射装置的辐射的一部分的第二辐射检测器元件，以及 从测量表面扩散/反射并输出反射和/或扩散辐射特征的测量信号，以及至少一个可放置在辐射装置和第一辐射检测器之间的光路中以及在光路中的滤光器装置 在辐射装置和第二辐射检测器之间。